{"title":"Effects of intermetallic compounds on properties of Sn-Cu lead-free soldered joints","authors":"M.N. Islam, Y. Chan, M. O. Alam","doi":"10.1109/AGEC.2005.1452342","DOIUrl":"https://doi.org/10.1109/AGEC.2005.1452342","url":null,"abstract":"The environmentally conscious manufacturer is moving toward 'green products' for electronic devices and components. In this paper we investigate the interfacial reactions of Sn0.7Cu solder on electrolytic Ni layer for extended times reflow. It is found that during as-reflowed, the formation of Cu-rich Sn-Cu-Ni ternary intermetallic compounds (TIMC) at the interface of Sn0.7Cu solder with electrolytic Ni is much quicker, resulting in the entrapment of some Pb (which is present (about 0.02wt%) as impurity in the Sn-Cu solder) rich phase in the TIMC. During extended time of reflow, high (>30at %), medium (30-15at %) and low (<15at %) Cu TIMC are formed at the interface. Cu-rich TIMC have higher growth rate and consume more Ni layer. Less than 3 micron of the electrolytic Ni layer was consumed during molten reaction by the higher Sn-containing Sn0.7Cu solder in 180 minutes at 250/spl deg/C. The shear strength of Sn0.7Cu solder joint is stable from 1.982-1.861 kgf during extended time reflow. Cu prevents the resettlement of Au at the interface. The shear strength does not depend on the thickness of intermetallic compounds (IMC) and reflow time. Ni/Sn-Cu solder system has higher strength and can be used during prolonged reflow.","PeriodicalId":405792,"journal":{"name":"Proceedings of 2005 International Conference on Asian Green Electronics, 2005. AGEC.","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-03-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126326152","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Transition to lead free soldering - a great change for a better understanding of materials and processes and green electronics","authors":"J. Mueller, H. Griese, K. Schischke, L. Stobbe","doi":"10.1109/AGEC.2005.1452312","DOIUrl":"https://doi.org/10.1109/AGEC.2005.1452312","url":null,"abstract":"The lead ban in electronics - enforced by environmental concerns and legal reality by 2006 through RoHS directive has initiated a broad rethinking towards eco/sup 2/-efficiency (economical and ecological) of interconnection technology its materials and processes. The implementation of lead free soldering however is not a drop-in process. In order to secure the production of high quality and reliable lead free products with low environmental burdens by 2006 there are still various technological issues to be solved. This paper gives an overview of environmental (e.g. toxicity and energy demand) and technological issues (e.g. higher thermal stress, whisker formation) deriving from the implementation of lead free soldering processes. It is shown which technological innovations have been initiated through a better understanding of interconnection materials and processes. Substitution of lead in the interconnection system is just the first step to green electronics. The next step is the wise selection of an alternative system and technology based on a profound understanding of the ecological and economical facts.","PeriodicalId":405792,"journal":{"name":"Proceedings of 2005 International Conference on Asian Green Electronics, 2005. AGEC.","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-03-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114827415","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A study of mechanical and rheological behavior of recycled spray painted parts","authors":"R. Petitt, J.W. Boldt, M. Poh","doi":"10.1109/AGEC.2005.1452329","DOIUrl":"https://doi.org/10.1109/AGEC.2005.1452329","url":null,"abstract":"Environmentally sustainable development is not an option, but an imperative. Product discard is a growing pollution problem, as more electronics join the waste stream. As the world's raw materials dwindle from consumer demand, there is an urgency to work towards waste minimization. Plastic materials stand out as the single largest material component for which recycling solutions have not been developed. One of the greatest challenges for increasing the use of recycled plastics in new products is dealing with painted plastic parts. Paint is used as a decorative finish to enhance the appearance and aesthetics of many products. Painted enclosure parts represent a significant portion of the content of a product. Currently, most painted plastic parts are considered to be non-recyclable, due to the degradation of physical properties or cosmetic contamination when the parts are reground without removing the paint. Typically, these parts are either incinerated for energy recovery, sent as a mixed fraction to smelters for metals recovery or landfilled. The paper explores the possibility of improving painted reground plastic performance through the use of compatible paint coatings that are miscible with the base resin when reground, resulting in minimal physical property degradation and enhancing the value of this feedstream for reuse in new products.","PeriodicalId":405792,"journal":{"name":"Proceedings of 2005 International Conference on Asian Green Electronics, 2005. AGEC.","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-03-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125898643","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Micro-BGA package reliability and optimization of reflow soldering profile","authors":"Jing Gao, Yiping Wu, H. Ding","doi":"10.1109/AGEC.2005.1452333","DOIUrl":"https://doi.org/10.1109/AGEC.2005.1452333","url":null,"abstract":"Micro-BGA package reliability is greatly dependent on the reflow soldering process. Many defects in BGA packaging arise from an inappropriate reflow profile. Researchers have been bringing forward various optimal strategies on reflow soldering to improve this packaging reliability. However, most of them are qualitative, and hence cannot provide a satisfactory answer. Recently, a novel proposal - the heating factor, Q/sub n/ - offers us a quantitative solution to design the reflow profile. In practice, to evaluate the soldering performance of a BGA product, often six critical points on a PCB are monitored, accordingly this will give six reflow profiles, and in each of them, there is a certain value of heating factor. So how to quickly adjust the reflow oven to fulfill all these heating factors in an optimal range at the same time is a puzzle. In this work, we try to give an effective algorithm to set these reflow profiles as fast as possible.","PeriodicalId":405792,"journal":{"name":"Proceedings of 2005 International Conference on Asian Green Electronics, 2005. AGEC.","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-03-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129432677","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Zhouyi Chen, Yin Yuehong, Guo Xinming, L. Zhongqin, Ding Han
{"title":"Mechanical design and optimization of flip chip bonder","authors":"Zhouyi Chen, Yin Yuehong, Guo Xinming, L. Zhongqin, Ding Han","doi":"10.1109/AGEC.2005.1452325","DOIUrl":"https://doi.org/10.1109/AGEC.2005.1452325","url":null,"abstract":"A general process based on computer aided static analysis for flip chip bonder mechanical design and optimization is presented. The design of a gantry-form FC bonder structure is introduced in detail. The results of the deformation simulation and static analysis proved that the mechanical structure of FC bonder. fulfilled the pre-determined requirements.","PeriodicalId":405792,"journal":{"name":"Proceedings of 2005 International Conference on Asian Green Electronics, 2005. AGEC.","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-03-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130007836","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Interfacial characteristics of Sn3.5Ag solder on copper after Nd:YAG laser surface irradiation","authors":"Lei Wang, Chunqing Wang, Zhenqing Zhao, Yi Huang","doi":"10.1109/AGEC.2005.1452345","DOIUrl":"https://doi.org/10.1109/AGEC.2005.1452345","url":null,"abstract":"Nd:YAG laser surface irradiation of copperplate was found to affect the interfacial characteristics and wettability of SnAg eutectic solder on copperplate. Scanning electron microscopy (SEM) was used to analyze the interfacial reaction between SnAg eutectic solder and copperplate before and after laser irradiation. The microstructure changes in the surface layer of copperplate were determined using X-ray diffraction techniques; results showed that the distribution of crystal face in the surface of copperplate was changed after laser irradiation, which affected the surface energy of copperplate. The increase of surface energy reinforced the interfacial reaction and promoted the growth of intermetallics, which, however, was proved to have little impact on the morphology of intermetallics by aging.","PeriodicalId":405792,"journal":{"name":"Proceedings of 2005 International Conference on Asian Green Electronics, 2005. AGEC.","volume":"56 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-03-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115292503","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Minimize system failure rate considering variations of electronic components lifetime data [PCB design for reliability]","authors":"T. Jin, Z. Xiong, Peng Wang","doi":"10.1109/AGEC.2005.1452332","DOIUrl":"https://doi.org/10.1109/AGEC.2005.1452332","url":null,"abstract":"Thermal and electrical stresses are important factors in affecting the lifetime of microelectronic devices. For a PCB consisting of thousands of microelectronic devices, stresses are usually neither constant nor evenly distributed. Stresses often vary in different subcircuits due to the difference of power consumption and electrical derating. The variations of the stresses create uncertainties in estimating reliability metrics such as the system failure rate and MTBF. This paper proposes an optimal design procedure to minimize the system failure rate by reducing the variations of device stresses. The system failure rate is treated as a stochastic number. The distribution of the failure rate is approximated by the normal distribution, based on the central limit theorem. The objective is to select the best devices from multiple component choices such that the system failure rate is minimized while the cost budget and the six-sigma criteria are still satisfied. This is a non-linear integer-programming problem and a genetic algorithm is used to search for the optimal solution. Finally, an PCB is used to illustrate the optimization procedure.","PeriodicalId":405792,"journal":{"name":"Proceedings of 2005 International Conference on Asian Green Electronics, 2005. AGEC.","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-03-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129141910","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"LCA case study for copier using the matrix-based LCA software and JLCA database","authors":"W. Lu, S. Sakai, S. Izumi","doi":"10.1109/AGEC.2005.1452330","DOIUrl":"https://doi.org/10.1109/AGEC.2005.1452330","url":null,"abstract":"Life cycle assessment (LCA) has been accepted widely as an effective tool for the evaluation of environmental loads accompanying products or services, but the method of practical application needs to be further improved. EMLCA, which is a matrix-based LCA software, is developed on the Excel spreadsheet. This LCA software has many functions such as environmental load calculation, environmental impact assessment, sensitivity analysis and uncertainty analysis. On the other hand, problems in data acquisition appear in almost every LCA case study. In order to support the LCA practice in Japan, an LCA database has been developed by JLCA. A simple introduction to EMLCA and the JLCA database is presented and they are used to carry out an LCA case study of a copier. The environmental loads corresponding to one copier in its life cycle are calculated, and the environmental impact caused by the loads is assessed. Sensitivity analysis and uncertainty analysis are also carried out, and methods of improving the environmental aspects are discussed.","PeriodicalId":405792,"journal":{"name":"Proceedings of 2005 International Conference on Asian Green Electronics, 2005. AGEC.","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-03-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115384513","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Study of cooling rate on lead-free soldering microstructure of Sn-3.0Ag-0.5Cu solder","authors":"Q. Hu, Z. Lee, Zhilong Zhao, Da-le Lee","doi":"10.1109/AGEC.2005.1452335","DOIUrl":"https://doi.org/10.1109/AGEC.2005.1452335","url":null,"abstract":"Compared to traditional Sn-Pb solder, the microstructure of lead free solder Sn-3.0Ag-0.5Cu is more complex. The cooling rate significantly affects the secondary dendrite arm size and the IMC morphology, which influence the solder joint mechanical behavior. In this paper, the solder joint microstructure and morphology of three different cooling rates: air cooling, forced air cooling and water cooling were studied. The morphology of the Ag/sub 3/Sn was relatively spherical under water cooling, and had a needle-like morphology under air cooling. The IMC of the joint was a relatively planar Cu/sub 6/Sn/sub 5/ layer under water cooling while a nodular Cu/sub 6/Sn/sub 5/ layer was formed under air cooling.","PeriodicalId":405792,"journal":{"name":"Proceedings of 2005 International Conference on Asian Green Electronics, 2005. AGEC.","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-03-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127248376","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Mechanical properties of a lead-free solder alloys","authors":"F. Zhu, Zhiyong Wang, R. Guan, Honghai Zhang","doi":"10.1109/AGEC.2005.1452326","DOIUrl":"https://doi.org/10.1109/AGEC.2005.1452326","url":null,"abstract":"Lately, environmental problems have gained more and more attention from many countries; because of environmental pollution from lead-based solders and compounds, many countries are about to prohibit the using of lead-based solders in microelectronic packaging; lead-free solder alloys will replace tin-lead (Sn-Pb) eutectic solders. However, the mechanical properties of lead-free solders have not been clarified The tensile property of Sn96.5Ag3Cu0.5 was investigated. The tensile strength of this lead-free solder was obtained at 25/spl deg/C, 50/spl deg/C, 75/spl deg/C, 100/spl deg/C, 125/spl deg/C and 150/spl deg/C; the tensile strength of the lead-free solder decreases with increasing test temperature at a constant strain rate. The tensile strengths of a lead-free and a lead-based solder were compared, and the tensile strength of Sn96.5Ag3Cu0.5 was found to be close to that of Sn63Pb37; this lead-free solder has some good mechanical properties, and will be a promising candidate solder alloy in microelectronic packaging.","PeriodicalId":405792,"journal":{"name":"Proceedings of 2005 International Conference on Asian Green Electronics, 2005. AGEC.","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-03-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122257927","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}