{"title":"An AC power amplifier for testing instrument transformer test equipment","authors":"E. Mohns, S. Fricke, F. Pauling","doi":"10.1109/CPEM.2016.7540559","DOIUrl":"https://doi.org/10.1109/CPEM.2016.7540559","url":null,"abstract":"This paper describes the design and setup of analogue power amplifiers for generating calibration signals for test equipment for instrument transformers. Two amplifiers have been set up for a rating of 600 VA and 70 VA, respectively. The 600 VA version is used for testing standard burdens, while the other one is used as a source for a calibrator for testing test sets for conventional and non-conventional current or voltage transformers. The amplifiers offer the possibility to switch between a voltage mode and a current mode. The bandwidth of the amplifiers covers the range from 16.7 Hz to at least 3 kHz. Different ranges between 80 V to 280 V in the voltage mode, and 2 A to 10 A in the current mode are realized with a transformer-coupled output stage. The gain accuracy is in the order of 1 %, while the stability is better than 0.01 %. The smaller amplifier will be used to set up future measurement systems in the EMRP project \"Non-conventional voltage and current sensors for future power grids\".","PeriodicalId":415488,"journal":{"name":"2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116737880","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Asynchronous 3-phase power measurements","authors":"R. Timmons, T. Barczyk","doi":"10.1109/CPEM.2016.7540740","DOIUrl":"https://doi.org/10.1109/CPEM.2016.7540740","url":null,"abstract":"A new asynchronous, 3-phase/4-channel Power Analyzer for high precision analysis of AC voltage, AC current and power. Advanced signal processing algorithms provide precise measurements of single period events (i.e. single period of a wave form) for sinusoidal, non-sinusoidal and quasi-stationary signals. The uncertainty for AC current and power measurements of a single period event are <;75 pμ/A and <;200 μW/W. The uncertainty of the phase measurement between two single period events (i.e. voltage-to-voltage, current-to-current, and voltage-to-current) is <;50 μrad. Uncertainties are materially reduced with averaging over multiple periods. This paper describes the architecture and algorithms.","PeriodicalId":415488,"journal":{"name":"2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117046458","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
H. Shao, Feipeng Lin, B. Liang, Huanghui Zhang, Wei Zhao, Jiafu Wang, Chuansheng Li
{"title":"Voltage dependence measurement of a 110 kV LVE-TSVT","authors":"H. Shao, Feipeng Lin, B. Liang, Huanghui Zhang, Wei Zhao, Jiafu Wang, Chuansheng Li","doi":"10.1109/CPEM.2016.7540802","DOIUrl":"https://doi.org/10.1109/CPEM.2016.7540802","url":null,"abstract":"The paper presents the development of a 35 kV fully-insulated two-stage voltage transformer(TSVT), and its applications by connecting in series with another 35 kV semi-insulated TSVT to determine the voltage dependence(VD) of a 110 kV TSVT. The result showed the VD of the 110 kV TSVT is around -1.6×10-6 and +1.6 μrad in magnitude and phase, respectively.","PeriodicalId":415488,"journal":{"name":"2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114626054","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Measurement and estimation of arbitrary signal power using a window technique","authors":"R. Lapuh, B. Voljc, M. Lindic","doi":"10.1109/CPEM.2016.7540739","DOIUrl":"https://doi.org/10.1109/CPEM.2016.7540739","url":null,"abstract":"This paper describes an accurate method to estimate active power of repetitive non-coherently sampled arbitrary signal. For that purpose the window technique was used on not pure sine wave signals where coherent sampling was not possible but the spectral components in the signal were well separated, at least for a few FFT bins. The actual performance of the method can be tuned by the selection of the appropriate time window (Hanning, Blackmann-Harris (BH92), ...).","PeriodicalId":415488,"journal":{"name":"2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)","volume":"84 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116153958","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Establishment of attenuation standards in the frequency range of 110 GHz to 170 GHz using a millimeter wave VNA system","authors":"A. Widarta","doi":"10.1109/CPEM.2016.7540469","DOIUrl":"https://doi.org/10.1109/CPEM.2016.7540469","url":null,"abstract":"Establishment of an attenuation reference primary standard in the frequency range of 110 GHz to 170 GHz conducted at NMIJ is described. A millimeter wave VNA system, which consists of an intermediate frequency VNA and a set of millimeter wave S-parameter test extenders, is used as a measurement system. The traceability is ensured by the calibration to the intermediate frequency VNA using the calibrated step attenuator at 10.3 MHz. The mismatch uncertainties are evaluated and minimized by measuring the DUT in four different phase networks. The dynamic range of the system is expected to be more than 50 dB.","PeriodicalId":415488,"journal":{"name":"2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116515319","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Primary standard and calibration of scattering parameter up to 12 GHz for Type N, 75 ohms connector","authors":"M. Horibe, R. Kishikawa","doi":"10.1109/CPEM.2016.7540752","DOIUrl":"https://doi.org/10.1109/CPEM.2016.7540752","url":null,"abstract":"This paper summaries the achievement of primary scattering parameter (S-parameter) measurement standard based on the precision coaxial air lines with Type-N, 75 ohms connectors. The primary standard can calibrate a device under test up to 12 GHz. The mechanical measurements of the line's diameters and length made accurately using NMIJ's standard system. Furthermore, the small insertion loss also measured in the microwave frequency regions. The established primary standard is the first achievement to undertake the traceability of S-parameter measurement over 3 GHz (to 12 GHz) in the author's knowledge.","PeriodicalId":415488,"journal":{"name":"2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121656594","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Huang Lu, L. Zu-liang, Yang Yan, Wang Wei, He Qing
{"title":"The optimal hollow active auxiliary electrode and its additional functions research","authors":"Huang Lu, L. Zu-liang, Yang Yan, Wang Wei, He Qing","doi":"10.1109/CPEM.2016.7540711","DOIUrl":"https://doi.org/10.1109/CPEM.2016.7540711","url":null,"abstract":"The optimal hollow active auxiliary electrode is developed and its further investigations including the determination of the best compensating voltage ratio, robustness, eccentricity and so on are reported. Furthermore, its additional functions, such as measuring the eccentricity of movable guard electrode and monitoring the possible position changes of four main bars after long-term operation, are proposed and verified.","PeriodicalId":415488,"journal":{"name":"2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)","volume":"127 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121673656","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Development of a NIST WR10 radiometer","authors":"J. Surek, Chunyue Cheng, D. Gu, D. Walker","doi":"10.1109/CPEM.2016.7540756","DOIUrl":"https://doi.org/10.1109/CPEM.2016.7540756","url":null,"abstract":"This paper describes the development of a waveguide radiometer to measure noise from millimeter wave electronic components from 75 GHz to 110 GHz. The radiometer will estimate the noise temperature of a device under test (DUT) based on comparison with room temperature and 77K noise standards. This is a standard physical approach in other NIST microwave radiometers. The radiometer is particularly amenable to performing noise temperature as well as noise parameter measurements for amplifier and transistor characterization. As wireless communications progresses towards millimeter wave systems, noise characterization of related components and subsystems becomes essential. We report our progress in radiometer design, construction and verification for millimeter wave noise metrology at NIST.","PeriodicalId":415488,"journal":{"name":"2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114729243","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
W. Fan, Jian He, Zhigao Zhang, A. Lin, R. Hou, W. Gong, Zhiyi Xu
{"title":"Error estimation of magnetic flux measurement of the permanent magnet materials in an open magnetic circuit","authors":"W. Fan, Jian He, Zhigao Zhang, A. Lin, R. Hou, W. Gong, Zhiyi Xu","doi":"10.1109/CPEM.2016.7540522","DOIUrl":"https://doi.org/10.1109/CPEM.2016.7540522","url":null,"abstract":"This paper presents results of experiments in an open magnetic circuit by designing a magnetic flux measurement setup which consists of self-adhesive coils without frames: the leakage magnetic flux which exists between the coil and the permanent magnet is the main source of errors. It's shown that the coil should have the greater width, the thinner thickness, smaller diameter and the coils should be close to the permanent magnet to minimize the errors. Meanwhile, it's shown that the velocity of sample passing through the coil doesn't affect the results.","PeriodicalId":415488,"journal":{"name":"2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)","volume":"122 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124501644","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Material measurements using the vector network analyzer","authors":"L. Brunetti, L. Oberto, M. Sellone, N. Shoaib","doi":"10.1109/CPEM.2016.7540565","DOIUrl":"https://doi.org/10.1109/CPEM.2016.7540565","url":null,"abstract":"This paper compares non-magnetic material measurements with Vector Network Analyzer against simulated data at radio and microwave frequencies. The dielectric constant of material is obtained from scattering parameters. Uncertainty assessment is made both for measured and simulated values by applying Gaussian propagation of error contributions due to the VNA test setup and to the dimensional measurements both of the material sample and of the waveguide sample holder.","PeriodicalId":415488,"journal":{"name":"2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126201769","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}