2017 30th IEEE International System-on-Chip Conference (SOCC)最新文献

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The path to global connectivity — Wireless communication enters the next generation 全球连接之路——无线通信进入下一代
2017 30th IEEE International System-on-Chip Conference (SOCC) Pub Date : 2017-09-01 DOI: 10.1109/SOCC.2017.8226040
J. Hausner
{"title":"The path to global connectivity — Wireless communication enters the next generation","authors":"J. Hausner","doi":"10.1109/SOCC.2017.8226040","DOIUrl":"https://doi.org/10.1109/SOCC.2017.8226040","url":null,"abstract":"As mobile broadband (MBB) technologies evolve, devices need to support increasing bandwidth with multiple frequencies and dramatically exploding data rates. New air interfaces in 5G will show once again the gain in data rates as we have seen from 2G, to 3G to HSPA, to LTE and LTE advanced. These technologies in a single device provide the best possible services with great user experience to all people no matter where they are. Developing the next generation takes advantage of higher density in analog and digital silicon circuitry to enable low cost high performance solutions. Next to those MBB systems, massive and reliable machine-type communications — also known as the Internet of Things — will get developed under the umbrella of 5G technologies. This talk will elaborate on challenges of related radio and semiconductor technologies, and highlight architectural breakthroughs to enable next generation solutions for global connectivity.","PeriodicalId":366264,"journal":{"name":"2017 30th IEEE International System-on-Chip Conference (SOCC)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114806538","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Automated, inter-macro channel space adjustment and optimization for faster design closure 自动,宏间通道空间调整和优化,更快的设计关闭
2017 30th IEEE International System-on-Chip Conference (SOCC) Pub Date : 2017-09-01 DOI: 10.1109/SOCC.2017.8226010
Praveen Kumar, Alexander Fell, Sachin Mathur
{"title":"Automated, inter-macro channel space adjustment and optimization for faster design closure","authors":"Praveen Kumar, Alexander Fell, Sachin Mathur","doi":"10.1109/SOCC.2017.8226010","DOIUrl":"https://doi.org/10.1109/SOCC.2017.8226010","url":null,"abstract":"Achieving optimal floor-plans during the physical synthesis flow is an iterative and resource intensive process and its quality has a significant impact on subsequent synthesis stages in terms of runtime and quality of results. This problem intensifies due the abundance of macros in advance technology nodes which poses challenges in the physical design flow, especially in the floor-plan stage. It has resulted in an excessive number of channels among macros that need to be spaced carefully and optimized as they consume placement and routing resources. The work presented here is two-fold: First, a tool is introduced for automatic channel space adjustment. Second, the impact of channel space minimization on the quality of results along with runtimes are investigated. Experimental results for two complex partitions of a taped out design, Design-A and Design-B, each with 3M instances including 225 and 205 macros respectively, are presented. The results indicate an existence of an optimum channel spacing in which a 35% and 124% reduction in turn-around-time is observed with same or better quality of results, when compared to the taped out version of the same.","PeriodicalId":366264,"journal":{"name":"2017 30th IEEE International System-on-Chip Conference (SOCC)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122510896","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Wednesday keynote I: FDSOI and FINFET for SoC developments 周三主题演讲1:SoC发展中的FDSOI和FINFET
2017 30th IEEE International System-on-Chip Conference (SOCC) Pub Date : 2017-09-01 DOI: 10.1109/SOCC.2017.8225991
G. Teepe
{"title":"Wednesday keynote I: FDSOI and FINFET for SoC developments","authors":"G. Teepe","doi":"10.1109/SOCC.2017.8225991","DOIUrl":"https://doi.org/10.1109/SOCC.2017.8225991","url":null,"abstract":"FDSOI and FINFet use the same electrostatic principles for their transistor architectures: the conduction properties of a thin layer of undoped semiconductor material are influenced by an isolated gate. For the same layer thickness, FINFET has more drive current and higher packing densities and FDSOI, due to a buried back-gate, shows more design flexibility, can handle extremely low supply voltages and is more cost effective due to its planar structure. While FINFet enables a continuation of Moore's Law for performance applications like Computing and Network-Switching, FDSOI shows excellent results for applications in the Internet-of-Things-domain. GLOBALFOUNDRIES has presented a dual roadmap based on FINFet and on FDSOI. On the FINFet-side it has a 14nm-technology in production and a 7nm-technology in development. Also, GLOBALFOUNDRIES has the FDSOI-based 22FDX™-Technology in production, and 12FDX™ in development. The talk will outline the application areas for FINFet and FDSOI and give examples on how to use the back-gate bias for maximum design flexibility.","PeriodicalId":366264,"journal":{"name":"2017 30th IEEE International System-on-Chip Conference (SOCC)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129536744","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Selectable grained reconfigurable architecture (SGRA) and its design automation 可选择粒度的可重构体系结构(SGRA)及其设计自动化
2017 30th IEEE International System-on-Chip Conference (SOCC) Pub Date : 2017-09-01 DOI: 10.1109/SOCC.2017.8226035
Ryosuke Koike, Takashi Imagawa, R. Y. Omaki, H. Ochi
{"title":"Selectable grained reconfigurable architecture (SGRA) and its design automation","authors":"Ryosuke Koike, Takashi Imagawa, R. Y. Omaki, H. Ochi","doi":"10.1109/SOCC.2017.8226035","DOIUrl":"https://doi.org/10.1109/SOCC.2017.8226035","url":null,"abstract":"In this paper, we describe a Selectable Grained Reconfigurable Architecture (SGRA) in which each Configurable Logic Block can be configured to operate in either fine-grained or coarse-grained mode. Compared with the Mixed Grained Reconfigurable Architecture (MGRA), which has a fixed ratio of fine- and coarse-grained operation blocks and a heterogeneous floorplan, SGRA offers greater flexibility in the mapping and placement of functional units, thus reducing wasted wiring and improving the critical path delay. We also present an automated design flow for SGRA that is developed by customizing the Verilog-to-Routing (VTR) platform. Experimental results demonstrate that SGRA achieves, on average, a 13% reduction in circuit area over MGRA.","PeriodicalId":366264,"journal":{"name":"2017 30th IEEE International System-on-Chip Conference (SOCC)","volume":"78 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122536714","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Application of machine learning methods in post-silicon yield improvement 机器学习方法在后硅良率提高中的应用
2017 30th IEEE International System-on-Chip Conference (SOCC) Pub Date : 2017-09-01 DOI: 10.1109/SOCC.2017.8226049
B. Yigit, Grace Li Zhang, Bing Li, Yiyu Shi, Ulf Schlichtmann
{"title":"Application of machine learning methods in post-silicon yield improvement","authors":"B. Yigit, Grace Li Zhang, Bing Li, Yiyu Shi, Ulf Schlichtmann","doi":"10.1109/SOCC.2017.8226049","DOIUrl":"https://doi.org/10.1109/SOCC.2017.8226049","url":null,"abstract":"In nanometer scale manufacturing, process variations have a significant impact on circuit performance. To handle them, post-silicon clock tuning buffers can be included into the circuit to balance timing budgets of neighboring critical paths. The state of the art is a sampling-based approach, in which an integer linear programming (ILP) problem must be solved for every sample. The runtime complexity of this approach is the number of samples multiplied by the required time for an ILP solution. Existing work tries to reduce the number of samples but still leaves the problem of a long runtime unsolved. In this paper, we propose a machine learning approach to reduce the runtime by learning the positions and sizes of post-silicon tuning buffers. Experimental results demonstrate that we can predict buffer locations and sizes with a very good accuracy (90% and higher) and achieve a significant yield improvement (up to 18.8%) with a significant speed-up (up to almost 20 times) compared to existing work.","PeriodicalId":366264,"journal":{"name":"2017 30th IEEE International System-on-Chip Conference (SOCC)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121227948","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Propelling breakthrough embedded microprocessors by means of integrated photonics 利用集成光子学推动嵌入式微处理器的突破
2017 30th IEEE International System-on-Chip Conference (SOCC) Pub Date : 2017-09-01 DOI: 10.1109/SOCC.2017.8225981
D. Bertozzi, S. Rumley
{"title":"Propelling breakthrough embedded microprocessors by means of integrated photonics","authors":"D. Bertozzi, S. Rumley","doi":"10.1109/SOCC.2017.8225981","DOIUrl":"https://doi.org/10.1109/SOCC.2017.8225981","url":null,"abstract":"The tutorial aims to address electrical communications link limitations by developing chipscale, integrated photonic technology to enable seamless intrachip and off-chip photonic communications that provide the required bandwidth with low energy/bit. The emerging technology will exploit wavelength division multiplexing (WDM), allowing much higher bandwidth capacity per link, which is imperative to meeting the communication needs of future microprocessors. Such a capability would propel the microprocessor onto a new performance trajectory and impact the actual runtime performance of relevant computing tasks for power-starved embedded applications and supercomputing. The challenges in realizing optical interconnect technology are developing CMOS and DRAM-compatible photonic links that are spectrally broad, operate at high bit-rates with very low power dissipation, and are tightly integrated with electronic drivers. Ultimately, the goal of this tutorial is to demonstrate photonic technologies that can be integrated within embedded microprocessors and enable seamless, energy-efficient, high-capacity communications within and between the microprocessor and DRAM. It is envisioned that optical interconnect technology will be especially useful for those platforms where extreme performance coupled with low size, weight, and power is a necessity (e.g. UAVs, and satellites).","PeriodicalId":366264,"journal":{"name":"2017 30th IEEE International System-on-Chip Conference (SOCC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115172435","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Auto-SI: An adaptive reconfigurable processor with run-time loop detection and acceleration Auto-SI:具有运行时循环检测和加速的自适应可重构处理器
2017 30th IEEE International System-on-Chip Conference (SOCC) Pub Date : 2017-09-01 DOI: 10.1109/SOCC.2017.8226027
T. Harbaum, C. Schade, Marvin Damschen, Carsten Tradowsky, L. Bauer, J. Henkel, J. Becker
{"title":"Auto-SI: An adaptive reconfigurable processor with run-time loop detection and acceleration","authors":"T. Harbaum, C. Schade, Marvin Damschen, Carsten Tradowsky, L. Bauer, J. Henkel, J. Becker","doi":"10.1109/SOCC.2017.8226027","DOIUrl":"https://doi.org/10.1109/SOCC.2017.8226027","url":null,"abstract":"Modern computer architectures have an ever-increasing demand for performance, but are constrained in power dissipation and chip area. To tackle these demands, architectures with application-specific accelerators have gained traction in research and industry. While this is a very promising direction, hard-wired accelerators fall short when too many applications need to be supported or flexibility is required. In this paper, we propose an automatic loop detection and hardware acceleration approach for an adaptive reconfigurable processor. Our contribution is Auto-SI, an automated process that transparently and dynamically provides hardware acceleration alongside a general-purpose processor by employing reconfigurable hardware. We detail the benefits of Auto-SI, i.e., transparent and flexible acceleration of unmodified binaries, provide an analysis of the overheads incurred and present an evaluation of our implementation prototype.","PeriodicalId":366264,"journal":{"name":"2017 30th IEEE International System-on-Chip Conference (SOCC)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115804241","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
A 0.36pJ/bit, 17Gbps OOK receiver in 45-nm CMOS for inter and intra-chip wireless interconnects 一个0.36pJ/bit, 17Gbps的45纳米CMOS OOK接收器,用于芯片间和芯片内无线互连
2017 30th IEEE International System-on-Chip Conference (SOCC) Pub Date : 2017-09-01 DOI: 10.1109/SOCC.2017.8226023
Suryanarayanan Subramaniam, Tanmay Shinde, Padmanabh Deshmukh, Md Shahriar Shamim, Mark A. Indovina, A. Ganguly
{"title":"A 0.36pJ/bit, 17Gbps OOK receiver in 45-nm CMOS for inter and intra-chip wireless interconnects","authors":"Suryanarayanan Subramaniam, Tanmay Shinde, Padmanabh Deshmukh, Md Shahriar Shamim, Mark A. Indovina, A. Ganguly","doi":"10.1109/SOCC.2017.8226023","DOIUrl":"https://doi.org/10.1109/SOCC.2017.8226023","url":null,"abstract":"Wireless interconnects are capable of establishing energy-efficient intra and inter-chip data communications. This paper introduces a circuit level design of an energy-efficient millimeter-wave (mm-wave) non-coherent on-off keying (OOK) receiver suitable for such wireless interconnects in 45-nm CMOS process. The receiver consists of a simple two-stage common source structure based Low Noise Amplifier (LNA) and a source degenerated differential Envelope Detector (ED) followed by a Base Band (BB) amplifier stage. Operating at 60GHz, the proposed OOK receiver consumes only 6.1mW DC power from a 1V supply while providing a data rate of 17Gbps and a bit-energy efficiency of 0.36 pJ/bit.","PeriodicalId":366264,"journal":{"name":"2017 30th IEEE International System-on-Chip Conference (SOCC)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124133768","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
System-level simulator for process variation influenced synchronous and asynchronous NoCs 过程变化影响同步和异步noc的系统级模拟器
2017 30th IEEE International System-on-Chip Conference (SOCC) Pub Date : 2017-09-01 DOI: 10.1109/SOCC.2017.8226065
S. Muhammad, A. El-Moursy, M. El-Moursy, H. Hamed
{"title":"System-level simulator for process variation influenced synchronous and asynchronous NoCs","authors":"S. Muhammad, A. El-Moursy, M. El-Moursy, H. Hamed","doi":"10.1109/SOCC.2017.8226065","DOIUrl":"https://doi.org/10.1109/SOCC.2017.8226065","url":null,"abstract":"System-Level simulator is proposed to determine the ability of synchronous and asynchronous NoCs to alleviate the process variation effect. Throughput variation and different delay components variation are provided by the newly developed framework. System-Level simulation shows similarities with circuit-level simulation in terms of behavior and performance variation trend when moving from one technology node to another. Clock skew significantly degrades synchronous NoCs performance. Clock skew is more obvious with process variation. Despite the handshaking overhead, asynchronous NoC may be more immune to process variation than synchronous networks. PV-aware routing algorithm reduces the performance degradation to 8.3% and 11.4% for 45nm and 32nm asynchronous NoCs respectively. Using different traffic workloads and PV-unaware routing algorithm, synchronous networks lose on average 17.7% and 27.8% of nominal throughput for 45nm and 32nm technologies, respectively due to process variation. Whereas, asynchronous NoC throughput degradation is about 7.4% and 11.5% for 45nm and 32nm, respectively. In addition to technology scaling, NoC scaling also affects the throughput degradation. 256-core NoC shows the highest throughput degradation of 16% and 22% for asynchronous NoC for 45nm and 32nm technologies respectively.","PeriodicalId":366264,"journal":{"name":"2017 30th IEEE International System-on-Chip Conference (SOCC)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122911871","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
On the security evaluation of the ARM TrustZone extension in a heterogeneous SoC ARM TrustZone扩展在异构SoC中的安全性评估
2017 30th IEEE International System-on-Chip Conference (SOCC) Pub Date : 2017-09-01 DOI: 10.1109/SOCC.2017.8226018
E. M. Benhani, Cédric Marchand, A. Aubert, L. Bossuet
{"title":"On the security evaluation of the ARM TrustZone extension in a heterogeneous SoC","authors":"E. M. Benhani, Cédric Marchand, A. Aubert, L. Bossuet","doi":"10.1109/SOCC.2017.8226018","DOIUrl":"https://doi.org/10.1109/SOCC.2017.8226018","url":null,"abstract":"As the complexity of System-on-Chip (SoC) and the reuse of third party IP continues to grow, the security of a heterogeneous SoC has become a critical issue. In order to increase the software security of such SoC, the TrustZone technology has been proposed by ARM to enforce software security. Nevertheless, many SoC embed non-trusted third party Intellectual Property (IP) trying to take the benefits of this technology. In such case, is the security guaranteed by the ARM TrustZone technology reduced by the heterogeneity of SoC? In order to answer to this question, this paper presents relevant attack scenarios based on third party IP to exploit some security failures of the TrustZone extension through the all SoC. At the end, this article proposes to SoC designers to consider some design solutions to limit the impact of a malicious IP.","PeriodicalId":366264,"journal":{"name":"2017 30th IEEE International System-on-Chip Conference (SOCC)","volume":"59 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121649846","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 22
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