2015 IEEE 61st Holm Conference on Electrical Contacts (Holm)最新文献_第5页

Experimental research on radiated electroma gnetic noise of pantograph arc 受电弓电弧辐射电磁噪声的实验研究

2015 IEEE 61st Holm Conference on Electrical Contacts (Holm) Pub Date : 2015-10-01 DOI: 10.1109/HOLM.2015.7355106

Zhiyong Wang, Fengyi Guo, Xili Wang, Yanli Zhang, Baowei Wang, Xiaoming Yan

{"title":"Experimental research on radiated electroma gnetic noise of pantograph arc","authors":"Zhiyong Wang, Fengyi Guo, Xili Wang, Yanli Zhang, Baowei Wang, Xiaoming Yan","doi":"10.1109/HOLM.2015.7355106","DOIUrl":"https://doi.org/10.1109/HOLM.2015.7355106","url":null,"abstract":"In recent years, with the continuous increasing of electric locomotive running speed, electromagnetic noise of pantograph arc gets more and more serious and has become a kind of security risk of electric railway's operation. To study the electromagnetic noise and suppression methods of pantograph arc, an electromagnetic noise experimental system was developed. The experimental system is composed of an echoic chamber, pantograph arc generator and pantograph arc detection system. With the experimental system, 64 groups of radiation electromagnetic noise experiments were conducted under different contact force, contact current and sliding speed conditions. The experimental materials are metal impregnation carbon slide and Cu contact wire respectively. The radiated electromagnetic noise of pantograph arc is mainly electric field noise. Most of the electric field noise is distributed in the frequency ranges from 30MHz to 500MHz. And the maximum interference is between 30MHz and 80 MHz. With the increase of contact current, the distribution of the electric field noise becomes denser and the disturbance level increases. With the increase of contact pressure or sliding speed, the distribution of the electric field noise firstly becomes thinner and then denser.","PeriodicalId":448541,"journal":{"name":"2015 IEEE 61st Holm Conference on Electrical Contacts (Holm)","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123847495","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 10

Effect of fretting wear damage in RF connectors subjected to vibration: DC contact resistance and phase-noise response 振动对射频连接器微动磨损损伤的影响:直流接触电阻和相位噪声响应

2015 IEEE 61st Holm Conference on Electrical Contacts (Holm) Pub Date : 2015-10-01 DOI: 10.1109/HOLM.2015.7354950

R. Enquebecq, S. Fouvry, E. Rubiola, M. Collet, L. Petit, J. Legrand, L. Boillot

{"title":"Effect of fretting wear damage in RF connectors subjected to vibration: DC contact resistance and phase-noise response","authors":"R. Enquebecq, S. Fouvry, E. Rubiola, M. Collet, L. Petit, J. Legrand, L. Boillot","doi":"10.1109/HOLM.2015.7354950","DOIUrl":"https://doi.org/10.1109/HOLM.2015.7354950","url":null,"abstract":"In many applications, RF connectors are subjected to severe environmental vibration. Vibration induces micro-displacements, leading to fretting wear damage in the contact. The purpose of this study is to investigate the effect of fretting wear on the microwave signal and more precisely on the additive phase noise [1, 2]. A dedicated vibration test was developed, combining DC and microwave measurement. It consisted of a shaker, a vector network analyzer, a phase-noise analyzer using a cross-correlation technique, and a system for measuring electrical contact resistance. Degradation of phase noise by fretting wear was demonstrated. Two contributions were identified: relative fretting displacement amplitude, by fluctuating the total transmission distance, induced phase noise at the specific fretting frequency proportional to the fretting displacement; also, by inducing oxide debris in the interface, gross slip fretting wear damage decayed DC electrical contact resistance and microwave signal transmission. The study established quantitative correlations between the evolution of DC, transmission loss and phase-noise parameters.","PeriodicalId":448541,"journal":{"name":"2015 IEEE 61st Holm Conference on Electrical Contacts (Holm)","volume":"IA-15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126557342","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 6

Mathematical model to simulate an arc erosion of electrical contact in switchgear device 模拟开关设备电触点电弧侵蚀的数学模型

2015 IEEE 61st Holm Conference on Electrical Contacts (Holm) Pub Date : 2015-10-01 DOI: 10.1109/HOLM.2015.7355131

Amol Kale, M. Ranade, A. Singh

引用次数: 1

Experiment research on re-strike phenomenon occurring during high-voltage direct-current breaking process under transverse magnetic field 横向磁场作用下高压直流分断过程中重击现象的实验研究

2015 IEEE 61st Holm Conference on Electrical Contacts (Holm) Pub Date : 2015-10-01 DOI: 10.1109/HOLM.2015.7355095

Cui Xinglei, Z. Xue, Chen Mo, Bo Kai, Peng Xiyuan

引用次数: 6

Degradation phenomenon of electrical contacts by using a micro-sliding mechanism 使用微滑动机构的电触点退化现象

2015 IEEE 61st Holm Conference on Electrical Contacts (Holm) Pub Date : 2015-10-01 DOI: 10.1109/HOLM.2015.7355104

S. Wada, K. Sawa

引用次数: 0

Fluctuation components of contact voltage at AgPd brush and Au-plated slip-ring system with lubricant AgPd电刷与镀金滑环系统接触电压波动分量分析

2015 IEEE 61st Holm Conference on Electrical Contacts (Holm) Pub Date : 2015-10-01 DOI: 10.1109/HOLM.2015.7355105

K. Sawa, Yutaka Takemasa, Yoshitada Watanabe, T. Ueno, Masaru Yamanoi

{"title":"Fluctuation components of contact voltage at AgPd brush and Au-plated slip-ring system with lubricant","authors":"K. Sawa, Yutaka Takemasa, Yoshitada Watanabe, T. Ueno, Masaru Yamanoi","doi":"10.1109/HOLM.2015.7355105","DOIUrl":"https://doi.org/10.1109/HOLM.2015.7355105","url":null,"abstract":"The authors have investigated the deterioration process of the system of Au-plated slip-rings mating with AgPd brushes, which is used mainly in chip-mounters. Past tests have shown that the lubricant is very important for obtaining long lifetime. The lubricant can not only decrease ring wear but also protect the ring from oxidation. In operation the contact voltage drop is generally low and stable at the beginnings of tests and increases with the operation time. In this paper the fluctuation characteristics are observed in detail and the following characteristics are observed. The contact voltage fluctuation increases with the operation time while the fluctuation pattern is different at each ring. The minimum value of the contact voltage waveform stays almost constant around 20mV. The maximum value can become as high as 180mV on some rings. However, the surface morphology of rings with high peak values is almost the same as those with low peak value. Further, the peak value is greatly dependent on rotational speed. The peak value approaches the minimum value at low speeds. From these results it is deduced that the contact voltage increase is controlled by the lubricant thickness between brush and ring and not from ring surface itself. This indicates that tunnel effect resistance is important. The relationship between peak value and lifetime is discussed.","PeriodicalId":448541,"journal":{"name":"2015 IEEE 61st Holm Conference on Electrical Contacts (Holm)","volume":"74 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127343647","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

Dependence of contact weld force on arc energy supplied to contact surface in low voltage switches 低压开关接触面电弧能量对接触焊缝力的影响

2015 IEEE 61st Holm Conference on Electrical Contacts (Holm) Pub Date : 2015-10-01 DOI: 10.1109/HOLM.2015.7355090

Katsuki Hotta, T. Inaguchi

{"title":"Dependence of contact weld force on arc energy supplied to contact surface in low voltage switches","authors":"Katsuki Hotta, T. Inaguchi","doi":"10.1109/HOLM.2015.7355090","DOIUrl":"https://doi.org/10.1109/HOLM.2015.7355090","url":null,"abstract":"This paper describes a mechanism of contact welding formed by bounce arc upon contact making, based on experiments, theoretic and analytic study. We measured the weld force after every contact making in a low-voltage condition (200 V-AC). The arc current was set to 140 to 500 A by using a reactor load, the arc duration time was within 0.22 to 2.37 ms, and the contact material was pure silver (99.99 %). In this condition, we clarified that the weld force increases depending on arc energy supplied to the contact surface. We also measured the melted area on contact surface and clarified the area dependence on the arc energy. Considering that the tensile strength of silver is 170 N/mm2, the measured melted area is too large as a welded area. Then we found out that the real welded area corresponds to about 25 % of the melted area. As a conclusion, we suggest that a vaporized area on the contact surface may not be involved in contact welding, from the analytical simulation of thermal conduction in the contact model. The real welded area is the region whose temperature is higher than the melting temperature and that remains without evaporation.","PeriodicalId":448541,"journal":{"name":"2015 IEEE 61st Holm Conference on Electrical Contacts (Holm)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127733891","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

Degradation of a single aluminum junction due to electro-migration 由电迁移引起的单个铝结的退化

2015 IEEE 61st Holm Conference on Electrical Contacts (Holm) Pub Date : 2015-10-01 DOI: 10.1109/HOLM.2015.7355123

R. Malucci

{"title":"Degradation of a single aluminum junction due to electro-migration","authors":"R. Malucci","doi":"10.1109/HOLM.2015.7355123","DOIUrl":"https://doi.org/10.1109/HOLM.2015.7355123","url":null,"abstract":"A set of data provided in the literature was reported to show the impact of electro-migration on aluminum junctions. These junctions were fabricated by machining aluminum foil to provide a small connection between two conducting halves. The results appeared to show high current densities cause rapid degradation due to void and crack formation. These results are thought to occur as a result of mass transport due to electro-migration. In the present paper, a degradation model is provided using electro-migration considerations and the geometry in the work mentioned above. This approach uses estimated current flow paths and their associated current density distributions. The current densities are estimated using electromagnetic theory and the junction geometry. Moreover, the estimated effects over time of current density on the local variation of conductivity are incorporated into the model using percolation theory. Consequently, the current flow, current densities and degradation model are used in conjunction to conduct a numerical analysis of the degradation of a single aluminum junction. The approach exhibits how a model with these elements provides insight into the degradation process due to electro-migration. It is seen that this approach shows reasonably good agreement between theory and experiment providing a basis for analyzing electro-migration degradation in a variety of general cases.","PeriodicalId":448541,"journal":{"name":"2015 IEEE 61st Holm Conference on Electrical Contacts (Holm)","volume":"85 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134430261","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

Investigation on the mechanism of the infiltration process of contact material 接触材料渗透过程机理的研究

2015 IEEE 61st Holm Conference on Electrical Contacts (Holm) Pub Date : 2015-10-01 DOI: 10.1109/HOLM.2015.7355097

Zhenyang Song, Xiufang Zhang, Xiaoping Bai, W. Weng

引用次数: 1

Understanding the fretting failure mechanisms in gold-plated contact materials 了解镀金触点材料的微动失效机理

2015 IEEE 61st Holm Conference on Electrical Contacts (Holm) Pub Date : 2015-10-01 DOI: 10.1109/HOLM.2015.7355086

W. Ren, H. Zhi, L. Cui

引用次数: 1