B.A.T.N.K.B. Arachchi, A. Antony, J.B. Gunasinghe, M. Gunawardana, R. Samarasinghe
{"title":"Effect of Contact Angle of Water Droplets on the Electric Field Distribution of Polymer Insulators","authors":"B.A.T.N.K.B. Arachchi, A. Antony, J.B. Gunasinghe, M. Gunawardana, R. Samarasinghe","doi":"10.1109/CEIDP55452.2022.9985358","DOIUrl":"https://doi.org/10.1109/CEIDP55452.2022.9985358","url":null,"abstract":"High voltage polymer insulators have been extensively used in power networks in the past three decades owing to their high hydrophobic nature compared with the traditional porcelain and glass insulators. In this study, the variation of electric field distribution due to the contact angle of water droplets is studied using the Finite Element Method (FEM) based simulation approach. Simulations are carried out for three different scenarios where both clean and polluted insulator cases are considered, and results have been obtained accordingly. Based on the results it can be seen that the effect of the contact angle of water droplets on the e-field variation along a polluted insulator is higher than in a clean polymer insulator. The insulators subjected to coastal pollution conditions experience a high e-field intensification along the insulator when water droplets of higher contact angle are present on the insulator surface.","PeriodicalId":374945,"journal":{"name":"2022 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-10-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122626125","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Introducing materials informatics to dielectrics design","authors":"M. Sato","doi":"10.1109/CEIDP55452.2022.9985380","DOIUrl":"https://doi.org/10.1109/CEIDP55452.2022.9985380","url":null,"abstract":"It has become increasingly common to use machine learning techniques for discovering and designing novel materials. Big data enables machine learning techniques to make accurate predictions. However, experimental data are not abundant especially in the case of dielectric properties. In addition, the properties of polymers depend not only on the structure of monomers but also on the length of polymers, morphology, additives, and so on which further complicates the problem. Here, we review our latest research outcomes that are related to computational and data-driven dielectric materials design. First, we show how we were able to accurately predict the dielectric properties of gases using a small data set and further discover new molecules that can potentially outperform existing SF6 alternative gases. Then we show that by proper feature engineering it is possible to predict the thermal and electrical properties of polymer/inorganic filler composites. The main findings are as follows: (1) in line with our intuition, in general, accurate prediction of dielectric properties is difficult compared to the prediction of thermal or mechanical properties, (2) the process condition has an especially great impact on the electric properties of polymers, (3) with the knowledge of the underlying physics affecting the macroscopic properties, one can predict the dielectric properties of various materials with reasonable accuracy, (4) machine learning helps us understand the factors that control the dielectric properties, and (5) it can also be used to guide experiments or to provide testing standards.","PeriodicalId":374945,"journal":{"name":"2022 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-10-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125167614","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Stressed-volume approach and electric field spectrum","authors":"E. Tuncer","doi":"10.1109/CEIDP55452.2022.9985333","DOIUrl":"https://doi.org/10.1109/CEIDP55452.2022.9985333","url":null,"abstract":"A representation called the ‘stressed-volume’ is introduced to describe the electric field distribution in a given media (or high voltage design). The utility of the concept is to compare various designs and conscientiously estimate highest electric fields generated within a medium; the stressed-volume estimates can be converted to electric field spectrum, which could also be used to improve designs. The representation couples the geometrical effects due to electrode/conductor arrangements to high voltage performance in dielectrics, and enables material reliability models to be developed. It condenses the two-or three-dimensional electric field distributions to a xy-plot for elementary analysis. The mathematical background of the representation are presented.","PeriodicalId":374945,"journal":{"name":"2022 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-10-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129355130","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Siqi Chen, W. Qi, Miao Liu, Jia Qu, Luxing Zhao, B. Shen, X. Bian
{"title":"Simulation Research on Photoelectric Parameters of Optical Voltage Sensors with ZnS Doped Dielectric Materials","authors":"Siqi Chen, W. Qi, Miao Liu, Jia Qu, Luxing Zhao, B. Shen, X. Bian","doi":"10.1109/CEIDP55452.2022.9985390","DOIUrl":"https://doi.org/10.1109/CEIDP55452.2022.9985390","url":null,"abstract":"Advanced measurement technology is increasingly required under the background of smart grid. Compared to traditional sensors, optical sensors based on electroluminescence (EL) have good performance on electric insulation, which are promising in display and measurement of electric field. To study the photoelectric properties of electroluminescent dielectric materials, the model of AC electroluminescent devices (ACEL) need to be built and calculated. Using density functional method, we evaluate the energy band structure of electroluminescent dielectric materials. On this basis, the optical emission characteristics of electroluminescent devices driven by different voltages are also simulated. The results indicate that when E is higher than the threshold electric intensity but lower than 7.75 kV/mm, there exists a linear relationship between Lm and E, after which the $L_{m}-E$ curve tends to saturate significantly. Introducing the dielectric layer with a high dielectric constant would reduce the luminescence threshold voltage to less than 40 V, so as to improve the security and broaden the application range of photoelectric sensors.","PeriodicalId":374945,"journal":{"name":"2022 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"180 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-10-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128581510","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Research on the Polyimide Aerogel as a Light-weight Insulating Material with High Dielectric Strength","authors":"B. Song, M. Ren, Yizhuo Hu, Yue Wang, Ming Dong","doi":"10.1109/CEIDP55452.2022.9985370","DOIUrl":"https://doi.org/10.1109/CEIDP55452.2022.9985370","url":null,"abstract":"In this article, the insulation characteristics of polyimide aerogel as an ultralight weight insulation material is investigated. The breakdown characteristics of polyimide aerogel films under different nitrogen pressure are measured, and the partial discharge characteristics during breakdown process are recorded. It is found that the breakdown strength of PIA shows a “U-shaped” trend with the rising gas pressure, with a maximum breakdown strength of 117kV/mm at 0.05MPa, and minimum strength of 48kV/mm at 0.5MPa. These characteristics are closely related to pore distribution inside polyimide aerogel. Micro morphology of breakdown point of polyimide aerogel suggests the gas discharge-dependent breakdown mechanism. Above test results show that polyimide aerogel has excellent insulation characteristics at low pressure, making it one of the alternative materials for light weight electrical insulation of aircraft, ship, and other equipment.","PeriodicalId":374945,"journal":{"name":"2022 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"2015 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-10-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127680371","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
H. Wilhelm, P. Fernandes, L. Dill, K. Moscon, M. A. Marín, G. F. Moraes, T. Marchesan, V. Bender
{"title":"Evaluation of solid insulating paper properties aged in natural ester and mineral insulating oil","authors":"H. Wilhelm, P. Fernandes, L. Dill, K. Moscon, M. A. Marín, G. F. Moraes, T. Marchesan, V. Bender","doi":"10.1109/CEIDP55452.2022.9985321","DOIUrl":"https://doi.org/10.1109/CEIDP55452.2022.9985321","url":null,"abstract":"This study was carried out in order to evaluate properties of new insulating paper (Hybrid paper or HP, aramid/cellulose composite) and thermally upgraded kraft paper (TUK) during ageing at 165 and $185 ^{circ}text{C}$ in natural ester (NE, corn-based oil) and mineral insulating oil (MIO). Results will be complementary to a detailed and critical study to determine Arrhenius life curve for the liquid immersed transformer insulation system composed of NE and MIO in combination with TUK and HP. Accelerated ageing tests were carried out in laboratory for the HP, according to IEEE C57.100 standard, revised in 2011. Tests were conducted with MIO and with NE. A commercially available TUK paper was used as a reference, which was subjected to the same test condition. In this study, preliminary paper properties observed in TUK/NE, TUK/ MIO, HP/NE, HP/MIO insulation systems at temperatures of 165 and $185 ^{circ}text{C}$ are described. Degree of polymerization (DP), tensile testing and infrared analysis were performed on aged papers. HP presented a better performance in relation to TUK, in both oils. Furthermore, in NE slower degradation was observed for both papers at 165 and $185 ^{circ}text{C}$. Infrared spectroscopy analysis of aged papers showed that there was no transesterification reaction in both papers aged in insulating liquids (NE or MIO).","PeriodicalId":374945,"journal":{"name":"2022 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-10-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122414935","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Crystalline Morphology Effects on Space Charge Accumulation in Polypropylene under DC Voltage","authors":"Luming Zhou, T. Andritsch, George Chen","doi":"10.1109/CEIDP55452.2022.9985271","DOIUrl":"https://doi.org/10.1109/CEIDP55452.2022.9985271","url":null,"abstract":"Polypropylene (PP) has been widely studied as an insulating material with broad application prospects in high-voltage engineering. The morphological characteristics of PP have a certain influence on the accumulation of space charge. In the present work, unmodified and 0.1wt% alpha ($alpha$) nucleating agent-added PP were thermally treated at 130 °C to re-crystallize the samples, and two types of $alpha$ crystals with different internal structures were obtained. Using the principle of the pulsed electroacoustic (PEA) method, the effect of re-crystallization on charge accumulation was investigated. It was found that when recrystallization occurs, the increase of the mesophase in the PP crystallization leads to an increase in charge traps, which leads to an increase in total charge accumulation. Moreover, the change in the internal microstructure of the $alpha$ crystal has no change in the accumulation of space charge.","PeriodicalId":374945,"journal":{"name":"2022 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-10-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125468116","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
M. Joffre Chalco, M. Adrian Coronel, P. Flavio Quizhpi
{"title":"Identification and analysis of partial discharges by means of acoustic emission sensors on insulators type PIN55-5","authors":"M. Joffre Chalco, M. Adrian Coronel, P. Flavio Quizhpi","doi":"10.1109/CEIDP55452.2022.9985277","DOIUrl":"https://doi.org/10.1109/CEIDP55452.2022.9985277","url":null,"abstract":"An ANSI 55-5 pin-type insulator called as a test of test, to which tension was applied to several levels, based on the nominal voltage specified by the manufacturer, until the presence of DP was detected through measurement instruments. With the obtaining of the database product of the tests performed, a mathematical processing can be used using MATLAB when applying the correlation of the two signals and by using the Pearson coefficient for the interpretation of the results obtaining a highly significant correlation validating the Proposed method.","PeriodicalId":374945,"journal":{"name":"2022 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-10-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127821350","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Effect of Ethanol Concentration on Escherichia coli Sterilization using Pulsed Electric Field Application","authors":"Yuichi Murakami, Y. Muramoto","doi":"10.1109/CEIDP55452.2022.9985255","DOIUrl":"https://doi.org/10.1109/CEIDP55452.2022.9985255","url":null,"abstract":"This study examined the killing effects of ethanol solution using a pulsed electric field (PEF). We applied PEF (field intensity: 5.5 kV/mm, pulse length: 4 $mu$s, number of applied PEF: 10-1,000, frequency: 10 Hz) to a liquid sample that is 0%–40% ethanol solution, which contains Escherichia coli. The results are as follows; (i) The survival counts of E. coli decreased with an increase in the number of applied pulses. (ii) The survival counts of E. coli decreased as ethanol concentrations and sample temperatures increased; PEF kills E. coli in 30%–40% ethanol solution after pulse application. (iii) The survival counts of E. coli decreased with an increase in the sample temperature. For the 20% ethanol sample at high temperature, we cannot observe the colonies of E. coli after PEF experiments. (iv) The energy consumption for the PEF sterilization (100 pulses application) in a room temperature sample is less than that for sake pasteurization.","PeriodicalId":374945,"journal":{"name":"2022 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-10-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127367230","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Breakdown Sites in MIM Structures","authors":"H. Kliem","doi":"10.1109/CEIDP55452.2022.9985281","DOIUrl":"https://doi.org/10.1109/CEIDP55452.2022.9985281","url":null,"abstract":"Metal-aluminum oxide-metal structures are prepared by physical vapour deposition on silicon wafers. Their final breakdown field is 4.5 MV/cm. Above 1 MV/cm partial breakdown spots appear on the electrodes. The spots are not only restricted to the volume of the oxide films with thickness 200 nm, but they extend down into the silicon substrate. Crater-like holes with depths of about 1.5 μm are formed as revealed by an atomic force microscope. An amount of energy 50 times higher than stored electrostatically in the structure is necessary to burn these craters by a melting process. It is supposed, that the hot breakdown channels trigger a second process, which delivers the missing energy. In this second process hydrogen ions might be involved.","PeriodicalId":374945,"journal":{"name":"2022 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"194 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-10-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133759883","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}