{"title":"应力体积法与电场谱","authors":"E. Tuncer","doi":"10.1109/CEIDP55452.2022.9985333","DOIUrl":null,"url":null,"abstract":"A representation called the ‘stressed-volume’ is introduced to describe the electric field distribution in a given media (or high voltage design). The utility of the concept is to compare various designs and conscientiously estimate highest electric fields generated within a medium; the stressed-volume estimates can be converted to electric field spectrum, which could also be used to improve designs. The representation couples the geometrical effects due to electrode/conductor arrangements to high voltage performance in dielectrics, and enables material reliability models to be developed. It condenses the two-or three-dimensional electric field distributions to a xy-plot for elementary analysis. The mathematical background of the representation are presented.","PeriodicalId":374945,"journal":{"name":"2022 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-10-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Stressed-volume approach and electric field spectrum\",\"authors\":\"E. Tuncer\",\"doi\":\"10.1109/CEIDP55452.2022.9985333\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A representation called the ‘stressed-volume’ is introduced to describe the electric field distribution in a given media (or high voltage design). The utility of the concept is to compare various designs and conscientiously estimate highest electric fields generated within a medium; the stressed-volume estimates can be converted to electric field spectrum, which could also be used to improve designs. The representation couples the geometrical effects due to electrode/conductor arrangements to high voltage performance in dielectrics, and enables material reliability models to be developed. It condenses the two-or three-dimensional electric field distributions to a xy-plot for elementary analysis. The mathematical background of the representation are presented.\",\"PeriodicalId\":374945,\"journal\":{\"name\":\"2022 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-10-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CEIDP55452.2022.9985333\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEIDP55452.2022.9985333","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Stressed-volume approach and electric field spectrum
A representation called the ‘stressed-volume’ is introduced to describe the electric field distribution in a given media (or high voltage design). The utility of the concept is to compare various designs and conscientiously estimate highest electric fields generated within a medium; the stressed-volume estimates can be converted to electric field spectrum, which could also be used to improve designs. The representation couples the geometrical effects due to electrode/conductor arrangements to high voltage performance in dielectrics, and enables material reliability models to be developed. It condenses the two-or three-dimensional electric field distributions to a xy-plot for elementary analysis. The mathematical background of the representation are presented.