Postpandemic Conferences: The DATE 2023 Experience

IF 1.9 4区工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE

IEEE Design & Test Pub Date : 2023-10-01 DOI:10.1109/mdat.2023.3287930

I. O’Connor, R. Wille, A. Pimentel, V. Bertacco

{"title":"Postpandemic Conferences: The DATE 2023 Experience","authors":"I. O’Connor, R. Wille, A. Pimentel, V. Bertacco","doi":"10.1109/mdat.2023.3287930","DOIUrl":null,"url":null,"abstract":"Digital Object Identier 10.1109/MDAT.2023.3287930 Date of current version: 29 August 2023.  DATE is A leading international event providing unique networking opportunities. The conference brings together designers and design automation users, researchers, and vendors, as well as specialists in hardware and software design, testing, and manufacturing of electronic circuits and systems—from system-level hardware and software implementation down to integrated circuit design. Almost four years had passed since we closed the doors on the last in-person edition of the DATE conference. With three online editions due to COVID19 and in anticipation of a return to a full in-person format, the DATE Sponsors Committee felt that the conference needed to put interaction, as well as reinforcing and rebuilding links in the community, at the heart of the event. In this spirit, the postpandemic 2023 edition of DATE had a substantially reworked format intending for significant added value for in-person participation, with more focus on interaction and condensed down to three days. The intent was that, in this way, the community could actually do what DATE is for meeting, discussing, and exchanging the latest progress in design and design automation. The 26th DATE conference was held at the Flanders Meeting and Convention Center in Antwerp, Belgium, from 17 to 19 April 2023 and offered an exciting, wide-ranging technical program.","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":"34 1","pages":"104-112"},"PeriodicalIF":1.9000,"publicationDate":"2023-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Design & Test","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1109/mdat.2023.3287930","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}

引用次数: 0

Abstract

Digital Object Identier 10.1109/MDAT.2023.3287930 Date of current version: 29 August 2023.  DATE is A leading international event providing unique networking opportunities. The conference brings together designers and design automation users, researchers, and vendors, as well as specialists in hardware and software design, testing, and manufacturing of electronic circuits and systems—from system-level hardware and software implementation down to integrated circuit design. Almost four years had passed since we closed the doors on the last in-person edition of the DATE conference. With three online editions due to COVID19 and in anticipation of a return to a full in-person format, the DATE Sponsors Committee felt that the conference needed to put interaction, as well as reinforcing and rebuilding links in the community, at the heart of the event. In this spirit, the postpandemic 2023 edition of DATE had a substantially reworked format intending for significant added value for in-person participation, with more focus on interaction and condensed down to three days. The intent was that, in this way, the community could actually do what DATE is for meeting, discussing, and exchanging the latest progress in design and design automation. The 26th DATE conference was held at the Flanders Meeting and Convention Center in Antwerp, Belgium, from 17 to 19 April 2023 and offered an exciting, wide-ranging technical program.

查看原文本刊更多论文

大流行后会议:2023年的经验

数字对象标识符(Digital Object identifier): MDAT.2023.3287930当前版本日期:2023年8月29日。国际约会是一个领先的国际活动，提供独特的交流机会。会议汇集了设计师和设计自动化用户、研究人员和供应商，以及硬件和软件设计、测试和电子电路和系统制造方面的专家——从系统级硬件和软件实现到集成电路设计。自上次面对面的DATE会议闭会以来，已经过去了将近四年。由于2019冠状病毒病的原因，会议有三个在线版本，预计将恢复完全的面对面形式，DATE赞助商委员会认为，会议需要将互动以及加强和重建社区联系作为活动的核心。本着这一精神，大流行后的2023年版DATE进行了大幅修改，旨在为现场参与提供重要的附加价值，更加注重互动，并缩短为三天。这样做的目的是，社区实际上可以像DATE一样开会、讨论和交换设计和设计自动化方面的最新进展。第26届DATE会议于2023年4月17日至19日在比利时安特卫普的弗兰德斯会议中心举行，提供了令人兴奋的、广泛的技术方案。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

求助全文

约1分钟内获得全文求助全文

来源期刊

IEEE Design & Test COMPUTER SCIENCE, HARDWARE & ARCHITECTURE-ENGINEERING, ELECTRICAL & ELECTRONIC

CiteScore

3.80

自引率

5.00%

发文量

期刊介绍： IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.