2004 Semiconductor Manufacturing Technology Workshop Proceedings (IEEE Cat. No.04EX846)最新文献_第3页

Inter-firm collaboration mechanism in process development and product design between foundry and fabless design house 代工厂和无晶圆厂设计公司在工艺开发和产品设计方面的合作机制

2004 Semiconductor Manufacturing Technology Workshop Proceedings (IEEE Cat. No.04EX846) Pub Date : 2004-09-09 DOI: 10.1109/SMTW.2004.1393715

Y. Su, R. Guo, Shi-Chung Chang

引用次数: 7

The outlook for electronic systems and semiconductors 电子系统和半导体的前景

2004 Semiconductor Manufacturing Technology Workshop Proceedings (IEEE Cat. No.04EX846) Pub Date : 2004-09-09 DOI: 10.1109/SMTW.2004.1393700

E. Wu

引用次数: 0

Feasibility of measuring four profile parameters for metal-0 trench of DRAM by spectroscopic ellipsometry based profile technology 基于椭圆偏振光谱技术测量DRAM金属-0沟槽四种剖面参数的可行性

2004 Semiconductor Manufacturing Technology Workshop Proceedings (IEEE Cat. No.04EX846) Pub Date : 2004-09-09 DOI: 10.1109/SMTW.2004.1393754

R. Liou, T. Cheng, Chung-I Chang, Tings Wang, S. Fu, T. Dziura

引用次数: 3

Future of CMOS technology CMOS技术的未来

2004 Semiconductor Manufacturing Technology Workshop Proceedings (IEEE Cat. No.04EX846) Pub Date : 2004-09-09 DOI: 10.1109/SMTW.2004.1393699

H. Iwai

引用次数: 55

A study of the fabrication of flip-chip bumps using dry-film photoresist process on 300 mm wafer 用干膜光刻胶工艺在300mm晶圆上制造倒装凸点的研究

2004 Semiconductor Manufacturing Technology Workshop Proceedings (IEEE Cat. No.04EX846) Pub Date : 2004-09-09 DOI: 10.1109/SMTW.2004.1393724

Zhi-Ting Ke, Cheng-Shih Lee, Keng-Huei Shen, E. Chang

引用次数: 1

Using process experienced correlation table to improve the accuracy and reliability of data mining for yield improvement 利用过程经验关联表提高数据挖掘的准确性和可靠性，提高成品率

2004 Semiconductor Manufacturing Technology Workshop Proceedings (IEEE Cat. No.04EX846) Pub Date : 2004-09-09 DOI: 10.1109/SMTW.2004.1393746

Haw-Jyue Luo, S.R. Wang, C. Chen, Hung-En Tai, Chen-Fu Chien, Pei-Nong Chen

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引用次数: 0

Developing statistical models in an early warning system and its empirical study 预警系统统计模型的建立及其实证研究

2004 Semiconductor Manufacturing Technology Workshop Proceedings (IEEE Cat. No.04EX846) Pub Date : 2004-09-09 DOI: 10.1109/SMTW.2004.1393758

Pei-Nong Chen, Chen-Fu Chien, Sheng-Jen Wang, Chien-chung Chen, Haw-Jyue Luo

引用次数: 0

Real-time fault detection and condition monitoring system for chiller 冷水机组实时故障检测与状态监测系统

2004 Semiconductor Manufacturing Technology Workshop Proceedings (IEEE Cat. No.04EX846) Pub Date : 2004-09-09 DOI: 10.1109/SMTW.2004.1393755

Wen-Yao Chang, Tzu-Chi Wang, Yuan-Pin Shin

引用次数: 5

Cutting for QFN packaging by diode pumping solid state laser system 二极管抽运固体激光系统用于QFN封装的切割

2004 Semiconductor Manufacturing Technology Workshop Proceedings (IEEE Cat. No.04EX846) Pub Date : 2004-09-09 DOI: 10.1109/SMTW.2004.1393743

Chun-Hao Li, M. Tsai, R. Chen, Chen-Hau Lee, Sheng-Wen Hong

引用次数: 9

Just-in-time AMHS delivery for 300 mm FAB 300mm FAB的及时AMHS交付

2004 Semiconductor Manufacturing Technology Workshop Proceedings (IEEE Cat. No.04EX846) Pub Date : 2004-09-09 DOI: 10.1109/SMTW.2004.1393706

J. Chang, Yung Cheng

引用次数: 2