2015 IEEE 13th International New Circuits and Systems Conference (NEWCAS)最新文献_第9页

Design and implementation of a closed-loop controller for a self-adaptive IEEE 802.15.4 DBB 自适应IEEE 802.15.4 DBB闭环控制器的设计与实现

2015 IEEE 13th International New Circuits and Systems Conference (NEWCAS) Pub Date : 2015-06-07 DOI: 10.1109/NEWCAS.2015.7181989

V. Lenoir, W. Lombardi, D. Lattard, A. Jerraya

引用次数: 0

Considerations for high-speed configurable-bandwidth time-interleaved digital delta-sigma modulators and synthesis in 28 nm UTBB FDSOI 高速可配置带宽时交错数字δ - σ调制器和28nm UTBB FDSOI合成的考虑

2015 IEEE 13th International New Circuits and Systems Conference (NEWCAS) Pub Date : 2015-06-07 DOI: 10.1109/NEWCAS.2015.7182049

Răzvan-Cristian Marin, A. Frappé, A. Kaiser, A. Cathelin

引用次数: 10

A high PSRR, ultra-low power 1.2V curvature corrected Bandgap reference for wearable EEG application 高PSRR，超低功耗1.2V曲率校正带隙参考可穿戴EEG应用

2015 IEEE 13th International New Circuits and Systems Conference (NEWCAS) Pub Date : 2015-06-07 DOI: 10.1109/NEWCAS.2015.7182036

M. U. Abbasi, George Raikos, Ruchir Saraswat, E. Rodríguez-Villegas

{"title":"A high PSRR, ultra-low power 1.2V curvature corrected Bandgap reference for wearable EEG application","authors":"M. U. Abbasi, George Raikos, Ruchir Saraswat, E. Rodríguez-Villegas","doi":"10.1109/NEWCAS.2015.7182036","DOIUrl":"https://doi.org/10.1109/NEWCAS.2015.7182036","url":null,"abstract":"A high PSRR, ultra-low power 1.2V voltage supply (VDD) curvature corrected Bandgap reference for Wearable EEG application is described in this paper. The proposed bandgap reference can operate with supply as low as 1V, and provides a supply regulation of 0.113%/V with VDD range of 1.01-2.62V. Piecewise curvature compensation is employed to reduce the temperature coefficient (TC) of bandgap reference from 22.84ppm /°C to 2.295ppm/°C, with a temperature range -10~110°C. The bandgap reference circuit was designed in standard 0.18um CMOS technology where a proportional to absolute temperature (PTAT) and a complementary to absolute temperature (CTAT) current generation circuit were used to generate first order bandgap reference. A non-linear current was generated using PTAT current and CTAT voltage generation circuit and a power supply rejection ratio (PSRR) of 84.62dB (at DC) was achieved to reduce the interference from power supply noise, in order to meet the specifications for wearable wireless EEG sensing systems. The total current consumption of the whole bandgap reference including biasing and startup circuit is only 4.691uA which fits the requirement of battery powered wearable wireless sensing applications.","PeriodicalId":404655,"journal":{"name":"2015 IEEE 13th International New Circuits and Systems Conference (NEWCAS)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131556089","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 7

Additive companding implementation to reduce ADC constraints for multiple signals digitization 加性压缩实现减少多信号数字化的ADC约束

2015 IEEE 13th International New Circuits and Systems Conference (NEWCAS) Pub Date : 2015-06-07 DOI: 10.1109/NEWCAS.2015.7182017

Mathieu Vallerian, F. Hutu, B. Miscopein, G. Villemaud, T. Risset

引用次数: 3

A 30MHz 28dBm-IIP3 3.2mW fully-differential Sallen-Key 4th-order filter with out-of-band zeros cancellation 30MHz 28dBm-IIP3 3.2mW带外零抵消全差分萨伦键四阶滤波器

2015 IEEE 13th International New Circuits and Systems Conference (NEWCAS) Pub Date : 2015-06-07 DOI: 10.1109/NEWCAS.2015.7182066

F. Resta, M. Matteis, A. Pezzotta, S. D’Amico, A. Baschirotto

引用次数: 3

Synchronous Electric Charge Extraction for multiple piezoelectric energy harvesters 多压电能量采集器的同步电荷提取

2015 IEEE 13th International New Circuits and Systems Conference (NEWCAS) Pub Date : 2015-06-07 DOI: 10.1109/NEWCAS.2015.7182103

S. Boisseau, P. Gasnier, Matthias Perez, C. Bouvard, M. Geisler, A. Duret, G. Despesse, J. Willemin

引用次数: 12

Approximate computing with unreliable dynamic memories 不可靠动态存储器的近似计算

2015 IEEE 13th International New Circuits and Systems Conference (NEWCAS) Pub Date : 2015-06-07 DOI: 10.1109/NEWCAS.2015.7182027

Shrikanth Ganapathy, A. Teman, R. Giterman, A. Burg, G. Karakonstantis

{"title":"Approximate computing with unreliable dynamic memories","authors":"Shrikanth Ganapathy, A. Teman, R. Giterman, A. Burg, G. Karakonstantis","doi":"10.1109/NEWCAS.2015.7182027","DOIUrl":"https://doi.org/10.1109/NEWCAS.2015.7182027","url":null,"abstract":"Embedded memories account for a large fraction of the overall silicon area and power consumption in modern SoC(s). While embedded memories are typically realized with SRAM, alternative solutions, such as embedded dynamic memories (eDRAM), can provide higher density and/or reduced power consumption. One major challenge that impedes the widespread adoption of eDRAM is that they require frequent refreshes potentially reducing the availability of the memory in periods of high activity and also consuming significant amount of power due to such frequent refreshes. Reducing the refresh rate while on one hand can reduce the power overhead, if not performed in a timely manner, can cause some cells to lose their content potentially resulting in memory errors. In this paper, we consider extending the refresh period of gain-cell based dynamic memories beyond the worst-case point of failure, assuming that the resulting errors can be tolerated when the use-cases are in the domain of inherently error-resilient applications. For example, we observe that for various data mining applications, a large number of memory failures can be accepted with tolerable imprecision in output quality. In particular, our results indicate that by allowing as many as 177 errors in a 16 kB memory, the maximum loss in output quality is 11%. We use this failure limit to study the impact of relaxing reliability constraints on memory availability and retention power for different technologies.","PeriodicalId":404655,"journal":{"name":"2015 IEEE 13th International New Circuits and Systems Conference (NEWCAS)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123213916","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 23

Semi-digital FIR DAC for low power single carrier IEEE 802.11ad 60GHz transmitter 半数字FIR DAC用于低功耗单载波IEEE 802.11ad 60GHz发射机

2015 IEEE 13th International New Circuits and Systems Conference (NEWCAS) Pub Date : 2015-06-07 DOI: 10.1109/NEWCAS.2015.7182016

F. Gebreyohannes, A. Frappé, A. Kaiser

引用次数: 6

A novel optical integrate and dump receiver for clocking signals 一种用于时钟信号的新型光集成转储接收机

2015 IEEE 13th International New Circuits and Systems Conference (NEWCAS) Pub Date : 2015-06-07 DOI: 10.1109/NEWCAS.2015.7182078

R. Polster, J. L. Jiménez, E. Cassan

引用次数: 2

Analysis and design of Ka-band SoC radiometer for space detection of solar flares 用于太阳耀斑空间探测的ka波段SoC辐射计的分析与设计

2015 IEEE 13th International New Circuits and Systems Conference (NEWCAS) Pub Date : 2015-06-07 DOI: 10.1109/NEWCAS.2015.7182070

L. Aluigi, D. Zito

引用次数: 5