IEEE Journal of Photovoltaics最新文献_第10页

Data-Driven Digital Inspection of Photovoltaic Panels Using a Portable Hybrid Model Combining Meteorological Data and Image Processing 使用结合气象数据和图像处理的便携式混合模型，对光伏电池板进行数据驱动的数字化检测

IF 2.5 3区工程技术

IEEE Journal of Photovoltaics Pub Date : 2024-09-02 DOI: 10.1109/JPHOTOV.2024.3437736

Ayoub Oufadel;Alae Azouzoute;Hicham Ghennioui;Chaimae Soubai;Ibrahim Taabane

{"title":"Data-Driven Digital Inspection of Photovoltaic Panels Using a Portable Hybrid Model Combining Meteorological Data and Image Processing","authors":"Ayoub Oufadel;Alae Azouzoute;Hicham Ghennioui;Chaimae Soubai;Ibrahim Taabane","doi":"10.1109/JPHOTOV.2024.3437736","DOIUrl":"10.1109/JPHOTOV.2024.3437736","url":null,"abstract":"This article proposes a novel approach to photovoltaic panel inspection through the integration of image classification and meteorological data analysis. Utilizing two convolutional neural network models with distinct architectures for classifying thermal and red, green, blue (RGB) images of photovoltaic installations, in addition to an support vector machines model for meteorological data classification, the results from these models are concatenated, allowing the fusion of visual and meteorological information for comprehensive defect detection. Data collection from photovoltaic panels is achieved using a portable device, followed by the application of advanced image processing techniques to identify faults rapidly and accurately with up to 96% accuracy. The inspection results are presented in a user-friendly format, facilitating straightforward interpretation and analysis. This new approach has the potential to significantly enhance the efficiency and durability of solar energy systems, enabling timely maintenance and repair for photovoltaic panel issues.","PeriodicalId":445,"journal":{"name":"IEEE Journal of Photovoltaics","volume":"14 6","pages":"937-950"},"PeriodicalIF":2.5,"publicationDate":"2024-09-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142208808","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

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Call for Papers: Special Issue on Intelligent Sensor Systems for the IEEE Journal of Electron Devices 征稿：电气和电子工程师学会电子器件学报》智能传感器系统特刊

IF 2.5 3区工程技术

IEEE Journal of Photovoltaics Pub Date : 2024-08-21 DOI: 10.1109/JPHOTOV.2024.3444009

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Call for Papers: Special Issue on Intelligent Sensor Systems for the IEEE Journal of Electron Devices 征稿：电气和电子工程师学会电子器件学报》智能传感器系统特刊

IF 2.5 3区工程技术

IEEE Journal of Photovoltaics Pub Date : 2024-08-21 DOI: 10.1109/JPHOTOV.2024.3445189

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IEEE Journal of Photovoltaics Publication Information 电气和电子工程师学会光伏学报》出版信息

IF 2.5 3区工程技术

IEEE Journal of Photovoltaics Pub Date : 2024-08-21 DOI: 10.1109/JPHOTOV.2024.3445231

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Blank page 空白页

IF 2.5 3区工程技术

IEEE Journal of Photovoltaics Pub Date : 2024-08-21 DOI: 10.1109/JPHOTOV.2024.3445237

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Editorial On Publishing Numerical Methods and Modeling in the IEEE Journal of Photovoltaics 关于在《IEEE 光伏学报》上发表数值方法和建模的社论

IF 2.5 3区工程技术

IEEE Journal of Photovoltaics Pub Date : 2024-08-21 DOI: 10.1109/JPHOTOV.2024.3435188

Angus Rockett

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IEEE Journal of Photovoltaics Information for Authors IEEE 光伏学报》作者信息

IF 2.5 3区工程技术

IEEE Journal of Photovoltaics Pub Date : 2024-08-21 DOI: 10.1109/JPHOTOV.2024.3445235

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The Role of Oxygen Exposure on the Performance of All-Vapor-Processed Perovskite Solar Cells With CuPC Hole Transport Layers 氧气暴露对带有 CuPC 孔传输层的全气相加工过氧化物太阳能电池性能的影响

IF 2.5 3区工程技术

IEEE Journal of Photovoltaics Pub Date : 2024-08-15 DOI: 10.1109/JPHOTOV.2024.3414125

Austin G. Kuba;Bin Du;Alexander J. Harding;Kevin D. Dobson;Brian E. McCandless;Ujjwal K. Das;William N. Shafarman

{"title":"The Role of Oxygen Exposure on the Performance of All-Vapor-Processed Perovskite Solar Cells With CuPC Hole Transport Layers","authors":"Austin G. Kuba;Bin Du;Alexander J. Harding;Kevin D. Dobson;Brian E. McCandless;Ujjwal K. Das;William N. Shafarman","doi":"10.1109/JPHOTOV.2024.3414125","DOIUrl":"https://doi.org/10.1109/JPHOTOV.2024.3414125","url":null,"abstract":"Methylammonium lead iodide (MAPbI\u00003\u0000) perovskite solar cells were made using an all-vapor process, including two-step close space vapor transport-processed MAPbI\u00003\u0000 absorber and evaporated copper phthalocyanine (CuPC) hole transport layer (HTL). N-i-p solar cells fabricated entirely in a nitrogen glovebox had poor performance due to s-shaped J-V curves and fill factors (FF) \u0000<inline-formula><tex-math>$< $</tex-math></inline-formula>\u000045%. Solar cells exposed to dry air in a desiccator for seven days, or to O\u00002\u0000 flowed into the evaporator during CuPC deposition, had significantly improved performance with reduced or eliminated s-shaped behavior and improved FF up to 72%. Co-planar conductivity measurements show that exposure to dry air, deposition with oxygen, and MoO\u0000x\u0000 capping layers all increase the conductivity of the CuPC HTL. Drift-diffusion simulations show that increasing hole concentration consistent with oxygen doping effects can explain the J-V behavior of the solar cell. Solar cells using spiro-OMeTAD HTLs achieved similar Power Conversion Efficiency but higher V\u0000oc\u0000 up to 1.01 V. Drift-diffusion simulations show that the V\u0000oc\u0000 difference can be explained by differences in doping density and valence band position between spiro and CuPC.","PeriodicalId":445,"journal":{"name":"IEEE Journal of Photovoltaics","volume":"14 5","pages":"758-764"},"PeriodicalIF":2.5,"publicationDate":"2024-08-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142021597","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

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Light Trapping in Silicon Solar Cells Including Secondary Reflection on the Surrounding 硅太阳能电池中的光捕获，包括对周围环境的二次反射

IF 2.5 3区工程技术

IEEE Journal of Photovoltaics Pub Date : 2024-08-09 DOI: 10.1109/JPHOTOV.2024.3434336

Wilkin Wöhler;Johannes Greulich

{"title":"Light Trapping in Silicon Solar Cells Including Secondary Reflection on the Surrounding","authors":"Wilkin Wöhler;Johannes Greulich","doi":"10.1109/JPHOTOV.2024.3434336","DOIUrl":"10.1109/JPHOTOV.2024.3434336","url":null,"abstract":"We extend a commonly used analytical model of light trapping in silicon solar cells, which was introduced by Basore in 1993, by including secondary reflections on the surrounding. The extension enables more accurate measurements of bifacial solar cells by analytically decoupling the properties of the background (chuck) and the sample. The additional reflectance on a white background commonly accounts for an increase in short-circuit current density by \u0000<inline-formula><tex-math>${0.5},{text{mA/cm}^{2}}$</tex-math></inline-formula>\u0000 compared with a nonreflective chuck. Also, the extension improves the accuracy of absorption profiles in optical solar cell models, and can further be employed to acquire additional information of simple reflectance measurements. The chuck extension is tested on reflectance measurements with black and white backgrounds, showing that the fitting procedure is more stable in comparison to a model without the extension, with the deviation of the parasitic absorption coefficient \u0000<inline-formula><tex-math>$A_text{ppp}$</tex-math></inline-formula>\u0000 being reduced from up to \u0000<inline-formula><tex-math>${30}{%}$</tex-math></inline-formula>\u0000 to less than \u0000<inline-formula><tex-math>${5}{%}$</tex-math></inline-formula>\u0000. We also propose different sets of free parameters in the general Basore model framework, and evaluate some variants of this landscape regarding fit accuracy for different sets of measurement data. We find that most models require information on reflectance and transmittance to be well constrained. To meet the requirement, we propose reflectance measurements on black and white backgrounds to circumvent an additional transmittance measurement setup. Model fits to this dataset show good agreement with measured transmittance and absorptance spectra, with maximum deviations of \u0000<inline-formula><tex-math>${4}{%}$</tex-math></inline-formula>\u0000 absolute within our samples.","PeriodicalId":445,"journal":{"name":"IEEE Journal of Photovoltaics","volume":"14 5","pages":"737-744"},"PeriodicalIF":2.5,"publicationDate":"2024-08-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141968634","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

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Irradiance Monitoring for Bifacial PV Systems’ Performance and Capacity Testing 用于双面光伏系统性能和容量测试的辐照度监测

IF 2.5 3区工程技术

IEEE Journal of Photovoltaics Pub Date : 2024-07-30 DOI: 10.1109/JPHOTOV.2024.3430551

Chris Deline;Silvana Ovaitt;Michael Gostein;Jennifer Braid;Jeff Newmiller;Itai Suez

{"title":"Irradiance Monitoring for Bifacial PV Systems’ Performance and Capacity Testing","authors":"Chris Deline;Silvana Ovaitt;Michael Gostein;Jennifer Braid;Jeff Newmiller;Itai Suez","doi":"10.1109/JPHOTOV.2024.3430551","DOIUrl":"10.1109/JPHOTOV.2024.3430551","url":null,"abstract":"Three standards for photovoltaic (PV) performance and capacity testing are evaluated for bifacial PV system reporting: performance ratio, ASTM E2848, and a new draft of IEC 61724-2. In this context, challenges and recommendations for rear irradiance instrumentation are described for three types of bifacial irradiance sensors—horizontal albedometer, backward-facing reference cells (or pyranometer), and bifacial reference module. A year of operating field data for single-axis tracked bifacial and monofacial systems was collected, including periods of high surface albedo due to snow ground cover. If snowy conditions are included, we found that all three methods performed comparably to the monofacial baseline case, but only if rear-measured irradiance is incorporated into the expected energy calculation. The lowest RMS error was obtained by following the draft IEC 61724-2 standard and using a calibrated bifacial reference module for bifacial irradiance resource. If measured rear irradiance is unavailable, field conditions either need to be filtered to avoid variable (snowy) albedo or an albedometer measurement can be used in conjunction with modeled rear irradiance along with the draft IEC procedure. Additional practical factors are described, including the proper placement of rear irradiance sensors and the proper interpretation of IEC 61724-1 bifacial performance ratio calculations.","PeriodicalId":445,"journal":{"name":"IEEE Journal of Photovoltaics","volume":"14 5","pages":"803-814"},"PeriodicalIF":2.5,"publicationDate":"2024-07-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10614655","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141864220","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

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