{"title":"Radiation Evaluation of the Texas Instruments TPS7H4001-SP 18 Amps Buck Converter","authors":"J. Colon, T. Lew, N. Cunningham","doi":"10.1109/NSREC45046.2021.9679345","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679345","url":null,"abstract":"Heavy-ions single event effects on RHA Units with $mathbf{LET}_{mathbf{EFF}}$ of 49 to $75 mathbf{MeV}cdot mathbf{cm}^{2}/mathbf{mg}$, Total Ionizing Dose including LDR and HDR up to 100 krad(Si) and Neutron Displacement Damage (NDD) up to $1 mathrm{x}10^{13}mathbf{n}/mathbf{cm}^{2}$ are presented and discussed.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132777504","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Sergeh Vartanian, J. Yang-Scharlotta, G. Allen, A. Daniel, F. Mancoff, D. Symalla, Andy Olsen
{"title":"Single Event Effects Characterization of the ST-DDR4 Spin-transfer Torque Magnetoresistive Random Access Memory (STT-MRAM)","authors":"Sergeh Vartanian, J. Yang-Scharlotta, G. Allen, A. Daniel, F. Mancoff, D. Symalla, Andy Olsen","doi":"10.1109/NSREC45046.2021.9679326","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679326","url":null,"abstract":"We present single event effects (SEE) evaluation of the Everspin Technologies 1Gb non-volatile ST-DDR4 spin-transfer torque MRAM.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"-3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131843159","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Single Event Effects and Total Dose Performance at High and Low Dose Rate of a Switching Regulator","authors":"Z. Yang, D. Hiemstra, S. Shi, L. Chen","doi":"10.1109/NSREC45046.2021.9679356","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679356","url":null,"abstract":"Results of proton and low dose rate Cobalt-60 irradiation of a switching regulator are presented. Performance in the space radiation environment is discussed.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"58 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130479182","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
S. Davis, A. Yarbrough, R. Koga, A. Wright, J. Taggart, B. N. Davis
{"title":"The Aerospace Corporation's Compendium of Recent Radiation Testing Results","authors":"S. Davis, A. Yarbrough, R. Koga, A. Wright, J. Taggart, B. N. Davis","doi":"10.1109/NSREC45046.2021.9679347","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679347","url":null,"abstract":"Radiation testing was performed on several commercial components to determine the response of these components to the space radiation environment. Testing was performed mostly using low and high energy protons.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115465166","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
R. Logan, Sean Zargari, Einar Chua, Arturo Chua, Ba Cao, Justin J. Schaefer, Matthew Gruber, I. Troxel
{"title":"Radiation Test Results for DWDM Optical Transceiver for Aerospace Free-Space-Optical Datalinks","authors":"R. Logan, Sean Zargari, Einar Chua, Arturo Chua, Ba Cao, Justin J. Schaefer, Matthew Gruber, I. Troxel","doi":"10.1109/NSREC45046.2021.9679346","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679346","url":null,"abstract":"We present an evaluation of the effects of protons and heavy ions on high-speed hybrid dense wavelength-division-multiplexing (DWDM) optical transceiver modules designed for harsh aerospace environments. Heavy ion and proton results include SEFI and rare SEU events as well as proton-induced failures, at the module level, after ~18 krad(Si) of proton total dose. Failure analysis results and subsequent design modifications based on the proton test results are discussed, as well as path forward for future DWDM transceiver testing.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"117 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121395348","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Single-Event Effects Test Methodology for Precision SAR ADCs","authors":"J. Harris, L. Pearce, N. V. van Vonno, E. Thomson","doi":"10.1109/NSREC45046.2021.9679355","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679355","url":null,"abstract":"We describe a test methodology to adequately identify single event effects (SEE), namely single event transients (SET) and single event functional interrupts (SEFI) in precision SAR ADCs without user configurable registers.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127785177","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Guide to the 2020 IEEE Radiation Effects Data Workshop Record","authors":"D. Hiemstra","doi":"10.1109/NSREC45046.2021.9679342","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679342","url":null,"abstract":"The 2020 Workshop Record has been reviewed and a table prepared to facilitate the search for radiation response data by part number, type, or effect.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130571954","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
W. H. Newman, N. V. van Vonno, D. Wackley, L. Pearce, E. Thomson
{"title":"SEE and Total Dose Results of the ISL73033SLHM Dri-GaN Power Stage with 100V GaN FET","authors":"W. H. Newman, N. V. van Vonno, D. Wackley, L. Pearce, E. Thomson","doi":"10.1109/NSREC45046.2021.9679332","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679332","url":null,"abstract":"We report the single event performance and low dose rate results of the radiation-hardened ISL73033SLHM gate driver power stage with a 100V enhancement mode GaN FET in single package.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122241713","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}