Xilinx 7nm Versal™ACAP可编程逻辑(PL)的单事件锁定(SEL)和单事件中断(SEU)评估

2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC) Pub Date : 2021-07-01 DOI:10.1109/NSREC45046.2021.9679343

P. Maillard, Yanran P. Chen, Jeff Barton, M. Voogel

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引用次数: 4

摘要

本文研究了Xilinx 7nm XCVC1902 ES1 Versal ACAP可编程逻辑器件在中子和64mev质子源辐照下的单事件闭锁(SEL)和单事件扰动(SEU)响应。在最坏的情况下，在整个Xilinx 7nm XCVC1092中没有观察到SEL。此外，还提供了配置RAM (CRAM)单元、块RAM (BRAM)和块RAM (BRAM)单元上的单事件中断的SEU响应。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Single Event Latchup (SEL) and Single Event Upset (SEU) Evaluation of Xilinx 7nm Versal™ ACAP programmable logic (PL)

this paper examines the single-event latchup (SEL) and single event upset (SEU) response of the Xilinx 7nm XCVC1902 ES1 Versal ACAP Programmable Logic irradiated with neutrons and 64 MeV protons sources. No SEL was observed in the entire Xilinx 7nm XCVC1092 for worst case conditions. Furthermore, The SEU response for single-event upsets on configuration RAM (CRAM) cells, block RAM (BRAM) and block RAM (BRAM) cells are provided.

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2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)

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