IEEE Design & Test最新文献_第9页

Calling Yourself Back 给自己回电话

IF 2 4区工程技术

IEEE Design & Test Pub Date : 2023-10-01 DOI: 10.1109/mdat.2023.3291666

S. Davidson

引用次数: 0

The 2022 Symposium on Integrated Circuits and Systems Design (SBCCI 2022) 2022年集成电路与系统设计学术研讨会(SBCCI 2022)

IF 2 4区工程技术

IEEE Design & Test Pub Date : 2023-10-01 DOI: 10.1109/mdat.2023.3292716

P. Pande

引用次数: 0

IEEE Design & Test Publication Information IEEE Design &测试发布信息

4区工程技术

IEEE Design & Test Pub Date : 2023-10-01 DOI: 10.1109/mdat.2023.3293348

引用次数: 0

Strange Loops in Design and Technology: 59th DAC Keynote Speech 设计与技术中的怪圈——第59届DAC主题演讲

IF 2 4区工程技术

IEEE Design & Test Pub Date : 2023-10-01 DOI: 10.1109/MDAT.2023.3284295

G. De Micheli

引用次数: 0

Active and Passive Physical Attacks on Neural Network Accelerators 对神经网络加速器的主动和被动物理攻击

IF 2 4区工程技术

IEEE Design & Test Pub Date : 2023-10-01 DOI: 10.1109/MDAT.2023.3253603

V. Meyers, Dennis R. E. Gnad, M. Tahoori

引用次数: 1

Integrating Machine-Learning Probes in FPGA CAD: Why and How? 在FPGA CAD中集成机器学习探针:为什么以及如何?

IF 2 4区工程技术

IEEE Design & Test Pub Date : 2023-10-01 DOI: 10.1109/MDAT.2023.3286334

T. Martin, C. Barnes, G. Grewal, S. Areibi

引用次数: 0

Postpandemic Conferences: The DATE 2023 Experience 大流行后会议:2023年的经验

IF 2 4区工程技术

IEEE Design & Test Pub Date : 2023-10-01 DOI: 10.1109/mdat.2023.3287930

I. O’Connor, R. Wille, A. Pimentel, V. Bertacco

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引用次数: 0

An Energy-Aware Nanoscale Design of Reversible Atomic Silicon Based on Miller Algorithm 基于Miller算法的能量感知可逆原子硅纳米级设计

IF 2 4区工程技术

IEEE Design & Test Pub Date : 2023-10-01 DOI: 10.1109/MDAT.2023.3261800

Seyed-Sajad Ahmadpour, Nima Jafari Navimipour, Ali Nawaz Bahar, M. Mosleh, Senay Yalçin

引用次数: 6

Seamless Thermal Optimization of Parallel Workloads 并行工作负载的无缝热优化

IF 2 4区工程技术

IEEE Design & Test Pub Date : 2023-10-01 DOI: 10.1109/MDAT.2023.3286336

Sandro M. Marques, F. Rossi, M. C. Luizelli, A. C. S. Beck, A. Lorenzon

引用次数: 0

Sbcci 2022