International Conference on Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006.最新文献

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Design and implementation of an 11-bit non-linear interpolation DAC 一个11位非线性插值DAC的设计与实现
S. Eisa, K. Shehata, H. Ragai
{"title":"Design and implementation of an 11-bit non-linear interpolation DAC","authors":"S. Eisa, K. Shehata, H. Ragai","doi":"10.1080/00207210701827855","DOIUrl":"https://doi.org/10.1080/00207210701827855","url":null,"abstract":"In this paper a novel design of an 11 bit digital-to-analog converter (DAC) is introduced. The design is to be integrated in a direct digital frequency synthesizer (DDKS). The designing of a DAC is critical due to its poor performance and low speed. The proposed design consists of three modules, a linear DAC, a nonlinear DAC and a nonlinear interpolation DAC. Each module contributes in enhancing the DAC performance. The DAC is integrated and simulated using Mentor Graphic tools. The simulation was done using a 3.3V, 0.35mu CMOS technology","PeriodicalId":399250,"journal":{"name":"International Conference on Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006.","volume":"&NA; 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125994280","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
An FPGA hardware implementation of the Rijndael block cipher Rijndael分组密码的FPGA硬件实现
C. Dhoha, S. Ben Othman, S. Ben Saoud
{"title":"An FPGA hardware implementation of the Rijndael block cipher","authors":"C. Dhoha, S. Ben Othman, S. Ben Saoud","doi":"10.1109/DTIS.2006.1708717","DOIUrl":"https://doi.org/10.1109/DTIS.2006.1708717","url":null,"abstract":"In this paper, we present a hardware implementation of an Advanced Encryption Standard (AES) Rijndael (128-bit block and 128-bit key) using Xilinx development tools and Spartan FPGA circuits. All the modules in this core are described by using VHDL language. The developed Rijndael core is aimed at providing sufficient performance with good area efficiency. In fact, the encryption/decryption data path operates at 29,45MHz resulting in a throughput of 289,98 Mbits per second for the encryption and 157,1 Mbits per second for decryption. Encryption/decryption circuit will fit in one Xilinx Spartan XC2S600E circuit taking approximately 87% of the area (6068 Slices)","PeriodicalId":399250,"journal":{"name":"International Conference on Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006.","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129698911","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Trends in tests and failure mechanisms in deep sub-micron technologies 深亚微米技术的试验趋势和失效机制
S. Hamdioui, Z. Al-Ars, L. Mhamdi, G. Gaydadjiev, S. Vassiliadis
{"title":"Trends in tests and failure mechanisms in deep sub-micron technologies","authors":"S. Hamdioui, Z. Al-Ars, L. Mhamdi, G. Gaydadjiev, S. Vassiliadis","doi":"10.1109/DTIS.2006.1708677","DOIUrl":"https://doi.org/10.1109/DTIS.2006.1708677","url":null,"abstract":"The increasing integration density of semiconductor devices and the usage of new materials and innovative manufacturing techniques result in introducing new and gradually changing the types of failure mechanisms and defects that take place in manufactured silicon. This is particularly true for current deep submicron manufacturing technologies. As we approach the nanoscale domain, new types of fault models and test methods are needed to cope with the increasing complexity of the observed faulty behavior. This paper discusses the latest trends in testing and failure mechanisms in all stages of IC production","PeriodicalId":399250,"journal":{"name":"International Conference on Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006.","volume":"78 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127168483","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Simultaneous delay optimization and depth reduction in logic trees with minimum resources 用最小资源同时优化逻辑树的延迟和深度缩减
P. Balasubramanian, P. Prathibh
{"title":"Simultaneous delay optimization and depth reduction in logic trees with minimum resources","authors":"P. Balasubramanian, P. Prathibh","doi":"10.1109/DTIS.2006.1708714","DOIUrl":"https://doi.org/10.1109/DTIS.2006.1708714","url":null,"abstract":"In this paper, we propose a logic synthesis technique that achieves delay optimization along with simultaneous depth reduction, apart from minimizing resources for a logic tree structure. Although it is a technology-independent scheme, it is guaranteed to enable better results overall, even after the technology-mapping phase, as evident from the results obtained due to the inherent nature of the heuristic. The practical results derived by targeting a SPARTAN III FPGA logic family (XC3S50-4PQ144) show that there is an explicit delay optimization by about 9.11%, reduction in logic depth by 26.63% and decrease in resource utilization by around 38.59%, on an average, in comparison with existing methods in literature","PeriodicalId":399250,"journal":{"name":"International Conference on Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006.","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131056541","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A new synchronization policy between PSL checkers and SystemC designs at transaction level 事务级PSL检查器和SystemC设计之间的新同步策略
Younes Lahbib, M. Ghrab, Maher Hechkel, F. Ghenassia, R. Tourki
{"title":"A new synchronization policy between PSL checkers and SystemC designs at transaction level","authors":"Younes Lahbib, M. Ghrab, Maher Hechkel, F. Ghenassia, R. Tourki","doi":"10.1109/DTIS.2006.1708698","DOIUrl":"https://doi.org/10.1109/DTIS.2006.1708698","url":null,"abstract":"The authors present a technique to synchronize between PSL (property specification language) checkers and SystemC IPs at the highest abstraction level of the ST Microelectronics system flow: transaction level modeling (TLM). A new assertion-based verification approach is proposed. It consists of a runtime simulation of the system-on-chip (SoC) under verification with PSL checkers. In this approach, the PSL checkers that represent the system specification are converted into C++ and therefore into a SystemC-TLM modules, which refer to us as TLM checkers. However, when integrating TLM checkers with SystemC models of SoC, the traditional clock-based synchronization at register transfer level and lower could not be applied. In fact, at the TLM abstraction level, the modeling rules forbid the use of a hardware clock. A new synchronization policy should be then proposed, hence the aim of this paper","PeriodicalId":399250,"journal":{"name":"International Conference on Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006.","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121698941","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Method for embedded application prototyping based on SoC platform and architecture model 基于SoC平台和体系结构模型的嵌入式应用原型设计方法
Y. Aoudnil, G. Gogniat, K. Louki, J. Philippe, M. Abid
{"title":"Method for embedded application prototyping based on SoC platform and architecture model","authors":"Y. Aoudnil, G. Gogniat, K. Louki, J. Philippe, M. Abid","doi":"10.1109/DTIS.2006.1708689","DOIUrl":"https://doi.org/10.1109/DTIS.2006.1708689","url":null,"abstract":"Real time embedded system design needs collaboration between architectures model, platforms and application specification in order to prototype a real time system from high level specification. In many case, one solution of prototype is not so good to answer the environment changes around embedded system. For this reason, when we want to run an application on embedded system, we need to have several prototypes with different performance levels in order to address the environment evolution. This paper gives an approach for rapid embedded system prototyping using a general architectural mode named PACM and existing prototyping platforms. Several prototypes are proposed to get a first space solution, thus the exploration process is accelerated and an efficient solution can be selected","PeriodicalId":399250,"journal":{"name":"International Conference on Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006.","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131398597","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Magnetic domain wall logic requires new synthesis methodologies 磁畴壁逻辑需要新的综合方法
Jacques-Olivier Klein, E. Belhaire, C. Chappert, R. Cowburn, D. Read, D. Petit
{"title":"Magnetic domain wall logic requires new synthesis methodologies","authors":"Jacques-Olivier Klein, E. Belhaire, C. Chappert, R. Cowburn, D. Read, D. Petit","doi":"10.1109/DTIS.2006.1708707","DOIUrl":"https://doi.org/10.1109/DTIS.2006.1708707","url":null,"abstract":"The demonstration of NOT and OR logic gates using magnetic domain walls could suggest that digital circuit design methodology may apply directly to this new technology to build complex circuits. In this paper, the authors show that the use of an external rotating field which propagates domain walls of opposite magnetization at different times, reveals unforeseen delays which modify the operation of sequential logic circuits. To overcome this difficulty, the authors present a new device capable of re-synchronizing the signals","PeriodicalId":399250,"journal":{"name":"International Conference on Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006.","volume":"30 3","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114045812","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Analysis of multilayer microstrip filter by wave concept iterative process 用波概念迭代法分析多层微带滤波器
E. Hajlaoui, M. Glaoui, H. Trabelsi
{"title":"Analysis of multilayer microstrip filter by wave concept iterative process","authors":"E. Hajlaoui, M. Glaoui, H. Trabelsi","doi":"10.1109/DTIS.2006.1708705","DOIUrl":"https://doi.org/10.1109/DTIS.2006.1708705","url":null,"abstract":"An iterative method based on the concept of waves is presented to determine features of very high frequency's electronic circuits in a planar wave guide. The analysis takes into account eventual coupling parasites. A two dimensional fast Fourier transformation algorithm is introduced to simplify-calculations and accelerate method convergence. The general formulation and the procedure of the iterative method implementation in frequency domain are described. In this article, the authors intend to study a double-layer dielectric substrate. This filter demonstrates the use of the third (vertical) dimension in the design of microstrip devices. The approach involves the mixed magnetic and electric filed equation technique and the wave concept iterative process which involves S-parameters extraction technique based on a simple form of matched toad simulation. In this sense, a program in FORTRAX has been elaborated to determine different parameters Sij characterizing the studied structure. The numerical results are compared to results for microstrip structure and compared to those presented in other references. They show good agreement. The approach is demonstrated in detail for 2-port structures, with an outline of how it can readily be extended to the n-port case","PeriodicalId":399250,"journal":{"name":"International Conference on Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006.","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124897792","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Design of enhanced performances CMOS RF mixers suitable for multi-standards receiver 适用于多标准接收机的增强型CMOS射频混频器设计
S. Douss, M. Loulou
{"title":"Design of enhanced performances CMOS RF mixers suitable for multi-standards receiver","authors":"S. Douss, M. Loulou","doi":"10.1109/DTIS.2006.1708676","DOIUrl":"https://doi.org/10.1109/DTIS.2006.1708676","url":null,"abstract":"The design of multi-standards CMOS mixers is presented in this paper. The front-end is designed to be operational for three standards at the same time: Global System Mobile (GSM), Digital Enhanced Cordless Telephone systems (DECT) and Universal Mobile Telecommunication System (UMTS). The required specifications for those standards are: a noise figure NF < 10dB, a -1dB compression point CP1 < -10dBm and a conversion gain CG > 15dB for a frequency operation up to 2.5 GHz. Three active mixer's structures are presented. The first is based on the Gilbert cell to which is added an output IF stage, a common mode feedback stage, and an isolation stage between the mixer LO and RF input terminals. This structure presents a good linearity and noise figure, but it produces a low conversion gain. The second structure consists in adding two PMOS transistors with the NMOS RF stage transistors in order to increase conversion gain. In the third structure, the authors replaced PMOS transistors by resistive loads. This work is achieved by a figure of merit development, in order to make possible the mixers topology's comparison. According to the developed figure of merit, folded switching mixer (2nd structure) achieves the best performances. With this topology the following simulation results are: noise figure (NF) 7.98 dB, conversion gain 14.8 dB, linearity (CP1) -4 dBm with a power consumption of 30 mW","PeriodicalId":399250,"journal":{"name":"International Conference on Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006.","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122025827","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
A low-power design methodology for single-stage operational amplifiers 一种单级运算放大器的低功耗设计方法
H. Aininzadeh, Mohammad Danaie, R. Lotfi
{"title":"A low-power design methodology for single-stage operational amplifiers","authors":"H. Aininzadeh, Mohammad Danaie, R. Lotfi","doi":"10.1109/DTIS.2006.1708694","DOIUrl":"https://doi.org/10.1109/DTIS.2006.1708694","url":null,"abstract":"Considering the importance of settling behavior of an operational amplifier for a given accuracy in many applications such as switched-capacitor circuits, the analysis of single-stage operational amplifiers based on settling time is performed. A simple yet accurate model for the settling response of first-order op amps that modifies the conventional models is presented. The mentioned analysis leads to a new simple settling-based design methodology for single-stage operational amplifiers. Simulation results are presented to show the effectiveness of the proposed model and design methodology","PeriodicalId":399250,"journal":{"name":"International Conference on Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006.","volume":"285 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123914522","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
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