H. E. Badawi, F. Azaïs, S. Bernard, M. Comte, V. Kerzérho, F. Lefèvre
{"title":"Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF Circuits","authors":"H. E. Badawi, F. Azaïs, S. Bernard, M. Comte, V. Kerzérho, F. Lefèvre","doi":"10.1007/s10836-020-05868-3","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":501485,"journal":{"name":"Journal of Electronic Testing","volume":" 1120","pages":"189 - 203"},"PeriodicalIF":0.0000,"publicationDate":"2020-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Electronic Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/s10836-020-05868-3","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}