高剂量率和低剂量率下CMOS低差稳压器的总剂量性能，显示增强的低剂量率灵敏度

2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC) Pub Date : 2021-07-01 DOI:10.1109/NSREC45046.2021.9679352

D. Hiemstra, S. Shi, Z. Yang, L. Chen

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引用次数: 1

摘要

介绍了CMOS低差稳压器在高剂量率和低剂量率下的钴-60辐照结果。讨论了模拟CMOS微电路中ELDRS观测对硬度保证的影响。

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Total Dose Performance at High and Low Dose Rate of a CMOS, Low Dropout Voltage Regulator showing Enhanced Low Dose Rate Sensitivity

Results of Cobalt-60 irradiation of a CMOS low dropout voltage regulator at high and low dose rate are, presented. Hardness assurance implications due to observation of ELDRS for analog CMOS microcircuits are, discussed.

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2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)

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