High VoltagePub Date : 2024-03-18DOI: 10.1049/hve2.12425
Le Zhou, Hongwei Liu, Kun Zuo, Kuo Shang
{"title":"Energy harvesting technology for AC overhead insulated transmission line based on electric field induction","authors":"Le Zhou, Hongwei Liu, Kun Zuo, Kuo Shang","doi":"10.1049/hve2.12425","DOIUrl":"10.1049/hve2.12425","url":null,"abstract":"<p>To solve the problem of the energy harvesting (EEH) effect of the condition monitoring devices power supply on the transmission line is not ideal. The authors designed three kinds of EEH schemes based on AC electric field induction, which can effectively improve the output power of load power supply. The EEH principle of each scheme was analysed in detail, and the influence factors such as the shape of outer energy harvester, capacitance compensation and impedance matching characteristics were analysed. Finally, the experiment showed that 140.9 mW of power was obtained in direct-mode field EEH when the line voltage level was 10 kV. The high-potential field EEH mode obtained 4.1 mW of power. The harvesting effect of the inner energy harvester with the same potential as the aluminium wire was obviously better, and 30.7 mW of power was obtained. Finally, based on the third mode, when the load resistance was 2200 Ω, the rectifier received 23.7 mW DC output. The experimental results are in agreement with the theoretical analysis, which verifies the effectiveness of the electric field induction power supply technology.</p>","PeriodicalId":48649,"journal":{"name":"High Voltage","volume":"9 4","pages":"816-825"},"PeriodicalIF":4.4,"publicationDate":"2024-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.1049/hve2.12425","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140162228","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Microscopic mechanisms analysis of various dielectric response processes in oil-paper insulation with different insulating states","authors":"Zaijun Jiang, Jiefeng Liu, Xianhao Fan, Heng Zhang, Enze Zhang, Boshu Song, Yiyi Zhang","doi":"10.1049/hve2.12419","DOIUrl":"10.1049/hve2.12419","url":null,"abstract":"<p>Various dielectric response processes in the oil-paper insulation are sensitively affected by the insulating states (ageing degrees and moisture contents). However, the existing research is still incomplete in revealing the microscopic mechanisms of various dielectric response processes in oil-paper insulation with different insulating states. Given this issue, the genetic algorithm is first adopted to extract the Dissado–Hill (D–H) model parameters by simulating the frequency domain spectroscopy (FDS) of oil-paper insulation. Then, the change laws of the extracted D–H model parameters are adopted to reveal the microscopic mechanisms of various dielectric response processes. Microscopic mechanisms of four dielectric response processes are studied, which are quasi-dc relaxation, loss peak relaxation, optical frequency relaxation, and DC conductance. Meanwhile, due to the dielectric response processes being dominated by various polar particles (methanol, ethanol, furfural, and water molecule), the contents of various ageing by-products dissolved in the insulating oil are measured to support the above analysis. In this respect, a dielectric theoretical reference for the FDS technique to research the insulating states of oil-paper insulation is provided.</p>","PeriodicalId":48649,"journal":{"name":"High Voltage","volume":"9 3","pages":"591-600"},"PeriodicalIF":4.4,"publicationDate":"2024-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.1049/hve2.12419","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140162234","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Effect of nanofillers with different energy levels on the electrical properties of epoxy-based nanocomposites","authors":"Ning Guo, Cailing Chen, Guangwei Zhang, Rongsheng Sun, Yulong Wang, Junguo Gao","doi":"10.1049/hve2.12422","DOIUrl":"10.1049/hve2.12422","url":null,"abstract":"<p>The authors investigate the effects of nanofillers with varying band-gap energies on the space charge properties, breakdown field strength, and bulk resistivity of epoxy (EP)-based composites. Additionally, the molecular orbital distribution of both the epoxy resin and nanofillers were examined through density functional theory. Experimental results indicate that the space charge accumulation within silicon dioxide/EP and germanium oxide/EP is reduced, leading to a more uniformly distributed electric field intensity within the specimen when compared to epoxy. As a result, both materials exhibit improved AC breakdown field strength and volume resistivity. Conversely, the amount of charge accumulated within tin dioxide/EP is higher, resulting in lower breakdown field strength than epoxy. The lowest unoccupied molecular orbital and the highest occupied molecular orbital energy level differences between epoxy and nanofillers introduce electron traps and hole traps at the interface, forming interfacial traps that affect the space charge distribution within the specimen, as well as the trap energy levels within the material. From the experimental results, shallow traps promote space charge accumulation and reduce the breakdown field strength, while deep traps have the opposite effect.</p>","PeriodicalId":48649,"journal":{"name":"High Voltage","volume":"9 4","pages":"948-956"},"PeriodicalIF":4.4,"publicationDate":"2024-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.1049/hve2.12422","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140162231","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
High VoltagePub Date : 2024-03-12DOI: 10.1049/hve2.12417
Ye Cao, Song Xiao, Zhizong Ye, Guangning Wu, Yujun Guo, Guoqiang Gao, Chuanming Sun, Jiancheng Liu, Zheng Chen, Hao Hou, Zijing Wang, Puyang Liu, Yuhui Zhang, Jie Yu
{"title":"Analysis and suppression of operational overvoltage and inrush current for high-speed trains by automatic phase-switching technique","authors":"Ye Cao, Song Xiao, Zhizong Ye, Guangning Wu, Yujun Guo, Guoqiang Gao, Chuanming Sun, Jiancheng Liu, Zheng Chen, Hao Hou, Zijing Wang, Puyang Liu, Yuhui Zhang, Jie Yu","doi":"10.1049/hve2.12417","DOIUrl":"10.1049/hve2.12417","url":null,"abstract":"<p>When a high-speed train approaches the insulated phase-splitting section embedded between neighbouring power supply arms, the vacuum circuit breaker (VCB) installed on trains must be disconnected to maintain the traction power supply system as a no-load condition for completing phase-switching action, as the train passes through the phase-splitting section depending on its inertia. However, when operating VCBs, the arc is easily triggered between the mobile contacts inside, accompanied by an overvoltage impulse. Herein, to explore the generating mechanism of inrush current and operational overvoltage, a model describing the ‘substation-catenary-train’ traction power supply system is launched based on an equivalent circuit modelling technique. Through the analysis of the transient VCB operational process, the phase of catenary voltage is directly related to the characteristics of the VCB switching-on overvoltage, as the traction current's phase angle is relevant to the amplitude-frequency characteristics of the VCB switching-off overvoltage. Inrush current as a noteworthy element is related to the traction transformer's remanence. The automatic phase-switching technique is utilised to suppress both operational overvoltage and inrush current, as the optimal combination of VCB switching-on and switching-off phases considering the balance between overvoltage and inrush current is achieved based on the particle swarm algorithm.</p>","PeriodicalId":48649,"journal":{"name":"High Voltage","volume":"9 3","pages":"733-748"},"PeriodicalIF":4.4,"publicationDate":"2024-03-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.1049/hve2.12417","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140104985","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
High VoltagePub Date : 2024-03-11DOI: 10.1049/hve2.12424
Xingyu Shang, Lei Pang, Qinhao Bu, Qiaogen Zhang
{"title":"Thermal runaway and induced electrical failure of epoxy resin in high-frequency transformers: Insulation design reference","authors":"Xingyu Shang, Lei Pang, Qinhao Bu, Qiaogen Zhang","doi":"10.1049/hve2.12424","DOIUrl":"10.1049/hve2.12424","url":null,"abstract":"<p>Solid-state transformers (SSTs) have applications in medium-voltage direct current (MVDC) grids and compact power systems. High-frequency transformer (HFT) is the core component of SSTs. High levels of high frequency high d<i>v</i>/d<i>t</i> voltage stresses challenged the integrity of the galvanic insulation of HFTs. However, dielectric thermal runaway and resultant electrical failure mechanisms in epoxy resin (EP) cast insulation remain unclear. Dielectric heating of EP across varying voltages, frequencies, rising edges, duty cycles and DC biases were measured and corroborated by simulation. The thermal runaway threshold mainly depends on the tangency point of the loss generation and heat dissipation curves below the glass transition temperature. Observations reveal that thermal runaway does not directly cause breakdown; instead, thermal decomposition above 200°C triggers discharge and eventual failure. Simulations demonstrate that temperature rise mainly depends on the average field within the electrode region and inter-segment and inter-layer distances within the HFT winding definitively impact insulation thermal runaway. By applying different criteria for MV and high-voltage (HV) transformers, the reference electric fields for insulation design with unfilled and filled EP were obtained. For instance, limiting dielectric heating below 5 K at 50 kHz necessitates an RMS average field less than 0.44 V/mm, which is much lower than dry-type transformer conventions. The authors prove the necessity of re-evaluating the permissible field strength in HFT insulation design.</p>","PeriodicalId":48649,"journal":{"name":"High Voltage","volume":"9 5","pages":"989-1000"},"PeriodicalIF":4.4,"publicationDate":"2024-03-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.1049/hve2.12424","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140253693","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
High VoltagePub Date : 2024-02-21DOI: 10.1049/hve2.12401
Junwen He, Bangfa Peng, Guanglin Yu, Ronggang Wang, Nan Jiang, Jie Li, Yan Wu
{"title":"Experimental and numerical study on atmospheric-pressure air dielectric barrier discharge via 50 Hz/5000 Hz dual-frequency excitation","authors":"Junwen He, Bangfa Peng, Guanglin Yu, Ronggang Wang, Nan Jiang, Jie Li, Yan Wu","doi":"10.1049/hve2.12401","DOIUrl":"10.1049/hve2.12401","url":null,"abstract":"<p>A dual-frequency (DF) dielectric barrier discharge, excited by the superposition of a 50 Hz low frequency (LF) and a 5000 Hz intermediate frequency (IF), is proposed to enhance discharge. The effect of the LF voltage component on the breakdown behaviour of the DF discharge during different periods has been studied both experimentally and numerically. The number of high-current pulses rises as the LF voltage increases. The statistical analysis shows that the number of the current pulse amplitude above 80 mA in the DF discharge reaches nearly 6 times that in the IF discharge. Additionally, the total discharge energy in the DF discharge is significantly higher than that in the IF discharge. The simulation reproduces the temporal variation of the breakdown behaviours in the DF discharge. The simulated results reveal that the maximal electric field strength of the breakdown process is greater in the DF discharge compared to the IF discharge during a half-period of DF. Finally, the comparison between the IF and DF discharges exhibits that the LF voltage regulates the accumulation of residual charged species on the dielectric surface after the breakdown by modulating the residual voltage between the air gap.</p>","PeriodicalId":48649,"journal":{"name":"High Voltage","volume":"9 2","pages":"391-402"},"PeriodicalIF":4.4,"publicationDate":"2024-02-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.1049/hve2.12401","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139943556","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Electrical tree degradation of MgO/epoxy resin composites at different voltage frequencies","authors":"Yunxiao Zhang, Wenxin Lin, Yuanxiang Zhou, Weiwei Xing, Jiayu Cheng, Chenyuan Teng","doi":"10.1049/hve2.12407","DOIUrl":"10.1049/hve2.12407","url":null,"abstract":"<p>Electrical tree degradation is one of the main causes of insulation failure in high-frequency transformers. Electrical tree degradation is studied on pure epoxy resin (EP) and MgO/EP composites at frequencies ranging from 50 Hz to 130 kHz. The results show that the tree initiation voltage of EP decreases, while the growth rate and the expansion coefficient increase with frequency. Moreover, the bubble phenomenon at high frequencies in EP composites is discussed. Combined with trap distribution characteristics within the material, the intrinsic mechanism of epoxy composites to inhibit the growth of the electrical tree at different frequencies is discussed. It can be concluded that more deep traps and blocking effect are introduced by doping nano-MgO into EP bulks, which can improve the electrical tree resistance performance of EP composites in a wide frequency range.</p>","PeriodicalId":48649,"journal":{"name":"High Voltage","volume":"9 3","pages":"581-590"},"PeriodicalIF":4.4,"publicationDate":"2024-02-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.1049/hve2.12407","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139943564","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A fast and high‐accurate commutation failure identification method for LCC‐HVDC system","authors":"Jing Feng, Zhijie Liu, Kejun Li, Bingkun Li, Jiachen Li, Liangzi Li","doi":"10.1049/hve2.12400","DOIUrl":"https://doi.org/10.1049/hve2.12400","url":null,"abstract":"Commutation failure (CF) is one of the most common issues in line‐commuted converter‐based high voltage direct current systems (LCC‐HVDC), leading to critical power system security and stability problems. Accurate and rapid identification of CF is crucial to prevent subsequent CF in HVDC systems. However, the existing CF identification methods are lack of the required accuracy and speed. The relationship between bridge arm current, commutation voltage, and trigger pulse based on the commutation progress mechanism after the AC fault is analysed in this paper. A novel CF identification method is presented, which utilises the CF identification factor, enabling fast and high‐accurate identification without relying on the value of the extinction angle. The proposed method offers a simpler and more efficient implementation in engineering practice. Finally, the effectiveness of the proposed method is verified in both the standard International Council on Large Electric systems HVDC model and the Hardware in Loop test using practical project parameters. The results demonstrate that the proposed method can accurately and fast identify CF.","PeriodicalId":48649,"journal":{"name":"High Voltage","volume":"70 38","pages":""},"PeriodicalIF":4.4,"publicationDate":"2024-02-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139843826","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A fast and high-accurate commutation failure identification method for LCC-HVDC system","authors":"Jing Feng, Zhijie Liu, Kejun Li, Bingkun Li, Jiachen Li, Liangzi Li","doi":"10.1049/hve2.12400","DOIUrl":"10.1049/hve2.12400","url":null,"abstract":"<p>Commutation failure (CF) is one of the most common issues in line-commuted converter-based high voltage direct current systems (LCC-HVDC), leading to critical power system security and stability problems. Accurate and rapid identification of CF is crucial to prevent subsequent CF in HVDC systems. However, the existing CF identification methods are lack of the required accuracy and speed. The relationship between bridge arm current, commutation voltage, and trigger pulse based on the commutation progress mechanism after the AC fault is analysed in this paper. A novel CF identification method is presented, which utilises the CF identification factor, enabling fast and high-accurate identification without relying on the value of the extinction angle. The proposed method offers a simpler and more efficient implementation in engineering practice. Finally, the effectiveness of the proposed method is verified in both the standard International Council on Large Electric systems HVDC model and the Hardware in Loop test using practical project parameters. The results demonstrate that the proposed method can accurately and fast identify CF.</p>","PeriodicalId":48649,"journal":{"name":"High Voltage","volume":"9 3","pages":"721-732"},"PeriodicalIF":4.4,"publicationDate":"2024-02-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.1049/hve2.12400","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139784145","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
High VoltagePub Date : 2024-02-07DOI: 10.1049/hve2.12420
Shucan Cheng, Yanpu Zhao, Kejia Xie, Bin Hu
{"title":"A novel multi-slice electromagnetic field-circuit coupling method for transient computation of long-distance gas-insulated transmission lines","authors":"Shucan Cheng, Yanpu Zhao, Kejia Xie, Bin Hu","doi":"10.1049/hve2.12420","DOIUrl":"10.1049/hve2.12420","url":null,"abstract":"<p>Accurate calculation of short-circuit electromagnetic force is crucial for both mechanical strength check and the optimal design of gas-insulated transmission lines (GIL). Since the full 3D numerical simulation method is highly time-consuming, a novel lightweight 2D multi-slice electromagnetic field-circuit coupled method for computing transient electromagnetic force is proposed, where appropriate port voltage degrees of freedom (DoFs) are introduced for the solid GIL conductor terminals. When the transient magnetic field equations are combined with the constraint equations of circuit part, including nodal voltage and loop current DoFs, a direct field-circuit coupling scheme is thus derived. The proposed method can simultaneously consider the effect of interphase-shunts and ground wires, as well as the skin effect and proximity effect. It can accurately capture the transient electromagnetic characteristics of GIL spanning from several to tens of kilometers under different short-circuit conditions. The transient electromagnetic forces, as well as the induced voltages and currents of the enclosure, are analysed by the proposed method for both single-phase and three-phase enclosed GIL under various short-circuit conditions. The proposed method has the advantages of high accuracy and lightweight computational cost, and thus it is also suitable for conducting important simulation tasks such as mechanical strength checks during the design optimisation phase of long-distance GIL.</p>","PeriodicalId":48649,"journal":{"name":"High Voltage","volume":"9 4","pages":"826-838"},"PeriodicalIF":4.4,"publicationDate":"2024-02-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.1049/hve2.12420","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139701073","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}