2007 IEEE International Workshop on Memory Technology, Design and Testing最新文献_第2页

Value creation and technological convergence by evolution of embedded non-volatile memory 嵌入式非易失性存储器的进化带来的价值创造和技术融合

2007 IEEE International Workshop on Memory Technology, Design and Testing Pub Date : 2007-12-03 DOI: 10.1109/MTDT.2007.4547604

H. Hidaka

引用次数: 1

An ALU cluster intellectual property for magnetic RAM media applications platform 一种基于ALU集群知识产权的磁性RAM媒体应用平台

2007 IEEE International Workshop on Memory Technology, Design and Testing Pub Date : 2007-12-03 DOI: 10.1109/MTDT.2007.4547622

C. Liou, H. Chiueh

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引用次数: 0

Scaling trend of the Flash memory for file storage 用于文件存储的Flash缩放趋势

2007 IEEE International Workshop on Memory Technology, Design and Testing Pub Date : 2007-12-03 DOI: 10.1109/MTDT.2007.4547606

R. Shirota

引用次数: 0

System-in-Package design/testing in memory package 系统封装设计/内存封装测试

2007 IEEE International Workshop on Memory Technology, Design and Testing Pub Date : 2007-12-03 DOI: 10.1109/MTDT.2007.4547601

S. Chen

引用次数: 0

Power-gating current test for static RAM in nanotechnologies 纳米技术中静态RAM的功率门控电流测试

2007 IEEE International Workshop on Memory Technology, Design and Testing Pub Date : 2007-12-03 DOI: 10.1109/MTDT.2007.4547614

Yuan-Wei Chao, Hsin-Ling Chen, Chih-Jong Chen, Tsung-Chu Huang

引用次数: 1