使用微滑动机构的电触点退化现象

S. Wada, K. Sawa
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引用次数: 0

摘要

研究了接触电阻在外部微振荡作用下的退化现象。他们开发了一种锤击振荡机构(HOM)或微滑动机构1 (MSM1),为电触点提供微振荡。结果表明,每种机制都能模拟电触点的实际退化现象。他们还开发了第三种机构,即由压电致动器和弹性铰链驱动的微滑动机构2 (MSM2),该机构具有更精确的滑动性能,滑动时的热漂移更小,并且由商用部件组成的系统尺寸更小。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Degradation phenomenon of electrical contacts by using a micro-sliding mechanism
Authors have studied the degradation phenomenon on contact resistance under the influences of an external micro-oscillation. They have developed a hammering oscillating mech-anism (HOM) or a micro-sliding mechanism 1 (MSM1) which provides micro-oscillations for electrical contacts. It is shown that each mechanism is able to simulate an actual degradation phenomenon on electrical contacts. And they have also developed the third mechanism, namely another micro-sliding mechanism 2 (MSM2) which provides micro-sliding driven by a piezo-electric actuator and elastic hinges, which has more precise sliding performance, less thermal drift on the sliding, and smaller sized system constituted of commercial parts.
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