27th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2004.最新文献_第10页

Economic environment in Bulgaria for small enterprises in the electronics production sector 保加利亚的经济环境对电子生产部门的小企业有利

27th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2004. Pub Date : 2004-05-13 DOI: 10.1109/ISSE.2004.1490876

K. Dragostinov

引用次数: 0

An overview of information modelling for manufacturing systems 制造系统信息建模概述

27th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2004. Pub Date : 2004-05-13 DOI: 10.1109/ISSE.2004.1490372

Martin Molhanec

引用次数: 2

Some aspects on modeling and characterization of deep submicrometer CMOS gates driving lossless transmission lines 深亚微米CMOS栅极驱动无损传输线的建模与特性研究

27th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2004. Pub Date : 2004-05-13 DOI: 10.1109/ISSE.2004.1490416

D. Burdia, R. Bozomitu, C. Comsa

引用次数: 0

Investigation on butt-coupling of VCSEL into PCB integrated waveguides VCSEL与PCB集成波导对接耦合研究

27th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2004. Pub Date : 2004-05-13 DOI: 10.1109/ISSE.2004.1490399

P. Hormanski, K. Nieweglowski, K. Wolter, S. Patela

引用次数: 3

An adaptive approach for linearization of temperature sensor characteristics 温度传感器特性线性化的自适应方法

27th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2004. Pub Date : 2004-05-13 DOI: 10.1109/ISSE.2004.1490846

M. Marinov, S. Dimirtov, T. Djamiykov, M. Dontscheva

引用次数: 10

Application of numerical simulations for determination of thin film optical parameters 数值模拟在薄膜光学参数测定中的应用

27th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2004. Pub Date : 2004-05-13 DOI: 10.1109/ISSE.2004.1490450

T. Pencheva, M. Nenkov

引用次数: 0

Influence of trimming of resistive thick films on nonlinearity of their current vs. voltage characteristics 电阻厚膜修整对其电流电压特性非线性的影响

27th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2004. Pub Date : 2004-05-13 DOI: 10.1109/ISSE.2004.1490441

P. Mach, P. Svasta

引用次数: 2

Design of low power automotive interface 低功耗汽车接口设计

27th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2004. Pub Date : 2004-05-13 DOI: 10.1109/ISSE.2004.1490838

B. Donchev

引用次数: 4

Pulse width compensated resistive bridge algorithms 脉冲宽度补偿电阻桥算法

27th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2004. Pub Date : 2004-05-13 DOI: 10.1109/ISSE.2004.1490367

D. Mircea, C. Ioan, V. Liviu, P. Septimiu

{"title":"Pulse width compensated resistive bridge algorithms","authors":"D. Mircea, C. Ioan, V. Liviu, P. Septimiu","doi":"10.1109/ISSE.2004.1490367","DOIUrl":"https://doi.org/10.1109/ISSE.2004.1490367","url":null,"abstract":"A Wheatstone resistance bridge is modified, adding a capacitor and a switch. The switch allows alternately the charge and discharge of the capacitor through, respectively, the first and second resistors in the reference resistor branch. The command for the switch is a logical signal, with constant frequency and variable duty factor. The voltage on the capacitor is compared to the voltage generated by the bridge's measuring branch. The result is a square wave with its duty factor dependent on the unbalance of the bridge. The command signal duty factor is modified in such a way as to bring the comparator output duty factor to 0.5. This means that the bridge is balanced, and the duty factor of the command signal represents the transducer branch resistor ratio. When the transducer is located far away from the measuring point, long connection cables interfere with the measurement through both significant parasitic impedance and high noise susceptibility. The controller algorithm needs to allow, beside high resolution (precision) and reasonable balancing (measuring) time, noise attenuation and connection wires compensation. The adaptive algorithms have been tested by simulation. They can be easily implemented in a microcontroller program to build an embedded measuring system.","PeriodicalId":342004,"journal":{"name":"27th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2004.","volume":"89 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115162379","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

RDK - rapid development kit for mixed-signal systems 用于混合信号系统的快速开发工具包

27th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2004. Pub Date : 2004-05-13 DOI: 10.1109/ISSE.2004.1490870

J. Kampe, G. Scarbata, S. Arlt, U. Heiber, M. Ponca, A. Rummler, C. Wisser

{"title":"RDK - rapid development kit for mixed-signal systems","authors":"J. Kampe, G. Scarbata, S. Arlt, U. Heiber, M. Ponca, A. Rummler, C. Wisser","doi":"10.1109/ISSE.2004.1490870","DOIUrl":"https://doi.org/10.1109/ISSE.2004.1490870","url":null,"abstract":"The goal of evaluation platforms is design time and verification costs reduction, as these are the main parameters affecting time to market and final success of a product. The following article describes a new approach to prototyping of complex mixed-signal systems, suitable especially as a platform for system developers. Both digital and analog subsystems can be emulated within one development kit. The digital part is based on the ARM ASIC-Integrator Kit, targeting rapid development of embedded applications. Patented Electrically Programmable Analog Array (EPAA) acts as the part morphing the functionality of the analog subsystem. EPAA with fully parametrizable architecture allows either for transistor-level design of various analog function blocks, or reuse of pre-designed macros. In-field parameter adjustment and topology configuration designates the EPAA to be used in sensor and actor technology, or signal conditioning. Dedicated configuration software has been developed, allowing for various modi of device configuration, depending on the designer's experience and used abstraction level.","PeriodicalId":342004,"journal":{"name":"27th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2004.","volume":"81 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128227911","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0