W. H. Newman, N. V. van Vonno, D. Wackley, L. Pearce, E. Thomson
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SEE and Total Dose Results of the ISL73033SLHM Dri-GaN Power Stage with 100V GaN FET
We report the single event performance and low dose rate results of the radiation-hardened ISL73033SLHM gate driver power stage with a 100V enhancement mode GaN FET in single package.