Response of a 22FDX® Radiation-Hardened-by-Design Test Chip to TID and SEE

Abstract

A custom-designed test chip built on Global Foundries 22FDX® technology was investigated for its response to TID and SEE environments. While measurements of the performance for the technology in a first design match well with some reported results from prior testing, the use of a second custom radiation-hardened design demonstrated a significant 6x improvement in the per-bit cross section for a shift register test structure.