{"title":"用于文件存储的Flash缩放趋势","authors":"R. Shirota","doi":"10.1109/MTDT.2007.4547606","DOIUrl":null,"url":null,"abstract":"This paper describes the review of flash memory. First, the fundamental device and design characteristics of flash memory are shown. Next, recent developments of flash memory are reviewed. The flash memory cell structure can be classified into two types; floating gate type and charge trap type. Both current technologies are introduced. Third, road map and scaling issues of flash memory are summarized.","PeriodicalId":422226,"journal":{"name":"2007 IEEE International Workshop on Memory Technology, Design and Testing","volume":"37 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-12-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Scaling trend of the Flash memory for file storage\",\"authors\":\"R. Shirota\",\"doi\":\"10.1109/MTDT.2007.4547606\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes the review of flash memory. First, the fundamental device and design characteristics of flash memory are shown. Next, recent developments of flash memory are reviewed. The flash memory cell structure can be classified into two types; floating gate type and charge trap type. Both current technologies are introduced. Third, road map and scaling issues of flash memory are summarized.\",\"PeriodicalId\":422226,\"journal\":{\"name\":\"2007 IEEE International Workshop on Memory Technology, Design and Testing\",\"volume\":\"37 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-12-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 IEEE International Workshop on Memory Technology, Design and Testing\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MTDT.2007.4547606\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE International Workshop on Memory Technology, Design and Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MTDT.2007.4547606","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Scaling trend of the Flash memory for file storage
This paper describes the review of flash memory. First, the fundamental device and design characteristics of flash memory are shown. Next, recent developments of flash memory are reviewed. The flash memory cell structure can be classified into two types; floating gate type and charge trap type. Both current technologies are introduced. Third, road map and scaling issues of flash memory are summarized.