IEEE Journal of Photovoltaics最新文献_第7页

Sensitivity Analysis of Eddy Current Excess Carrier Recombination Lifetime Measurements Due to Input Parameter Uncertainty 输入参数不确定性下涡流过量载流子复合寿命测量的灵敏度分析

IF 2.5 3区工程技术

IEEE Journal of Photovoltaics Pub Date : 2025-02-19 DOI: 10.1109/JPHOTOV.2025.3539294

Adrienne L. Blum;Harrison W. Wilterdink;Ronald A. Sinton

{"title":"Sensitivity Analysis of Eddy Current Excess Carrier Recombination Lifetime Measurements Due to Input Parameter Uncertainty","authors":"Adrienne L. Blum;Harrison W. Wilterdink;Ronald A. Sinton","doi":"10.1109/JPHOTOV.2025.3539294","DOIUrl":"https://doi.org/10.1109/JPHOTOV.2025.3539294","url":null,"abstract":"For decades, excess carrier recombination lifetime measurements using an eddy current photoconductance sensor have been essential in characterizing the quality of silicon photovoltaic samples prior to metallization. Key metrics reported from the analysis of these measurements include injection-dependent excess carrier recombination lifetime, emitter saturation current density, bulk lifetime, and the implied current–voltage curve. These metrics are crucial for process control, optimization, and technological advancements in photovoltaic research and development, as well as production. As modern high-efficiency cell designs increasingly rely on precise determination of these metrics, it is important to quantify their uncertainty due to all factors; this study specifically examines their sensitivity to uncertainties in the sample-specific input parameters required for their reporting. Overall, results with a high level of confidence, including less than 1-fA/cm2 uncertainty in emitter saturation current density and less than 1-mV uncertainty in implied <inline-formula><tex-math>${V}_{mathrm{oc}}$</tex-math></inline-formula>, can be achieved with knowledge of the input thickness and substrate resistivity beyond what is specified on a wafer specification sheet.","PeriodicalId":445,"journal":{"name":"IEEE Journal of Photovoltaics","volume":"15 3","pages":"393-399"},"PeriodicalIF":2.5,"publicationDate":"2025-02-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10893710","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143860815","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Top-Performing Photovoltaic Cells Compared to the Shockley–Queisser Limit 与Shockley-Queisser极限相比，表现最好的光伏电池

IF 2.5 3区工程技术

IEEE Journal of Photovoltaics Pub Date : 2025-02-07 DOI: 10.1109/JPHOTOV.2025.3533883

Camden Kasik;Marko Jošt;Ishwor Khatri;Marko Topič;James Sites

{"title":"Top-Performing Photovoltaic Cells Compared to the Shockley–Queisser Limit","authors":"Camden Kasik;Marko Jošt;Ishwor Khatri;Marko Topič;James Sites","doi":"10.1109/JPHOTOV.2025.3533883","DOIUrl":"https://doi.org/10.1109/JPHOTOV.2025.3533883","url":null,"abstract":"Top-performing single-junction and two-terminal tandem devices that include at least one polycrystalline cell are compared with each other and their ideal limits. The parameters of open-circuit voltage, short-circuit current, and fill-factor are individually compared to the Shockley–Queisser limit to investigate where different technologies have room to improve. Technologies, such as silicon and cadmium telluride have the most room for improvement in open-circuit voltage currently utilizing 87% and 81% of their maxima, respectively. Detailed diode and fill-factor loss analysis is presented for single-junction devices to give further insight on how they compare and where efficiency is lost. Single-crystal technologies demonstrate a fill-factor closer to the Shockley–Queisser limit than polycrystalline devices. The high diode quality factor of polycrystalline devices is the leading cause of the decreased fill-factor. Similar analysis on tandem cells with at least one thin-film cell shows that although their efficiency exceeds that of the single-junction cells, the fraction of their ideal efficiency is smaller. By comparing parameters to the Shockley–Queisser limit, it becomes clearer where certain technologies have the potential for improvement.","PeriodicalId":445,"journal":{"name":"IEEE Journal of Photovoltaics","volume":"15 2","pages":"268-273"},"PeriodicalIF":2.5,"publicationDate":"2025-02-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143455169","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Characterization of Field-Exposed Photovoltaic Modules Featuring Signs of Contact Degradation 具有接触退化迹象的野外暴露光伏组件的表征

IF 2.5 3区工程技术

IEEE Journal of Photovoltaics Pub Date : 2025-02-07 DOI: 10.1109/JPHOTOV.2025.3531052

Max Liggett;Dylan J. Colvin;Andrew Ballen;Manjunath Matam;Hubert P. Seigneur;Mengjie Li;Andrew M. Gabor;Philip J. Knodle;Craig J. Neal;Sudipta Seal;Daniel Riley;Bruce H. King;Peter Michael;Laura S. Bruckman;Roger H. French;Kristopher O. Davis

{"title":"Characterization of Field-Exposed Photovoltaic Modules Featuring Signs of Contact Degradation","authors":"Max Liggett;Dylan J. Colvin;Andrew Ballen;Manjunath Matam;Hubert P. Seigneur;Mengjie Li;Andrew M. Gabor;Philip J. Knodle;Craig J. Neal;Sudipta Seal;Daniel Riley;Bruce H. King;Peter Michael;Laura S. Bruckman;Roger H. French;Kristopher O. Davis","doi":"10.1109/JPHOTOV.2025.3531052","DOIUrl":"https://doi.org/10.1109/JPHOTOV.2025.3531052","url":null,"abstract":"This work investigates several photovoltaic (PV) modules that have shown signs of metal contact corrosion due to field exposure in a hot and humid climate. This includes two multicrystalline silicon aluminum back surface field systems with 10 and 14 years of exposure and one monocrystalline silicon passivated emitter and rear cell system with four years of exposure. A comprehensive, multiscale characterization process is used to evaluate these PV modules in great detail. Current–voltage (<inline-formula><tex-math>$I-V$</tex-math></inline-formula>), Suns-<inline-formula><tex-math>$V_{text{OC}}$</tex-math></inline-formula> measurements, electroluminescence imaging, infrared imaging, and ultraviolet fluorescence imaging were performed, and locations of interest were cored and analyzed using cross-sectional scanning electron microscopy (SEM). A rigorous, quantitative analysis procedure for the cross-sectional SEM images is proposed and implemented. Careful characterization does reveal that some of these PV modules do indeed exhibit the same classic signs of acetic-acid-based corrosion of the glass frit that is present at the silver/silicon interface, which have been observed previously in PV modules exposed to damp heat in an environmental chamber.","PeriodicalId":445,"journal":{"name":"IEEE Journal of Photovoltaics","volume":"15 2","pages":"233-243"},"PeriodicalIF":2.5,"publicationDate":"2025-02-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143455166","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

A Single Voltage Sensor Bypass Switch-Based Photovoltaic Fault Localization 基于单电压传感器旁路开关的光伏故障定位

IF 2.5 3区工程技术

IEEE Journal of Photovoltaics Pub Date : 2025-02-07 DOI: 10.1109/JPHOTOV.2025.3530001

Ali Alhejab;Muhammad Abbasi;Shehab Ahmed

{"title":"A Single Voltage Sensor Bypass Switch-Based Photovoltaic Fault Localization","authors":"Ali Alhejab;Muhammad Abbasi;Shehab Ahmed","doi":"10.1109/JPHOTOV.2025.3530001","DOIUrl":"https://doi.org/10.1109/JPHOTOV.2025.3530001","url":null,"abstract":"Photovoltaic (PV) energy systems are becoming an important source of sustainable energy. However, undiscovered faults within these systems may cause significant efficiency reduction. Localizing these faults to the module level is important for a quick fault diagnosis and maintaining the overall system efficiency. This article presents a novel method to localize intrastring, line-ground, cross-string, and partial shading faults in an <inline-formula><tex-math>$N$</tex-math></inline-formula> × <inline-formula><tex-math>$M$</tex-math></inline-formula> PV system down to the module level. The approach utilizes a single voltage sensor in the combiner box of the PV system and <inline-formula><tex-math>$lceil N/2 rceil$</tex-math></inline-formula> bypass switches per string to bypass the connected PV modules during faults. The technique initially relies on identifying the faulty string. Once this string is determined, the voltage associated with each module in that string is found. Each module's voltage in that string is obtained by measuring the string voltage after bypassing each module corresponding to an activated switch. Subsequently, the resulting linear equations are solved to obtain the voltage of each module in the faulty string. The technique is verified using simulation and an experimental setup for a 5 x 4 small-size PV system. Experimental and simulation results demonstrate that the technique can accurately localize faulty modules with only <inline-formula><tex-math>$N$</tex-math></inline-formula> voltage samples of the faulty string. The proposed method is robust to variations in the maximum power point tracking algorithm, ensuring faults are localized effectively in real-time.","PeriodicalId":445,"journal":{"name":"IEEE Journal of Photovoltaics","volume":"15 2","pages":"362-372"},"PeriodicalIF":2.5,"publicationDate":"2025-02-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143455253","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Ultrasonic Tinning of Al Busbars for a Silver-Free Rear Side on Bifacial Silicon Solar Cells 双面硅太阳能电池背面无银铝母线的超声镀锡

IF 2.5 3区工程技术

IEEE Journal of Photovoltaics Pub Date : 2025-02-06 DOI: 10.1109/JPHOTOV.2025.3533901

Malte Brinkmann;Thomas Daschinger;Rolf Brendel;Henning Schulte-Huxel

{"title":"Ultrasonic Tinning of Al Busbars for a Silver-Free Rear Side on Bifacial Silicon Solar Cells","authors":"Malte Brinkmann;Thomas Daschinger;Rolf Brendel;Henning Schulte-Huxel","doi":"10.1109/JPHOTOV.2025.3533901","DOIUrl":"https://doi.org/10.1109/JPHOTOV.2025.3533901","url":null,"abstract":"Reducing the silver consumption of photovoltaics (PV) is a major aspect in recent solar cell research. For bifacial PERC+ solar cells silver is used for the front contact. On the rear side aluminum metallization provides the contact to the silicon. The native oxide of aluminum prohibits a standard soldering process. Therefore, rear side silver pads are typically used for the cell-to-cell interconnections with copper wires. Silver can be avoided when using ultrasonic soldering for wetting the aluminum metallization to form tin solder pads. We demonstrate mechanically stable soldering of interconnects to the silver-free solder pads with a median adhesion up to 3 N/mm. We observe a penetration of the native aluminum oxide layer by the ultrasonic tinning process and the formation of metal-to-metal contacts from the aluminum to the solder. Resistance measurements demonstrate a reduced series resistance of the ultrasonically prepared contact when compared with using silver pads. For PERC+ cells, we can thus fully avoid rear side silver pads for a standard stringing process to reduce the silver consumption by 20%–40%. We fabricate mini modules that reach the same efficiency as reference modules with standard silver pads on the rear. The efficiency degradation of the modules with the ultrasonic interconnection is less than 3.6% after 200 humidity-freeze cycles and less than 2.2% after 600 temperature cycles.","PeriodicalId":445,"journal":{"name":"IEEE Journal of Photovoltaics","volume":"15 2","pages":"244-251"},"PeriodicalIF":2.5,"publicationDate":"2025-02-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143455265","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Evaluating the Potential of Polycrystalline Al0.25Ga0.75P and Al0.9Ga0.1As as Hole Contacts in Silicon Heterojunction Solar Cells 多晶Al0.25Ga0.75P和Al0.9Ga0.1As作为硅异质结太阳能电池空穴触点的电位评价

IF 2.5 3区工程技术

IEEE Journal of Photovoltaics Pub Date : 2025-02-06 DOI: 10.1109/JPHOTOV.2024.3519616

David Quispe;Brendan Eng;Mijung Kim;Brian J. Coppa;Minjoo L. Lee;Zachary C. Holman

{"title":"Evaluating the Potential of Polycrystalline Al0.25Ga0.75P and Al0.9Ga0.1As as Hole Contacts in Silicon Heterojunction Solar Cells","authors":"David Quispe;Brendan Eng;Mijung Kim;Brian J. Coppa;Minjoo L. Lee;Zachary C. Holman","doi":"10.1109/JPHOTOV.2024.3519616","DOIUrl":"https://doi.org/10.1109/JPHOTOV.2024.3519616","url":null,"abstract":"The parasitic absorption of visible light in amorphous silicon layers can result in a short-circuit current density (<italic>Jsc) loss of up to 2 mA/cm2 for silicon heterojunction solar cells. To mitigate this issue, we explore the potential for polycrystalline Al0.25Ga0.75P and Al0.9Ga0.1As, both <italic>nonepitaxially deposited at 250 °C, to enable high <italic>Jsc while serving as alternative hole contacts to p-type amorphous silicon [a-Si:H(p)]. Using a suite of device characterization methods, we investigate how the passivation changes with the deposition of these III–V materials and their degree of hole selectivity. We identify that both Al0.25Ga0.75P and Al0.9Ga0.1As can still enable high implied open-circuit voltages >720 mV; however, they are not hole selective enough to enable high open-circuit voltage and fill factor. Ultimately, the best performing solar cells are limited to 9.6% and 10.8% efficiency with a nominal 5 nm of Al0.25Ga0.75P and a measured 13 nm of Al0.9Ga0.1As, respectively. However, both cells demonstrate higher <italic>Jsc than a reference cell with a-Si:H(p) that has a similar nominal thickness.","PeriodicalId":445,"journal":{"name":"IEEE Journal of Photovoltaics","volume":"15 2","pages":"223-232"},"PeriodicalIF":2.5,"publicationDate":"2025-02-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143455250","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Impact of Encapsulation Processing Conditions on Degradation Mechanisms of Carbon-Based Perovskite Solar Cells 封装工艺条件对碳基钙钛矿太阳能电池降解机理的影响

IF 2.5 3区工程技术

IEEE Journal of Photovoltaics Pub Date : 2025-02-06 DOI: 10.1109/JPHOTOV.2025.3533909

Nikoleta Kyranaki;Cynthia Farha;Lara Perrin;Lionel Flandin;Emilie Planès;Lukas Wagner;David Martineau;Stéphane Cros

{"title":"Impact of Encapsulation Processing Conditions on Degradation Mechanisms of Carbon-Based Perovskite Solar Cells","authors":"Nikoleta Kyranaki;Cynthia Farha;Lara Perrin;Lionel Flandin;Emilie Planès;Lukas Wagner;David Martineau;Stéphane Cros","doi":"10.1109/JPHOTOV.2025.3533909","DOIUrl":"https://doi.org/10.1109/JPHOTOV.2025.3533909","url":null,"abstract":"Perovskite photovoltaic (PV) cells have achieved a record 26.7% efficiency, but improvements in stability against humidity, temperature shifts, and light exposure remain crucial. In this work, we explored mesoporous carbon-based perovskite (c-PSC) devices because of carbon's stability and the elimination of a heat-sensitive hole transport layer. Encapsulation materials exhibiting promising properties with silicon PV, including a thermoplastic polyolefin encapsulant, were applied under different lamination conditions to investigate the impact on c-PSC devices’ durability, which is a novel study for this specific combination of materials. Inadequate curing can compromise adhesion, reduce moisture resistance, and accelerate perovskite decomposition under light exposure. Increasing the lamination temperature by 20 °C allowed samples to withstand 1000 h of damp-heat conditions, with a 30% reduction in efficiency, while lower temperature lamination caused immediate performance drops. While light exposure remained highly degrading, higher lamination temperatures delayed damage, preserving 2.5% of the initial power conversion efficiency after 400 h of aging and slowing perovskite decomposition.","PeriodicalId":445,"journal":{"name":"IEEE Journal of Photovoltaics","volume":"15 2","pages":"261-267"},"PeriodicalIF":2.5,"publicationDate":"2025-02-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143455252","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Sustainable Energy Industry Systems in the United States and Canada Demonstrating the Value of Solar-to-X 美国和加拿大的可持续能源工业系统展示了太阳能到x的价值

IF 2.5 3区工程技术

IEEE Journal of Photovoltaics Pub Date : 2025-02-03 DOI: 10.1109/JPHOTOV.2025.3531043

Gabriel Lopez;Arman Aghahosseini;Dmitrii Bogdanov;Rasul Satymov;Ayobami Solomon Oyewo;Christian Breyer

{"title":"Sustainable Energy Industry Systems in the United States and Canada Demonstrating the Value of Solar-to-X","authors":"Gabriel Lopez;Arman Aghahosseini;Dmitrii Bogdanov;Rasul Satymov;Ayobami Solomon Oyewo;Christian Breyer","doi":"10.1109/JPHOTOV.2025.3531043","DOIUrl":"https://doi.org/10.1109/JPHOTOV.2025.3531043","url":null,"abstract":"The transition to highly sustainable energy industry systems is being driven by significant growth in solar photovoltaics (PV). Despite targets to reach net-zero emissions by 2050, fossil fuels still dominate the energy industry systems in the USA and Canada. Transition pathways are developed and analyzed comparing a complete defossilization of both energy and nonenergy demands with business-as-usual conditions based on government projections. The results demonstrate the benefits of transitioning to 100% renewable energy for all sectors, as excess low-cost electricity from solar PV can be used for power-to-X solutions to produce electricity-based fuels, chemicals, and materials. By 2050, the power sector will only consume 20% of generated electricity, with the remaining used to electrify the heat, transport, and industry sectors. Thus, 86% of all primary energy in the system comes from renewable electricity, as total electricity generation increases from 4394 TWh in 2020 to 20 795 TWh in 2050. Solar PV reaches 78% of all electricity generation, leading to 10.6 TW of installed capacity. The full energy industry sector transition leads to reductions in both levelized cost of electricity (LCOE) and levelized cost of final energy (LCOFE). The LCOE sees massive reductions from 72 €/MWh in 2020 to 25 €/MWh in 2050, and the LCOFE decreases from the current 50 to 41 €/MWh in 2050. The strong operational synergies between solar PV and flexible electrolysis enable a transition pathway that demonstrates the viability of a Power-to-X Economy in achieving climate targets of net-zero emissions. The high share of solar PV indicates a Solar-to-X Economy characteristic.","PeriodicalId":445,"journal":{"name":"IEEE Journal of Photovoltaics","volume":"15 2","pages":"215-222"},"PeriodicalIF":2.5,"publicationDate":"2025-02-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10869466","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143455098","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Growing Panes: Investigating the PV Technology Trends Behind Frequent Early Failures in Modern Glass–Glass Modules 成长窗格：调查现代玻璃-玻璃组件频繁早期故障背后的光伏技术趋势

IF 2.5 3区工程技术

IEEE Journal of Photovoltaics Pub Date : 2025-01-20 DOI: 10.1109/JPHOTOV.2025.3526170

Elizabeth C. Palmiotti;Martin Springer;Jarett Zuboy;Timothy J. Silverman;Jennifer L. Braid;Dirk C. Jordan;Salil Rabade;Teresa M. Barnes

{"title":"Growing Panes: Investigating the PV Technology Trends Behind Frequent Early Failures in Modern Glass–Glass Modules","authors":"Elizabeth C. Palmiotti;Martin Springer;Jarett Zuboy;Timothy J. Silverman;Jennifer L. Braid;Dirk C. Jordan;Salil Rabade;Teresa M. Barnes","doi":"10.1109/JPHOTOV.2025.3526170","DOIUrl":"https://doi.org/10.1109/JPHOTOV.2025.3526170","url":null,"abstract":"Photovoltaic (PV) module materials and technologies continue to evolve as module manufacturers and buyers try to minimize costs, maximize performance, and speed deployment. Both silicon and thin film modules are converging toward similar ∼3 <inline-formula><tex-math>$text{m}^{2}$</tex-math></inline-formula> glass–glass designs with thinner glass sheets to increase power output while reducing module weight, and both types are increasingly mounted on single-axis trackers. At the same time, an increasing number of PV sites have been reporting spontaneous glass breakage in early life systems deployed with these “big, floppy modules.” In this article, we identify the concurrent module changes that may be contributing to increased early failure, explain the trends, and discuss their reliability implications. We suggest that larger, thinner glass sheets along with variations in heat treatment and quality may be contributing to glass vulnerability. We note that trends toward weaker or back-mounted frames may also be contributing to module failures, especially for “extra-extra-large” modules mounted on trackers. Combinations of these trends may have pushed modules to a threshold at which increasing early failures are causing the front edge of the “bathtub curve” to re-emerge. Current qualification testing appears to be ineffective for catching these early failures in new module designs, and module buyers do not have enough reliability information—or cannot prioritize such information—during module procurement. Additional research is needed to identify the field conditions leading to glass breakage and if there is one or multiple limiting flaws in new module designs causing glass breakage. Early failures may be mitigated by returning to more robust designs or ensuring better module testing and quality assurance.","PeriodicalId":445,"journal":{"name":"IEEE Journal of Photovoltaics","volume":"15 2","pages":"297-308"},"PeriodicalIF":2.5,"publicationDate":"2025-01-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10847304","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143455101","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Data-Driven Soiling Estimation and Optimized Cleaning Strategies for Industrial Rooftop PV Systems 数据驱动的工业屋顶光伏系统污染评估与优化清洁策略

IF 2.5 3区工程技术

IEEE Journal of Photovoltaics Pub Date : 2025-01-20 DOI: 10.1109/JPHOTOV.2025.3527124

Ankit Pal;Saravana Ilango Ganesan;Maddikara Jaya Bharata Reddy

{"title":"Data-Driven Soiling Estimation and Optimized Cleaning Strategies for Industrial Rooftop PV Systems","authors":"Ankit Pal;Saravana Ilango Ganesan;Maddikara Jaya Bharata Reddy","doi":"10.1109/JPHOTOV.2025.3527124","DOIUrl":"https://doi.org/10.1109/JPHOTOV.2025.3527124","url":null,"abstract":"The accumulation of dust and dirt on solar photovoltaic (PV) panels, known as soiling, reduces energy generation and conversion efficiency of a PV plant. Therefore, regular cleaning is essential to maintain optimal plant performance and economic viability. Fixed-interval cleaning schedules become uneconomical during periods such as low-insolation, rainy, or cloudy events. This study proposes a data-driven method to estimate the soiling ratio (SR) for a 504-kWp rooftop PV plant in India using power, temperature, and irradiance data. A PV panel temperature estimation model is employed, based on ambient temperature and solar irradiance, which simplifies the process by eliminating the need for direct temperature measurements. The analysis reveals that regular cleaning is essential despite rainfall, with energy losses due to soiling ranging from 32% to 47% across inverters, with soiling rates of 4.6–5.5% per day. A dynamic cleaning schedule, considering weather and soiling conditions, was developed to reduce these losses. Economic evaluation demonstrated that manual cleaning following the proposed dynamic schedule is cost effective, with profit margins of 48–77%, comparing energy gain and cleaning cost. Compared with fixed-interval cleaning, the proposed method maintained the same average SR but yielded 25–49% higher profitability across inverters.","PeriodicalId":445,"journal":{"name":"IEEE Journal of Photovoltaics","volume":"15 2","pages":"353-361"},"PeriodicalIF":2.5,"publicationDate":"2025-01-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143455249","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0