2015 IEEE 61st Holm Conference on Electrical Contacts (Holm)最新文献

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Recognition of series arc fault based on the Hilbert Huang Transform 基于Hilbert Huang变换的串联电弧故障识别
2015 IEEE 61st Holm Conference on Electrical Contacts (Holm) Pub Date : 2015-10-01 DOI: 10.1109/HOLM.2015.7355116
Changken Chen, Fengyi Guo, Yanli Liu, Zhiyong Wang, Yanjun Chen, Haihong Liang
{"title":"Recognition of series arc fault based on the Hilbert Huang Transform","authors":"Changken Chen, Fengyi Guo, Yanli Liu, Zhiyong Wang, Yanjun Chen, Haihong Liang","doi":"10.1109/HOLM.2015.7355116","DOIUrl":"https://doi.org/10.1109/HOLM.2015.7355116","url":null,"abstract":"Series arc fault is a common fault in a power supply system. It could affect the reliability of power supply seriously and even cause safety accidents. A low-voltage series arc fault experiment platform was developed on the basis of the GB14287.4 standard in this paper. Series arc fault experiments were conducted with different types of load. Arc fault current signals of five cycles before and after arc occurred were analyzed by using Hilbert-Huang Transform. The current was resolved into several Intrinsic Mode Functions (IMF) by using the Empirical Mode Decomposition (EMD). Then the Hilbert spectrum was obtained by calculating Hilbert transform for IMF. The results show that Hilbert spectrum amplitude increased when arc fault occurred. Therefore Hilbert Huang Transform can be used to recognize the series arc fault.","PeriodicalId":448541,"journal":{"name":"2015 IEEE 61st Holm Conference on Electrical Contacts (Holm)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131075131","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Electrical fretting wear performance of new silver composite coatings 新型银复合镀层的电微动磨损性能
2015 IEEE 61st Holm Conference on Electrical Contacts (Holm) Pub Date : 2015-10-01 DOI: 10.1109/HOLM.2015.7355111
J. Laporte, S. Fouvry, A. Chavanne, J. Sautel, J. Legrand
{"title":"Electrical fretting wear performance of new silver composite coatings","authors":"J. Laporte, S. Fouvry, A. Chavanne, J. Sautel, J. Legrand","doi":"10.1109/HOLM.2015.7355111","DOIUrl":"https://doi.org/10.1109/HOLM.2015.7355111","url":null,"abstract":"In transport applications (automotive, aviation), the increase of electronic devices promotes an extensive use of electrical connectors which need to maintain a low and stable electrical contact resistance. However, they are subject to vibration, which can cause severe fretting wear damage in the contact, leading to increased electrical contact resistance and decay of information transmission. Presently, the main solution consists in applying noble coatings (Ag, Au), although, due to the price of gold, Ag layers are preferred. However, some improvements remain to be made in order to match the performance of gold, and this implies developing new silver composites displaying better electrical performance and lower wear rates. In the present study, several new Ag-based coatings including various doping particles (CrN, C, etc.) were investigated to determine the benefit of composite layers for connectors such as in electrical micro-contact applications. A homogeneous crossed-cylinder configuration was studied under gross slip conditions, varying the fretting loading (±2μm<;δg*<;±16μm, P=3N, RH=10%, T=25°C and f=30Hz). Simple expressions were derived to quantify the Electrical Contact Resistance (ECR) endurance evolution (Nc: ΔR>δRc=4mΩ) as a function of fretting sliding and coating structure. The studied layers were thus classified according to ECR performance. Chemical and 3D profile investigations were also performed, to describe the ECR degradation process.","PeriodicalId":448541,"journal":{"name":"2015 IEEE 61st Holm Conference on Electrical Contacts (Holm)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131265986","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Fundamental characteristics of arc extinction by magnetic blow-out at DC voltages (<500V) II 直流电压(<500V)下磁灭弧的基本特性ⅱ
2015 IEEE 61st Holm Conference on Electrical Contacts (Holm) Pub Date : 2014-10-01 DOI: 10.1109/HOLM.2015.7355089
K. Sawa, Shigeru Tsujimura, S. Motoda
{"title":"Fundamental characteristics of arc extinction by magnetic blow-out at DC voltages (<500V) II","authors":"K. Sawa, Shigeru Tsujimura, S. Motoda","doi":"10.1109/HOLM.2015.7355089","DOIUrl":"https://doi.org/10.1109/HOLM.2015.7355089","url":null,"abstract":"As various DC power supply systems such as photovoltaic power generation, fuel cell and others have become gradually popular, DC current interruption is one of the key technologies for reliability and safety of DC switching devices. In a previous paper a model switch is developed with magnetic blow-out of three levels, and gap length and arc length at arc extinction are obtained by a high-speed camera in range of current less than 4 A and voltage lower than 500V. The gap length and arc length at extinction are much shorter than those without magnetic blow-out.In this paper the interrupted current is expanded to 30A and source voltage is 100, 300 and 500V. The results are compared with previous ones and the followings can be made clear. The gap width at arc extinction is almost independent of interrupted current and source voltage. Those gap width is 0.8, 0.3 and 0.2 mm for magnetic flux densities 19, 53 and 157mT, respectively, and in accordance with the previous values. On the other hand, the arc length becomes longer with interrupted current / source voltage. The maximum length reaches about 60 mm at 500V and 30A for19mT. In addition the change of arc length with time is discussed and the process is found to consist of slow rising and rapid rising intervals.","PeriodicalId":448541,"journal":{"name":"2015 IEEE 61st Holm Conference on Electrical Contacts (Holm)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129408755","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
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