系统封装设计/内存封装测试

S. Chen
{"title":"系统封装设计/内存封装测试","authors":"S. Chen","doi":"10.1109/MTDT.2007.4547601","DOIUrl":null,"url":null,"abstract":"Summary form only given. Miniaturization, electric performance and cost have drove the package thinner and thinner. System-in-package (SIP) and system-on-chip (SOC) are two competitive solutions. SIP is becoming the mainstream in assembly, which is able to short the design cycle time and speed up the new product introduction, especially in the mobile phone, hand held product and memory products. Stack dice, PoP (package-on-package) is mature and has been widely and growing up the market share. Embedded dice/substrate, fan-out-WLCSP, and TSV (through silicon via) are coming soon. Many new technology, especially for memory has been developed, they will be discussed during the sections.","PeriodicalId":422226,"journal":{"name":"2007 IEEE International Workshop on Memory Technology, Design and Testing","volume":"80 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-12-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"System-in-Package design/testing in memory package\",\"authors\":\"S. Chen\",\"doi\":\"10.1109/MTDT.2007.4547601\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Summary form only given. Miniaturization, electric performance and cost have drove the package thinner and thinner. System-in-package (SIP) and system-on-chip (SOC) are two competitive solutions. SIP is becoming the mainstream in assembly, which is able to short the design cycle time and speed up the new product introduction, especially in the mobile phone, hand held product and memory products. Stack dice, PoP (package-on-package) is mature and has been widely and growing up the market share. Embedded dice/substrate, fan-out-WLCSP, and TSV (through silicon via) are coming soon. Many new technology, especially for memory has been developed, they will be discussed during the sections.\",\"PeriodicalId\":422226,\"journal\":{\"name\":\"2007 IEEE International Workshop on Memory Technology, Design and Testing\",\"volume\":\"80 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-12-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 IEEE International Workshop on Memory Technology, Design and Testing\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MTDT.2007.4547601\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE International Workshop on Memory Technology, Design and Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MTDT.2007.4547601","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

只提供摘要形式。小型化、电性能和成本使得封装越来越薄。系统级封装(SIP)和片上系统(SOC)是两种相互竞争的解决方案。SIP正在成为组装的主流,它可以缩短设计周期时间,加快新产品的推出,特别是在手机,手持产品和内存产品中。Stack dice, PoP (package-on-package)是成熟的,并已被广泛和不断增长的市场份额。嵌入式芯片/衬底,扇形输出wlcsp和TSV(通过硅通孔)即将推出。许多新技术,特别是内存技术的发展,将在本节中讨论。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
System-in-Package design/testing in memory package
Summary form only given. Miniaturization, electric performance and cost have drove the package thinner and thinner. System-in-package (SIP) and system-on-chip (SOC) are two competitive solutions. SIP is becoming the mainstream in assembly, which is able to short the design cycle time and speed up the new product introduction, especially in the mobile phone, hand held product and memory products. Stack dice, PoP (package-on-package) is mature and has been widely and growing up the market share. Embedded dice/substrate, fan-out-WLCSP, and TSV (through silicon via) are coming soon. Many new technology, especially for memory has been developed, they will be discussed during the sections.
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