Proceedings of IEEE International Conference on Computer Aided Design (ICCAD)最新文献

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A sequential quadratic programming approach to concurrent gate and wire sizing 并行门和线尺寸的顺序二次规划方法
Proceedings of IEEE International Conference on Computer Aided Design (ICCAD) Pub Date : 1995-12-01 DOI: 10.1109/ICCAD.1995.480005
N. Menezes, R. Baldick, L. Pileggi
{"title":"A sequential quadratic programming approach to concurrent gate and wire sizing","authors":"N. Menezes, R. Baldick, L. Pileggi","doi":"10.1109/ICCAD.1995.480005","DOIUrl":"https://doi.org/10.1109/ICCAD.1995.480005","url":null,"abstract":"With an ever-increasing portion of the delay in highspeed CMOS chips attributable to the interconnect, interconnect-circuit design automation continues to grow in importance. By transforming the gate and multilayer wire sizing problem into a convex programming problem for the Elmore delay approximation, we demonstrate the efficacy of a sequential quadratic programming (SQP) solution method. For cases where accuracy greater than that provided by the Elmore delay approximation is required we apply SQP to the gate and wire sizing problem with more accurate delay models. Since efficient calculation of sensitivities is of paramount importance during SQP, we describe an approach for efficient computation of the accurate delay sensitivities.","PeriodicalId":367501,"journal":{"name":"Proceedings of IEEE International Conference on Computer Aided Design (ICCAD)","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127303713","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 80
Optimal wiresizing for interconnects with multiple sources 多源互连的最佳布线
Proceedings of IEEE International Conference on Computer Aided Design (ICCAD) Pub Date : 1995-12-01 DOI: 10.1109/ICCAD.1995.480173
J. Cong, Lei He
{"title":"Optimal wiresizing for interconnects with multiple sources","authors":"J. Cong, Lei He","doi":"10.1109/ICCAD.1995.480173","DOIUrl":"https://doi.org/10.1109/ICCAD.1995.480173","url":null,"abstract":"The optimal wiresizing problem for nets with multiple sources is studied under the distributed Elmore delay model. We decompose such a net into a source subtree (SST) and a set of loading subtrees (LSTs), and show the optimal wiresizing solution satisfies a number of interesting properties, including: the LST separability, the LST monotone property, the SST local monotone property and the general dominance property. Furthermore, we study the optimal wiresizing problem using a variable grid and reveal the bundled refinement property. These properties lead to efficient algorithms to compute the lower and upper bounds of the optimal solutions. Experiment results on nets from an Intel processor layout show an interconnect delay reduction of up to 35.9% when compared to the minimum-width solution. In addition, the algorithm based on a variable grid yields a speedup of two orders of magnitude without loss of accuracy, when compared with the fixed grid based methods.","PeriodicalId":367501,"journal":{"name":"Proceedings of IEEE International Conference on Computer Aided Design (ICCAD)","volume":"81 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130873625","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 75
Timing analysis with known false sub graphs 已知假子图的时序分析
Proceedings of IEEE International Conference on Computer Aided Design (ICCAD) Pub Date : 1995-12-01 DOI: 10.1109/ICCAD.1995.480255
K. Belkhale, Alexander J. Suess
{"title":"Timing analysis with known false sub graphs","authors":"K. Belkhale, Alexander J. Suess","doi":"10.1109/ICCAD.1995.480255","DOIUrl":"https://doi.org/10.1109/ICCAD.1995.480255","url":null,"abstract":"In this paper we formulate the problem of timing analysis with known false sub graphs. This problem is important when we want the timing analysis system to take into account false path information that is supplied either by the user or by another program, and supply accurate timing information to optimization programs such as placement and wiring. We present an efficient algorithm for the problem.","PeriodicalId":367501,"journal":{"name":"Proceedings of IEEE International Conference on Computer Aided Design (ICCAD)","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115343104","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 29
Logic synthesis for look-up table based FPGAs using functional decomposition and support minimization 基于功能分解和支持最小化的基于查找表的fpga逻辑综合
Proceedings of IEEE International Conference on Computer Aided Design (ICCAD) Pub Date : 1995-12-01 DOI: 10.1109/ICCAD.1995.480140
Hiroshi Sawada, Takayuki Suyama, A. Nagoya
{"title":"Logic synthesis for look-up table based FPGAs using functional decomposition and support minimization","authors":"Hiroshi Sawada, Takayuki Suyama, A. Nagoya","doi":"10.1109/ICCAD.1995.480140","DOIUrl":"https://doi.org/10.1109/ICCAD.1995.480140","url":null,"abstract":"This paper presents a logic synthesis method for look-up table (LUT) based field programmable gate arrays (FPGAs). We determine functions to be mapped to LUTs by functional decomposition. We use not only disjunctive decomposition but also nondisjunctive decomposition. Furthermore, we propose a new Boolean resubstitution technique customized for an LUT network synthesis. Resubstitution is used to determine whether an existing function is useful to realize another function; thus, we can share the common function among two or more functions. The Boolean resubstitution is effectively carried out by solving a support minimization problem for an incompletely specified function. We can also handle satisfiability don't cares of an LUT network using the technique.","PeriodicalId":367501,"journal":{"name":"Proceedings of IEEE International Conference on Computer Aided Design (ICCAD)","volume":"59 14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114053656","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 63
Cost-free scan: a low-overhead scan path design methodology 无成本扫描:一种低开销的扫描路径设计方法
Proceedings of IEEE International Conference on Computer Aided Design (ICCAD) Pub Date : 1995-12-01 DOI: 10.1109/ICCAD.1995.480167
Chih-Chang Lin, M. Marek-Sadowska, M. Lee, Kuang-Chien Chen
{"title":"Cost-free scan: a low-overhead scan path design methodology","authors":"Chih-Chang Lin, M. Marek-Sadowska, M. Lee, Kuang-Chien Chen","doi":"10.1109/ICCAD.1995.480167","DOIUrl":"https://doi.org/10.1109/ICCAD.1995.480167","url":null,"abstract":"Conventional scan design imposes considerable area and delay overhead by using larger scan flip-flops and additional scan wires without utilizing the functionality of the combinational logic. We propose a novel low-overhead scan design methodology, called cost-free scan, which exploits the controllability of primary inputs to establish scan paths through the combinational logic. The methodology aims at reducing scan overhead by (1) analyzing the circuit to determine all the cost-free scan flip-flops, and (2) selecting the best primary input vector to establish the maximum number of cost-free scan flip-flops on the scan chain. Significant reduction in the scan overhead is achieved on ISCAS89 benchmarks, where in full scan environment, as many as 89% of the total flip-flops are found cost-free scannable, while in partial scan environment, reduction can be as high as 97% in scan flip-flops needed to break sequential loops.","PeriodicalId":367501,"journal":{"name":"Proceedings of IEEE International Conference on Computer Aided Design (ICCAD)","volume":"46 10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124285540","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 35
Stable and efficient reduction of substrate model networks using congruence transforms 利用同余变换稳定有效地约简基底模型网络
Proceedings of IEEE International Conference on Computer Aided Design (ICCAD) Pub Date : 1995-12-01 DOI: 10.1109/ICCAD.1995.480014
K. Kerns, I. Wemple, A. Yang
{"title":"Stable and efficient reduction of substrate model networks using congruence transforms","authors":"K. Kerns, I. Wemple, A. Yang","doi":"10.1109/ICCAD.1995.480014","DOIUrl":"https://doi.org/10.1109/ICCAD.1995.480014","url":null,"abstract":"Parasitic analog-digital noise coupling has been identified as a key issue facing designers of mixed-signal integrated circuits. In particular signal cross talk through the common chip substrate has become increasingly problematic. The paper demonstrates a new methodology for developing simulation, synthesis, and verification models to analyze the global electrical behavior of the non-ideal semiconductor substrate. RC substrate network models, which are generated via a triangular discretization method, are accurately approximated for subsequent analysis by an efficient reduction algorithm. This algorithm utilizes the well-conditioned Lanczos process to formulate Pade approximations of the network port admittance. Congruence transformations are employed to ensure stability, and to create reduced networks which are easily realizable with SPICE-compatible RC elements. For validation, the strategy has been successfully applied to several mixed-signal circuit examples.","PeriodicalId":367501,"journal":{"name":"Proceedings of IEEE International Conference on Computer Aided Design (ICCAD)","volume":"434 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122476519","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 146
Signal integrity optimization on the pad assignment for high-speed VLSI design 高速VLSI设计中焊盘分配的信号完整性优化
Proceedings of IEEE International Conference on Computer Aided Design (ICCAD) Pub Date : 1995-12-01 DOI: 10.1109/ICCAD.1995.480253
Kai-Yuan Chao, D. F. Wong
{"title":"Signal integrity optimization on the pad assignment for high-speed VLSI design","authors":"Kai-Yuan Chao, D. F. Wong","doi":"10.1109/ICCAD.1995.480253","DOIUrl":"https://doi.org/10.1109/ICCAD.1995.480253","url":null,"abstract":"Pad assignment with signal integrity optimization is very important for high-speed VLSI design. In this paper, an efficient method is proposed to effectively minimize both simultaneous switching noise and crosstalk that are inevitably caused by package inductance and capacitance during the design of high-speed/high-bandwidth circuits. Due to its efficiency, our algorithm can be incorporated into existing circuit floorplanning and placement schemes for the co-design of VLSI and packaging. For a set of industrial circuits/packages tested in our experiment, on the average, our method achieves a 16.8% reduction of total electrical noise when compared with the conventional design rule of thumb popularly used by circuit designers.","PeriodicalId":367501,"journal":{"name":"Proceedings of IEEE International Conference on Computer Aided Design (ICCAD)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123392262","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Be careful with don't cares 小心那些不在乎的人
Proceedings of IEEE International Conference on Computer Aided Design (ICCAD) Pub Date : 1995-12-01 DOI: 10.1109/ICCAD.1995.479996
D. Brand, R. Bergamaschi, L. Stok
{"title":"Be careful with don't cares","authors":"D. Brand, R. Bergamaschi, L. Stok","doi":"10.1109/ICCAD.1995.479996","DOIUrl":"https://doi.org/10.1109/ICCAD.1995.479996","url":null,"abstract":"It is commonly expected that any correct implementation can replace its specification inside a larger design without violating the correctness of the whole design. This property (called replaceability) is automatically satisfied in the absence of don't cares because \"correctness\" by definition implies that specification and implementation compute the identical function. However don't cares allow an implementation to compute a different function, and thus make it difficult to ensure replaceability. Whether this problem occurs depends on the exact meaning of \"don't care\" and the associated definition of \"correctness\". We will consider three meanings of \"don't care\" and for each give conditions under which correct implementations may replace their specifications.","PeriodicalId":367501,"journal":{"name":"Proceedings of IEEE International Conference on Computer Aided Design (ICCAD)","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130704221","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 21
PROP: a recursive paradigm for area-efficient and performance oriented partitioning of large FPGA netlists 大型FPGA网络列表的区域效率和面向性能的分区的递归范例
Proceedings of IEEE International Conference on Computer Aided Design (ICCAD) Pub Date : 1995-12-01 DOI: 10.1109/ICCAD.1995.480197
R. Kuznar, F. Brglez
{"title":"PROP: a recursive paradigm for area-efficient and performance oriented partitioning of large FPGA netlists","authors":"R. Kuznar, F. Brglez","doi":"10.1109/ICCAD.1995.480197","DOIUrl":"https://doi.org/10.1109/ICCAD.1995.480197","url":null,"abstract":"In this paper, we introduce a new recursive partitioning paradigm PROP which combines partitioning, replication, optimization, to be followed by another recursion of partitioning, etc. We measure the quality of partitions in terms of total device cost, logic and terminal utilization, and critical path delay. Traditionally, the minimum lower bound into which a given netlist can be partitioned is determined by disregarding the logic interconnect while distributing the logic nodes into a minimum number of devices. PROP paradigm challenges this assumption by demonstrating feasible partitions of some large netlists such that the number of device partitions is smaller than minimum lower bounds postulated initially. Overall, we report consistent reductions in the total number of partitions for a wide range of combinational and sequential circuit benchmarks while, on the average, reducing critical path delay as well.","PeriodicalId":367501,"journal":{"name":"Proceedings of IEEE International Conference on Computer Aided Design (ICCAD)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122101796","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 30
A novel methodology for statistical parameter extraction 一种新的统计参数提取方法
Proceedings of IEEE International Conference on Computer Aided Design (ICCAD) Pub Date : 1995-12-01 DOI: 10.1109/ICCAD.1995.480205
K. Krishna, S. W. Director
{"title":"A novel methodology for statistical parameter extraction","authors":"K. Krishna, S. W. Director","doi":"10.1109/ICCAD.1995.480205","DOIUrl":"https://doi.org/10.1109/ICCAD.1995.480205","url":null,"abstract":"IC manufacturing process variations are typically expressed in terms of joint probability density functions (jpdf's) or as worst case combinations/corners of the device model parameters. However, since device models can only provide approximations to actual device behavior, the difference between the two being the modelling error only a part of the measured variation in device behavior can be modelled using device model parameter variations and the remaining appears as modelling error variation. In this paper we present a novel statistical parameter extraction methodology that accounts for the effect of modelling error on device model parameter statistics and can be used to quantify the statistical suitability of conventional MOS device models.","PeriodicalId":367501,"journal":{"name":"Proceedings of IEEE International Conference on Computer Aided Design (ICCAD)","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129164369","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
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