2021 IEEE 66th Holm Conference on Electrical Contacts (HLM)最新文献_第2页

The Influence of DC Household Electrical Appliances on Series Arc Fault Characteristics 直流家用电器对串联电弧故障特性的影响

2021 IEEE 66th Holm Conference on Electrical Contacts (HLM) Pub Date : 2021-10-24 DOI: 10.1109/HLM51431.2021.9671195

Silei Chen, Yuming Zhao, Yu Meng, Xingwen Li, Zhigang Zhao, Jinrong Yuan

{"title":"The Influence of DC Household Electrical Appliances on Series Arc Fault Characteristics","authors":"Silei Chen, Yuming Zhao, Yu Meng, Xingwen Li, Zhigang Zhao, Jinrong Yuan","doi":"10.1109/HLM51431.2021.9671195","DOIUrl":"https://doi.org/10.1109/HLM51431.2021.9671195","url":null,"abstract":"There are multiple kinds of sources and loads in dc microgrids, leading coupling system noise interferences to series arc fault signals. In order to meet load operation requirements of the proper voltage level and electrical energy form, multiple involved power electronic components would also have a significant influence on series arc fault characteristics. To guarantee the effective arc fault protection, series arc fault experiments and characteristic analysis are important to be conducted in this situation. At first, an experimental setup of a typical dc microgrid is designed with three voltage levels (750V, 400V, 48V) in this paper. Then the series arc fault electrical signals are acquired through three kinds of current sensors with different kinds of single dc household electrical appliance. Arc fault current profile would not show significant variations with some dc household electrical appliances such as a dc induction cooker. Next, the series arc fault current would display different behaviors due to the unique operation characteristic of household electrical appliances, resulting in arc fault detection difficulties. After processing the arc fault current through the time-frequency transformation, distribution patterns of arc fault information are summarized in another domain. Finally, normal operations of household electrical appliances are compared to understand differences between the system transitions and arc faults, which lays the foundation of the accurate arc fault detection.","PeriodicalId":338653,"journal":{"name":"2021 IEEE 66th Holm Conference on Electrical Contacts (HLM)","volume":"21 40","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114043815","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Numerical study of electrode vaporization rates in an Automotive HVDC Relay in hydrogen and open air in a short circuit situation 汽车高压直流继电器在氢气和空气中短路时电极汽化速率的数值研究

2021 IEEE 66th Holm Conference on Electrical Contacts (HLM) Pub Date : 2021-10-24 DOI: 10.1109/HLM51431.2021.9671143

Crispin Masahudu Ewuntomah, J. Oberrath

引用次数: 0

Research on a Calculation Method of Permanent Magnet for Balanced Force Relay based on Attractive-Counter Force Coordination Curve 基于吸引-反力协调曲线的平衡力继电器永磁体计算方法研究

2021 IEEE 66th Holm Conference on Electrical Contacts (HLM) Pub Date : 2021-10-24 DOI: 10.1109/HLM51431.2021.9671147

Ding Ding, Yu Qiao, Libing Shi, Chenglong Zhou, Rui Tu, G. Zhai

引用次数: 0

Surface Degradation of Electrical Connectors stressed by Multivariable Lifetime Tests 多变量寿命试验应力作用下电连接器的表面退化

2021 IEEE 66th Holm Conference on Electrical Contacts (HLM) Pub Date : 2021-10-24 DOI: 10.1109/HLM51431.2021.9671202

Philipp Kolmer, Markus Rojer, Jian Song, D. Schramm

引用次数: 1

The Impact of Plating on Equipotential Surfaces and Contact Resistance 电镀对等电位表面及接触电阻的影响

2021 IEEE 66th Holm Conference on Electrical Contacts (HLM) Pub Date : 2021-10-24 DOI: 10.1109/HLM51431.2021.9671232

R. Malucci

{"title":"The Impact of Plating on Equipotential Surfaces and Contact Resistance","authors":"R. Malucci","doi":"10.1109/HLM51431.2021.9671232","DOIUrl":"https://doi.org/10.1109/HLM51431.2021.9671232","url":null,"abstract":"It was found that equipotential surfaces, in layered contact systems of differing conductivities, can significantly change in shape as they pass across the layer boundary. Specifically, at the boundary a discontinuity in the equipotential surfaces was found using an image charge analysis from the electrostatic equivalent of a steady state current situation. These results provided a method to determine the shape in the layer as a function d/a and $sigma$, the layer thickness and conductivity respectively. It was found that the shape in the layer significantly changed when the ratio of plating to base metal conductivity increased above 1 $(sigma_{0}/sigma > 1)$. In this case, it is shown how the constriction resistance increases as the layer thickness increases. These results show a difference when compared to earlier work [1]. In addition, it is found that when the conductivity ratio falls below 1 $(sigma_{0}/sigma$ < 1), the change in shape is very small but still produces different results from the present authors previous work [1]. It is believed these results provide reasonable estimates for layered (plated) contact systems and that these results represent an improvement over earlier work.","PeriodicalId":338653,"journal":{"name":"2021 IEEE 66th Holm Conference on Electrical Contacts (HLM)","volume":"64 1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130884506","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Investigation of Switching Characteristics of Contact Materials for Inductive Load 感应负载触点材料开关特性研究

2021 IEEE 66th Holm Conference on Electrical Contacts (HLM) Pub Date : 2021-10-24 DOI: 10.1109/HLM51431.2021.9671176

Yubin He, Xu Zhang, W. Ren

引用次数: 0

Fast Numerical Algorithms for Arc Fault Detection 电弧故障检测的快速数值算法

2021 IEEE 66th Holm Conference on Electrical Contacts (HLM) Pub Date : 2021-10-24 DOI: 10.1109/HLM51431.2021.9671116

K. Wenzlaff, Deborah Luhnau, P. Schegner, M. Anheuser

引用次数: 1

Observations of peculiar break arc motion of AgSnO2 contacts under applied external magnetic field in inductive DC load conditions up to 20V-17A 20V-17A直流感应负载条件下外加磁场作用下AgSnO2触点奇特断弧运动的观察

2021 IEEE 66th Holm Conference on Electrical Contacts (HLM) Pub Date : 2021-10-24 DOI: 10.1109/HLM51431.2021.9671123

M. Hasegawa, S. Tokumitsu

{"title":"Observations of peculiar break arc motion of AgSnO2 contacts under applied external magnetic field in inductive DC load conditions up to 20V-17A","authors":"M. Hasegawa, S. Tokumitsu","doi":"10.1109/HLM51431.2021.9671123","DOIUrl":"https://doi.org/10.1109/HLM51431.2021.9671123","url":null,"abstract":"When AgSnO2 contacts were operated to break an inductive DC load circuit up to 20V-17A with contact opening speeds in the range from 1mm/s to 200mm/s under an applied external magnetic field of about B=120mT, apparent magnetic blowing phenomenon was not likely to be observed in the cases with slower opening speeds and smaller current levels. Even in such cases, break arc durations were slightly reduced. Observations of such non-blown-out arcs revealed that the arcs in those cases were likely to finally extinguish after moving in the direction opposite to the applied Lorentz force direction. When the direction of the applied magnetic field was reversed, the resultant non-blown-out break arcs extinguished also after moving in the direction opposite to the reversed Lorentz force direction, and confirmed not to be caused by gravity. In this paper, the magnet was disposed so that the Lorentz force was to be applied horizontally. The resultant non-blown-out arcs extinguished after moving in the direction opposite to the horizontal Lorentz force direction. Such peculiar arc behavior were repeatedly observed.","PeriodicalId":338653,"journal":{"name":"2021 IEEE 66th Holm Conference on Electrical Contacts (HLM)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124568144","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Research on the Influence of Different Electrode Materials on DC Arc Fault Detection Characteristics 不同电极材料对直流电弧故障检测特性影响的研究

2021 IEEE 66th Holm Conference on Electrical Contacts (HLM) Pub Date : 2021-10-24 DOI: 10.1109/HLM51431.2021.9671187

Jing Wang, Yu Meng, Xingwen Li, Silei Chen

{"title":"Research on the Influence of Different Electrode Materials on DC Arc Fault Detection Characteristics","authors":"Jing Wang, Yu Meng, Xingwen Li, Silei Chen","doi":"10.1109/HLM51431.2021.9671187","DOIUrl":"https://doi.org/10.1109/HLM51431.2021.9671187","url":null,"abstract":"With the application and promotion of renewable energies such as photovoltaics and wind power, DC power distribution systems have become a hot spot in the electrical field. The increasing DC system capacity and the increasingly complex system circuits have greatly increased the probability of DC arc faults, which makes it necessary to detect arc faults in time. Most researches usually studied arc faults based on copper electrodes according to the standard UL1699B. However, various cable materials would be used for different scenarios in DC systems. The characteristics may cause new interference to DC fault arc detection. In this paper, DC arc fault current and voltage waveforms based on different electrode materials are obtained from the DC arc fault experiment platform. First, differences among arc fault currents based on different materials are analyzed and compared from the perspective of time domain. The reason for differences in arc fault phenomenon based on different materials are also discussed. Then, the wavelet transform method is used to find differences of arc fault detection characteristics which are compared from the perspective of time-frequency domain. Finally, the influence of different materials on DC arc fault detection characteristics is summarized and relevant suggestions are made, which can help make the arc fault detection strategy more universal and applicable.","PeriodicalId":338653,"journal":{"name":"2021 IEEE 66th Holm Conference on Electrical Contacts (HLM)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129306803","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

Mitigation Schemes for the Reduction of Fretting Wear and Fatigue 减少微动磨损和疲劳的缓解方案

2021 IEEE 66th Holm Conference on Electrical Contacts (HLM) Pub Date : 2021-10-24 DOI: 10.1109/HLM51431.2021.9671166

Huai-Sheng Yang, I. Green

{"title":"Mitigation Schemes for the Reduction of Fretting Wear and Fatigue","authors":"Huai-Sheng Yang, I. Green","doi":"10.1109/HLM51431.2021.9671166","DOIUrl":"https://doi.org/10.1109/HLM51431.2021.9671166","url":null,"abstract":"Fretting refers to wear damage at the asperities of contacting surfaces. This damage is induced under load and in the presence of repeated relative surface motion. Fretting degrades the surface quality producing increased surface roughness and micropits and cracks, which reduces the fatigue strength of the components. Fretting occurs in many electrical connectors subject to motion (e.g. a printed circuit board connector). Commonly most board-to-board (B2B) electrical connectors are especially vulnerable if there is any relative motion present between the mating connectors. Contact fretting can change the electrical contact resistance of such connectors from milliohms to ohms when vibration is present. Fretting decreases fatigue strength of materials operating under cycling stress. This can result in fretting fatigue, whereby fatigue cracks can initiate in the fretting zone. Then, crack propagate into the material and may cause total elemental failure. Common mitigation strategies rely on adding lubricants to the contact, or making contacts of soft materials. However, such contacts are susceptible to entrapped wear debris. Here a different mitigation strategy is offered that is based on pre-stressing the contacting elements. To mitigate the damage during the fretting motion, two main properties are focused on: plastic strain and wear volume. The plastic strain represents the plastic deformation in the bulk material, which will decrease the life of the component. The wear volume represents the damage at the interface, which will also decrease the life of the component. It is found that pre-stressing may be beneficial for the suppression fretting fatigue, however, if excessive it may increase the plastic strain in the contact.","PeriodicalId":338653,"journal":{"name":"2021 IEEE 66th Holm Conference on Electrical Contacts (HLM)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117115856","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0