{"title":"Stressed-volume approach and electric field spectrum","authors":"E. Tuncer","doi":"10.1109/CEIDP55452.2022.9985333","DOIUrl":null,"url":null,"abstract":"A representation called the ‘stressed-volume’ is introduced to describe the electric field distribution in a given media (or high voltage design). The utility of the concept is to compare various designs and conscientiously estimate highest electric fields generated within a medium; the stressed-volume estimates can be converted to electric field spectrum, which could also be used to improve designs. The representation couples the geometrical effects due to electrode/conductor arrangements to high voltage performance in dielectrics, and enables material reliability models to be developed. It condenses the two-or three-dimensional electric field distributions to a xy-plot for elementary analysis. The mathematical background of the representation are presented.","PeriodicalId":374945,"journal":{"name":"2022 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-10-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEIDP55452.2022.9985333","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A representation called the ‘stressed-volume’ is introduced to describe the electric field distribution in a given media (or high voltage design). The utility of the concept is to compare various designs and conscientiously estimate highest electric fields generated within a medium; the stressed-volume estimates can be converted to electric field spectrum, which could also be used to improve designs. The representation couples the geometrical effects due to electrode/conductor arrangements to high voltage performance in dielectrics, and enables material reliability models to be developed. It condenses the two-or three-dimensional electric field distributions to a xy-plot for elementary analysis. The mathematical background of the representation are presented.