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2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)最新文献

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SEU Characterization of the Microsemi PolarFire Field Programmable Gate Array Functional Blocks using Proton Irradiation Microsemi偏振火场可编程门阵列功能块的质子辐照SEU表征
2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC) Pub Date : 2021-07-01 DOI: 10.1109/NSREC45046.2021.9679336
Jacob Waskowic, D. Hiemstra, S. Shi, Li Chen
{"title":"SEU Characterization of the Microsemi PolarFire Field Programmable Gate Array Functional Blocks using Proton Irradiation","authors":"Jacob Waskowic, D. Hiemstra, S. Shi, Li Chen","doi":"10.1109/NSREC45046.2021.9679336","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679336","url":null,"abstract":"SEU cross-sections of certain functional blocks of the Microsemi PolarFire FPGA were tested under proton radiation. Suitability for a low earth radiation environment is considered.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"519 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123439986","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Thermal-to-high-energy neutron SEU characterization of commercial SRAMs 商用sram的热-高能中子SEU特性
2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC) Pub Date : 2021-07-01 DOI: 10.1109/NSREC45046.2021.9679344
A. Coronetti, R. G. Alía, M. Letiche, C. Cazzaniga, M. Kastriotou, M. Cecchetto, K. Biłko, P. Martín-Holgado
{"title":"Thermal-to-high-energy neutron SEU characterization of commercial SRAMs","authors":"A. Coronetti, R. G. Alía, M. Letiche, C. Cazzaniga, M. Kastriotou, M. Cecchetto, K. Biłko, P. Martín-Holgado","doi":"10.1109/NSREC45046.2021.9679344","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679344","url":null,"abstract":"Several commercial SRAMs have been tested by the CERN R2E project with neutrons of various energy. The test data are used to cross-compare facilities and to analyze variabilities within SRAMs from the same manufacturer. FIT for atmospheric and ground applications are provided as well as predictions for accelerator soft error rates.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125571054","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
SEE Test Results for SAMA5D3 参见SAMA5D3的测试结果
2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC) Pub Date : 2021-07-01 DOI: 10.1109/NSREC45046.2021.9679349
S. Guertin, Trevor Turchan, A. Daniel
{"title":"SEE Test Results for SAMA5D3","authors":"S. Guertin, Trevor Turchan, A. Daniel","doi":"10.1109/NSREC45046.2021.9679349","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679349","url":null,"abstract":"ARM processors power a class of high-performance, lower power system on a chip devices. In the absence of radiation effects, these devices are highly desirable for space use. The processor core architecture for ARM devices is licensed to provide computing on multiple hardware platforms. The A5 processor is in a unique pioneering space for providing detailed radiation response data to explore the baseline performance of these devices. These data can help set options for ARM processors and possibly impact design choices for the next generation of ARM fault tolerance capabilities. The SAMA5D3 was tested to establish general SEE performance for a relatively simple implementation of the ARM A5 core. This testing observed SRAM sensitivity starting at an LET of about 3 MeV-cm2/mg, with a saturated cross section of about 2×10-8cm2/bit, and this was determined by both active write and read of the caches, in addition to the use of a debugger to provide test results. Crash/SEFI data was collected using both Linux and bare metal C-code. The onset LET for crashes was about LET 1.5 MeV-cm2/mg, with saturated cross sections of about 2×10-5cm2 for bare metal (low utilization), and 2×10-4cm2 for Linux (high utilization) tests.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129254341","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
BJTs in Space: ELDRS Experiment on NASA Space Environment Testbed 空间BJTs: NASA空间环境试验台ELDRS实验
2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC) Pub Date : 2021-07-01 DOI: 10.1109/NSREC45046.2021.9679350
A. Benedetto, H. Barnaby, Cheyenne Cook, M. Campola, Anna Tender
{"title":"BJTs in Space: ELDRS Experiment on NASA Space Environment Testbed","authors":"A. Benedetto, H. Barnaby, Cheyenne Cook, M. Campola, Anna Tender","doi":"10.1109/NSREC45046.2021.9679350","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679350","url":null,"abstract":"Flight data on bipolar junction transistors (BJTs) are recorded and the effects of low dose rate space irradiation on BJTs are characterized, leading to results comparable to ground-based testing. Additionally, Gummel plots of mission data are compared for different experimental parameters.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122849810","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Single Event Latchup (SEL) and Single Event Upset (SEU) Evaluation of Xilinx 7nm Versal™ ACAP programmable logic (PL) Xilinx 7nm Versal™ACAP可编程逻辑(PL)的单事件锁定(SEL)和单事件中断(SEU)评估
2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC) Pub Date : 2021-07-01 DOI: 10.1109/NSREC45046.2021.9679343
P. Maillard, Yanran P. Chen, Jeff Barton, M. Voogel
{"title":"Single Event Latchup (SEL) and Single Event Upset (SEU) Evaluation of Xilinx 7nm Versal™ ACAP programmable logic (PL)","authors":"P. Maillard, Yanran P. Chen, Jeff Barton, M. Voogel","doi":"10.1109/NSREC45046.2021.9679343","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679343","url":null,"abstract":"this paper examines the single-event latchup (SEL) and single event upset (SEU) response of the Xilinx 7nm XCVC1902 ES1 Versal ACAP Programmable Logic irradiated with neutrons and 64 MeV protons sources. No SEL was observed in the entire Xilinx 7nm XCVC1092 for worst case conditions. Furthermore, The SEU response for single-event upsets on configuration RAM (CRAM) cells, block RAM (BRAM) and block RAM (BRAM) cells are provided.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"21 3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126945477","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Response of a 22FDX® Radiation-Hardened-by-Design Test Chip to TID and SEE 22FDX®辐射强化测试芯片对TID和SEE的响应
2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC) Pub Date : 2021-07-01 DOI: 10.1109/NSREC45046.2021.9679324
William Rice, Marlon Marquez, Tejinder Jaswal, Salvatore Caruso, Armando Rivera Gil
{"title":"Response of a 22FDX® Radiation-Hardened-by-Design Test Chip to TID and SEE","authors":"William Rice, Marlon Marquez, Tejinder Jaswal, Salvatore Caruso, Armando Rivera Gil","doi":"10.1109/NSREC45046.2021.9679324","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679324","url":null,"abstract":"A custom-designed test chip built on Global Foundries 22FDX® technology was investigated for its response to TID and SEE environments. While measurements of the performance for the technology in a first design match well with some reported results from prior testing, the use of a second custom radiation-hardened design demonstrated a significant 6x improvement in the per-bit cross section for a shift register test structure.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"89 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123959210","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Single Event Effects Testing of a Vertical Optocoupler with Unmodified Packaging 未修改封装的垂直光耦合器单事件效应测试
2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC) Pub Date : 2021-07-01 DOI: 10.1109/NSREC45046.2021.9679354
L. Ryder, Thomas A. Carstens, A. Phan, C. Seidlick, M. Campola
{"title":"Single Event Effects Testing of a Vertical Optocoupler with Unmodified Packaging","authors":"L. Ryder, Thomas A. Carstens, A. Phan, C. Seidlick, M. Campola","doi":"10.1109/NSREC45046.2021.9679354","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679354","url":null,"abstract":"Single event effects measurements were conducted on a ACPL-785E optocoupler at NASA Space Radiation Laboratory. Measurements with a periodic input signal show single event transients and a radiation-induced time delay of the output signal.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124084736","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Compendium of Radiation Effects Test Results from NASA Goddard Space Flight Center 美国宇航局戈达德太空飞行中心辐射效应试验结果汇编
2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC) Pub Date : 2021-07-01 DOI: 10.1109/NSREC45046.2021.9679325
Alyson D. Topper, M. Casey, E. Wilcox, M. Campola, Donna J. Cochran, M. O’Bryan, J. Pellish, Peter J. Majewicz
{"title":"Compendium of Radiation Effects Test Results from NASA Goddard Space Flight Center","authors":"Alyson D. Topper, M. Casey, E. Wilcox, M. Campola, Donna J. Cochran, M. O’Bryan, J. Pellish, Peter J. Majewicz","doi":"10.1109/NSREC45046.2021.9679325","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679325","url":null,"abstract":"Total ionizing dose, displacement damage dose, and single event effects testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include optoelectronics, digital, analog, and bipolar devices.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114436445","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Radiation Test Results of Total Ionizing Dose, Enhanced Low Dose Rate Sensitivity, and Neutron Displacement Damage for the Micropac JANSR4N49BU and JANSR4N49U Optocouplers Micropac JANSR4N49BU和JANSR4N49U光耦合器总电离剂量、增强低剂量率灵敏度和中子位移损伤的辐射测试结果
2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC) Pub Date : 2021-07-01 DOI: 10.1109/NSREC45046.2021.9679338
Yonghua Liu, Bob Spitzer, David Young, Mike Tsecouras, Bob Campanini
{"title":"Radiation Test Results of Total Ionizing Dose, Enhanced Low Dose Rate Sensitivity, and Neutron Displacement Damage for the Micropac JANSR4N49BU and JANSR4N49U Optocouplers","authors":"Yonghua Liu, Bob Spitzer, David Young, Mike Tsecouras, Bob Campanini","doi":"10.1109/NSREC45046.2021.9679338","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679338","url":null,"abstract":"This paper reports radiation test results of Total Ionizing Dose (TID) at High Dose Rate (HDR) and Enhanced Low Dose Rate Sensitivity (ELDRS), as well as neutron displacement damage (NDD) for the Micropac JANSR4N49BU and JANSR4N49U optocouplers.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123033534","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Heavy Ion and Proton Test Results for Recent-Generation GPUs 最新一代gpu的重离子和质子测试结果
2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC) Pub Date : 2021-07-01 DOI: 10.1109/NSREC45046.2021.9679339
I. Troxel, Justin J. Schaefer, Matthew Gruber, Daniel Sabogal, David Ellis, J. Schaf, Gates West
{"title":"Heavy Ion and Proton Test Results for Recent-Generation GPUs","authors":"I. Troxel, Justin J. Schaefer, Matthew Gruber, Daniel Sabogal, David Ellis, J. Schaf, Gates West","doi":"10.1109/NSREC45046.2021.9679339","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679339","url":null,"abstract":"Destructive SEE, proton-induced TID, and heavy ion and proton non-destructive SEE sensitivity characterization results are presented for recent-generation AMD and NVIDIA GPU SOCs.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124969763","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
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