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2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)最新文献

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SEL and TID Characterization of a CAES QCOTS 512Gb NAND Flash Nonvolatile Memory for Space Applications 用于空间应用的CAES QCOTS 512Gb NAND非易失性存储器的SEL和TID特性
2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC) Pub Date : 2021-07-01 DOI: 10.1109/NSREC45046.2021.9679329
M. Von Thun, P. Nelson, A. Turnbull, B. Baranski
{"title":"SEL and TID Characterization of a CAES QCOTS 512Gb NAND Flash Nonvolatile Memory for Space Applications","authors":"M. Von Thun, P. Nelson, A. Turnbull, B. Baranski","doi":"10.1109/NSREC45046.2021.9679329","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679329","url":null,"abstract":"Single Event Latch-up (SEL) and Total Ionizing Dose (TID) radiation characterization was performed on a CAES quantified-off-the-shelf (QCOTS) 512Gb 3D NAND flash memory. The device was shown to be suitable for space applications.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126626220","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A Low-Cost High Precision 2D Beam Scanning Device Based on a Consumer 3D Printer 一种基于消费级3D打印机的低成本高精度二维光束扫描装置
2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC) Pub Date : 2021-07-01 DOI: 10.1109/NSREC45046.2021.9679331
E. Cascio, B. Gottschalk
{"title":"A Low-Cost High Precision 2D Beam Scanning Device Based on a Consumer 3D Printer","authors":"E. Cascio, B. Gottschalk","doi":"10.1109/NSREC45046.2021.9679331","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679331","url":null,"abstract":"We describe a very low-cost high precision 2D beam scanning system, based on a consumer 3D printer, that is suitable for radiation beam size and uniformity quality assurance measurements.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122102475","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Heavy Ion Induced Single Event Effects Characterization of the XQE-0920 Commercial Off-the-shelf CMOS Photonic Imager Microcircuit XQE-0920商用现货CMOS光子成像仪微电路的重离子诱导单事件效应表征
2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC) Pub Date : 2021-07-01 DOI: 10.1109/NSREC45046.2021.9679348
R. Koga, S. Davis, A. Berman, D. Mabry
{"title":"Heavy Ion Induced Single Event Effects Characterization of the XQE-0920 Commercial Off-the-shelf CMOS Photonic Imager Microcircuit","authors":"R. Koga, S. Davis, A. Berman, D. Mabry","doi":"10.1109/NSREC45046.2021.9679348","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679348","url":null,"abstract":"We present observations of heavy ion induced single event effects on the XQE-0920 CMOS imager microcircuit. Pixel upsets as well as upsets accompanying a high level of bias current were observed.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"19 3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126108100","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
[Copyright notice] (版权)
2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC) Pub Date : 2021-07-01 DOI: 10.1109/nsrec45046.2021.9679323
{"title":"[Copyright notice]","authors":"","doi":"10.1109/nsrec45046.2021.9679323","DOIUrl":"https://doi.org/10.1109/nsrec45046.2021.9679323","url":null,"abstract":"","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131662257","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Total Dose Performance at High and Low Dose Rate of a CMOS, Low Dropout Voltage Regulator showing Enhanced Low Dose Rate Sensitivity 高剂量率和低剂量率下CMOS低差稳压器的总剂量性能，显示增强的低剂量率灵敏度
2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC) Pub Date : 2021-07-01 DOI: 10.1109/NSREC45046.2021.9679352
D. Hiemstra, S. Shi, Z. Yang, L. Chen
{"title":"Total Dose Performance at High and Low Dose Rate of a CMOS, Low Dropout Voltage Regulator showing Enhanced Low Dose Rate Sensitivity","authors":"D. Hiemstra, S. Shi, Z. Yang, L. Chen","doi":"10.1109/NSREC45046.2021.9679352","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679352","url":null,"abstract":"Results of Cobalt-60 irradiation of a CMOS low dropout voltage regulator at high and low dose rate are, presented. Hardness assurance implications due to observation of ELDRS for analog CMOS microcircuits are, discussed.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116021206","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Total Ionizing Dose and Single Event Effects Test Results of Texas Instruments LMK04832-SP (5962R1722701 VXC) 3.2 GHz JESD204B Clock Jitter Cleaner with 14 Outputs 美国德州仪器LMK04832-SP (5962R1722701 VXC) 3.2 GHz JESD204B时钟抖动清洁器14个输出的总电离剂量和单事件效应测试结果
2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC) Pub Date : 2021-07-01 DOI: 10.1109/NSREC45046.2021.9679340
K. Kruckmeyer, T. Trinh, Heriberto Castro, Aaron Black, Vibhu Vanjari, R. Gooty, Samantha Williams, Derek Payne
{"title":"Total Ionizing Dose and Single Event Effects Test Results of Texas Instruments LMK04832-SP (5962R1722701 VXC) 3.2 GHz JESD204B Clock Jitter Cleaner with 14 Outputs","authors":"K. Kruckmeyer, T. Trinh, Heriberto Castro, Aaron Black, Vibhu Vanjari, R. Gooty, Samantha Williams, Derek Payne","doi":"10.1109/NSREC45046.2021.9679340","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679340","url":null,"abstract":"The LMK04832-SP is a JESD204B compliant clock conditioner with integrated VCOs that can provide clock signals up to 3.2 GHz on up to 14 outputs. The device was tested for ELDRS and SEE and shown to be ELDRS-free, rated to 100 krad(Si) for low dose rate environments and SEL and SEFI immune. ELDRS, RLAT, MAAT, SEL, SEFI and SEU data are presented.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"97 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132173302","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
SEE and TID Evaluation of the ADC ADS8350 Using Proton Irradiation 质子辐照对ADC ADS8350的SEE和TID评价
2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC) Pub Date : 2021-07-01 DOI: 10.1109/NSREC45046.2021.9679334
S. Shi, D. Hiemstra, Z. Yang, L. Chen
{"title":"SEE and TID Evaluation of the ADC ADS8350 Using Proton Irradiation","authors":"S. Shi, D. Hiemstra, Z. Yang, L. Chen","doi":"10.1109/NSREC45046.2021.9679334","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679334","url":null,"abstract":"The susceptibility to both SEE and TID of the ADS8350 was tested using 105 MeV protons. No SEE was observed while the device failed at a TID of 25 krad (Si).","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"2014 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121560958","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Heavy Ion Single Event Effects (SEE) results for OPA128 Electrometer Grade Operational Amplifier 重离子单事件效应(SEE)对OPA128静电计级运算放大器的影响
2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC) Pub Date : 2021-07-01 DOI: 10.1109/NSREC45046.2021.9679341
S. L. Katz, J. Likar, Chi H. Pham, Dakai Chen, Natnael J. Ahmed
{"title":"Heavy Ion Single Event Effects (SEE) results for OPA128 Electrometer Grade Operational Amplifier","authors":"S. L. Katz, J. Likar, Chi H. Pham, Dakai Chen, Natnael J. Ahmed","doi":"10.1109/NSREC45046.2021.9679341","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679341","url":null,"abstract":"The OPA128 is an electrometer grade operational amplifier with femtoamp bias currents [1], potentially offering better performance than other rad-hard precision op amps available today [2], [3], [4], [5], [6]. Heavy ion testing to qualify it for use on the Europa Clipper mission uncovered a destructive failure not noted in prior testing [7], [8], [9], precipitating additional testing to explore the failure and determine the part's viability for spaceflight. Testing yielded a proposed safe operating area (SOA). Non-destructive transient events were also observed and characterized for multiple applications.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128491769","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Total Ionizing Dose Effects ofn-FinFET Transistor in iN14 Technology iN14技术中n- finfet晶体管的总电离剂量效应
2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC) Pub Date : 2021-07-01 DOI: 10.1109/NSREC45046.2021.9679337
L. Artola, T. Chiarella, T. Nuns, G. Cussac, J. Mitard
{"title":"Total Ionizing Dose Effects ofn-FinFET Transistor in iN14 Technology","authors":"L. Artola, T. Chiarella, T. Nuns, G. Cussac, J. Mitard","doi":"10.1109/NSREC45046.2021.9679337","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679337","url":null,"abstract":"This work presents the TID evaluation of iN14 technology developed by IMEC under gamma irradiations. The impacts of TID on electrical characteristics and on the transistor-to-transistor variability are presented for nFinFET for several gate lengths.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"135 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121366867","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Total Ionizing Dose and Heavy Ion Irradiation Test Results of $mu text{Module}$ Regulators $ text{Module}$调节器的总电离剂量和重离子辐照试验结果
2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC) Pub Date : 2021-07-01 DOI: 10.1109/NSREC45046.2021.9679328
B. Vermeire, D. L. Hansen
{"title":"Total Ionizing Dose and Heavy Ion Irradiation Test Results of $mu text{Module}$ Regulators","authors":"B. Vermeire, D. L. Hansen","doi":"10.1109/NSREC45046.2021.9679328","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679328","url":null,"abstract":"Total ionizing dose and heavy ion radiation test results are provided or two commercial $mu text{Module}$ regulators that have no comparable space-qualified equivalents. Results suggest that these parts may not be suitable for most missions.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132016969","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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