Raju Ahamed, M. Varonen, D. Parveg, J. Saijets, K. Halonen
{"title":"Design of high-performance E-band SPDT switch and LNA in 0.13 μm SiGe BiCMOS technology","authors":"Raju Ahamed, M. Varonen, D. Parveg, J. Saijets, K. Halonen","doi":"10.1109/NORCHIP.2017.8124975","DOIUrl":"https://doi.org/10.1109/NORCHIP.2017.8124975","url":null,"abstract":"This paper presents the design of high-performance E-band single-pole double-through (SPDT) switch and low noise amplifier (LNA) as a part of transceiver front-end in an 0.13 μm SiGe BiCMOS technology. The quarter-wave shunt SPDT switch is designed using reverse-saturated SiGe HBTs. The resulting switch exhibits an insertion loss of 2.1 dB, isolation of 26 dB, reflection coefficient better than 18 dB at 75 GHz and provides a bandwidth of more than 35 GHz. The designed switch is integrated with a single-in differential-output (SIDO) low noise amplifier (LNA) and utilized as input matching element of the LNA. The LNA utilizes a common-emitter amplifier at the first stage and a casocode amplifier at the second stage to exploit the advantages of both common-emitter and cascode topologies. The resulting LNA with integrated switch achieves a gain and noise figure(NF) of 26 dB and 6.9 dB, respectively at 75 GHz with a 3 dB bandwidth of 12 GHz. Output referred 1-dB compression point of +5.5 dBm is achieved at 75 GHz. The designed integrated block consumes 45.5 mW of DC power and occupies an area of 720 μm × 580 μm excluding RF pads.","PeriodicalId":373686,"journal":{"name":"2017 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and International Symposium of System-on-Chip (SoC)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127462829","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Ring-oscillator-based timing generator for ultralow-power applications","authors":"Pavel Angelov, Martin Nielsen-Lönn, A. Alvandpour","doi":"10.1109/NORCHIP.2017.8124969","DOIUrl":"https://doi.org/10.1109/NORCHIP.2017.8124969","url":null,"abstract":"Many integrated circuit functional blocks, such as data and power converters, require timing and control signals consisting of complex sequences of pulses. Traditionally, these signals are generated from a clock signal using a combination of flip-flops, latches and delay elements. Due to the large internal switching activity of flips-flops and due to the many, effectively unused, clock cycles, this solution is inefficient from a power consumption point of view and is, therefore, unsuitable for ultralow-power applications. In this paper we present a method to generate non-overlapping control signals without using flip-flops or a clock. We propose to decode and translate the internal states of a ring oscillator into the desired control signal sequence. We show how this can be achieved using a simple combinatorial logic decoder. The proposed architecture significantly reduces the switching activity and the capacitive load, largely reducing the consumed power. We show an example implementation of a 9-bit SAR logic utilizing our proposed method. Furthermore, we show simulation results and compare the power consumption of the example SAR implementation to that of a functionally identical flip-flop-based state-of-the-art ultralow-power SAR. We were able to achieve a 5.8x reduction in consumed power for the complete SAR and 8x for the one-hot generation sub-part.","PeriodicalId":373686,"journal":{"name":"2017 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and International Symposium of System-on-Chip (SoC)","volume":"393 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122856654","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A capacitance multiplier based on DBTA","authors":"J. Vavra","doi":"10.1109/NORCHIP.2017.8124988","DOIUrl":"https://doi.org/10.1109/NORCHIP.2017.8124988","url":null,"abstract":"The Design of integrated circuits uses the Capacitance Multipliers for the realization of large-valued on-chip capacitances. The capacitance multiplier can save the valuable space on the chip in exchange for use one active element and two grounded passive components. The final multiplied capacitance is bigger than one real on-chip capacitance, moreover, the smaller on-chip space is required. The proposed circuit connection uses one active element called DBTA (Differential Input Buffered and Transconductance Amplifier) and two passive grounded component — one resistor and one capacitor whose capacitance is finally multiplied. The transconductance of DBTA or value of the resistor can control the multiplication factor. The active element is composed of current feedback amplifiers for test reasons. The verification of this proposal is ensured by SPICE simulations.","PeriodicalId":373686,"journal":{"name":"2017 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and International Symposium of System-on-Chip (SoC)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124577804","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"The effect of DPD bandwidth limitation on EVM for a 28 nm WLAN 802.11ac transmitter","authors":"Oscar Morales Chacon, T. Johansson, Thomas Flink","doi":"10.1109/NORCHIP.2017.8124943","DOIUrl":"https://doi.org/10.1109/NORCHIP.2017.8124943","url":null,"abstract":"Digital predistortion (DPD) performance for an IEEE 802.11ac WLAN transmitter in 28 nm CMOS, using 20 and 80 MHz bandwidth with 256QAM modulation, is analyzed under different bandwidth limitations. Due to band-limited conditions in the transmitter chain, the DPD linearization performance may be reduced. For a minimum transmitter error vector magnitude (EVM) requirement of −32 dB (2.5%) for 256QAM modulation, a reduction in the maximum linear output power of 1.6 dB due to bandwidth limitations in the transmitter chain is estimated using simulations and measurement results.","PeriodicalId":373686,"journal":{"name":"2017 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and International Symposium of System-on-Chip (SoC)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123802155","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Luca Pezzarossa, Andreas Toftegaard Kristensen, Martin Schoeberl, J. Sparsø
{"title":"Can real-time systems benefit from dynamic partial reconfiguration?","authors":"Luca Pezzarossa, Andreas Toftegaard Kristensen, Martin Schoeberl, J. Sparsø","doi":"10.1109/NORCHIP.2017.8124984","DOIUrl":"https://doi.org/10.1109/NORCHIP.2017.8124984","url":null,"abstract":"In real-time systems, a solution where hardware accelerators are used to implement computationally intensive tasks can be easier to analyze, in terms of worst-case execution time (WCET), than a pure software solution. However, when using FPGAs, the amount and the complexity of the hardware accelerators are limited by the resources available. Dynamic partial reconfiguration (DPR) of FPGAs can be used to overcome this limitation by replacing the accelerators that are only required for limited amounts of time with new ones. This paper investigates the potential benefits of using DPR to implement hardware accelerators in real-time systems and presents an experimental analysis of the trade-offs between hardware utilization and WCET increase due to the reconfiguration time overhead of DPR. We also investigate the trade-off between the use of multiple specialized accelerators combined with DPR instead of the use of a more general accelerator. The results show that, for computationally intensive tasks, the use of DPR can lead to a more efficient use of the FPGA, while maintaining comparable computational performance.","PeriodicalId":373686,"journal":{"name":"2017 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and International Symposium of System-on-Chip (SoC)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127978768","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Andreas Toftegaard Kristensen, Luca Pezzarossa, J. Sparsø
{"title":"High-level synthesis for reduction of WCET in real-time systems","authors":"Andreas Toftegaard Kristensen, Luca Pezzarossa, J. Sparsø","doi":"10.1109/NORCHIP.2017.8124945","DOIUrl":"https://doi.org/10.1109/NORCHIP.2017.8124945","url":null,"abstract":"The increasing design complexity of systems-on-chip (SoCs) requires designers to work at higher levels of abstraction. High-level synthesis (HLS) is one approach towards this. It allows designers to synthesize hardware directly from code written in a high-level programming language and to more quickly explore alternative implementations by re-running the synthesis with different optimization parameters and pragmas. HLS is particularly interesting for FPGA circuits, where different hardware implementations can easily be loaded into the target device. Another perspective on HLS is performance. Compared to executing the high-level language code on a processor, HLS can be used to create hardware that accelerates critical parts of the code. When discussing performance in the context or real-time systems, it is the worst-case execution time (WCET) of a task that matters. WCET obviously benefits from hardware acceleration, but it may also benefit from a tighter bound on the WCET. This paper explores the use of and integration of accelerators generated using HLS into a time-predictable processor intended for real-time systems. The high-level design tool, Vivado HLS, is used to generate hardware accelerators from benchmark code, and the system using the generated hardware accelerators is evaluated against the WCET of the original code. The design evaluation is carried out using the Patmos processor from the open-source T-CREST platform and implemented on a Xilinx Artix 7 FPGA. The WCET speed-up achieved is between a factor of 5 and 70.","PeriodicalId":373686,"journal":{"name":"2017 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and International Symposium of System-on-Chip (SoC)","volume":"487 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130907859","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Franz Marcus Schüffny, Michael Hayoz, Cheolyong Bae, I. Arya, M. Gokhale, Annapragada Hema Chandar, Martin Nielsen-Lönn, Pavel Angelov
{"title":"Zero-crossing detector for a piezoelectric energy harvester","authors":"Franz Marcus Schüffny, Michael Hayoz, Cheolyong Bae, I. Arya, M. Gokhale, Annapragada Hema Chandar, Martin Nielsen-Lönn, Pavel Angelov","doi":"10.1109/NORCHIP.2017.8124957","DOIUrl":"https://doi.org/10.1109/NORCHIP.2017.8124957","url":null,"abstract":"Energy harvesting is a method that extracts electrical energy from the environment. This paper presents an integrated circuit in 0.35-μm CMOS that harvests energy from mechanical vibration using a piezoelectric transducer. The circuit applies a bias-flip rectifier to improve the efficiency of the energy extraction. The paper focuses on the design of the key element of the bias-flip rectifier, the zero-crossing detector. It detects the zero crossing of the input current from the piezoelectric transducer and generates the control signals for the bias-flip rectifier. Post-layout simulations show a very low power consumption and high efficiency of the harvester.","PeriodicalId":373686,"journal":{"name":"2017 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and International Symposium of System-on-Chip (SoC)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117067447","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Active charge pumping power-saving technique for SC integrators","authors":"Jia Sun, T. Rahkonen","doi":"10.1109/NORCHIP.2017.8124985","DOIUrl":"https://doi.org/10.1109/NORCHIP.2017.8124985","url":null,"abstract":"This paper presents a method to save the power consumption of switched capacitor (SC) integrators in sigma-delta analog-to-digital converters (ADCs). It is based on open-loop charge injection in the output of the first integrator. The injected charge is a continuous function of the input voltage and feedback, the idea is to minimize the initial transient voltage in the input of the first amplifier and hence bypass the slewing of the amplifier. Circuit simulations show that a 10-bit performance can be obtained by about 60% power dissipation, compared to a traditional implementation.","PeriodicalId":373686,"journal":{"name":"2017 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and International Symposium of System-on-Chip (SoC)","volume":"72 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127129636","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Mitigating single-event upsets in COTS SDRAM using an EDAC SDRAM controller","authors":"Eleftherios Kyriakakis, Kalle Ngo, Johnny Öberg","doi":"10.1109/NORCHIP.2017.8124978","DOIUrl":"https://doi.org/10.1109/NORCHIP.2017.8124978","url":null,"abstract":"From deep space missions to low-earth orbit satellites, the natural radiation of space proves to be a hostile environment for electronics. Memory elements in particular are highly susceptible to radiation charge that if latched can cause single-event upsets (SEU, bit-flips) which lead to data corruption and even mission critical failures. On Earth, SDRAM devices are widely used as a cost-effective, high performance storage elements in almost every computer system. However, their physical design makes them highly susceptible to SEUs. Thus, their usage in space application is limited and usually avoided, requiring the use of radiation hardened components which are generally a few generations older and often much more expensive than COTS. In this paper, an off-chip SEU/MBU mitigation mechanism is presented that aims to drastically reduce the probability of data corruption inside a commercial-off-the-shelf (COTS) synchronous dynamic random access memory (SDRAM) using a triple modular redundant (TMR) scheme for data and periodic scrubbing. The proposed mitigation technique is implemented in a novel controller that will be used by the single-event upset detector (SEUD) experiment aboard the KTH MInature STudent (MIST) satellite project.","PeriodicalId":373686,"journal":{"name":"2017 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and International Symposium of System-on-Chip (SoC)","volume":"114 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123322759","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"ESD induced EMS problems in digital IOs","authors":"T. Ostermann","doi":"10.1109/NORCHIP.2017.8124971","DOIUrl":"https://doi.org/10.1109/NORCHIP.2017.8124971","url":null,"abstract":"Soft failures due to ESD events must be taken into account for the correct function of an integrated circuit. In addition to the ESD characterization of unpowered integrated circuits, especially in the case of hard failures, an ESD characterization of powered ICs is necessary in order to analyze possible soft failures. The paper deals with soft failures in integrated circuits due to interferences in input and output pad cells from the VDD core and VDDIO supplies. A comparison of the influence of additional capacitances to buffer the IO/core supply is also included.","PeriodicalId":373686,"journal":{"name":"2017 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and International Symposium of System-on-Chip (SoC)","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114188631","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}