2021 IEEE 66th Holm Conference on Electrical Contacts (HLM)最新文献_第4页

Contact Resistance Prediction from Observed Image and Oxide Volume Analysis 从观测图像和氧化物体积分析预测接触电阻

2021 IEEE 66th Holm Conference on Electrical Contacts (HLM) Pub Date : 2021-10-24 DOI: 10.1109/HLM51431.2021.9671157

K. Mashimo, Atsushi Shimoyamada, H. Sasaki

引用次数: 1

The Influence of Coating Technology on Contact Resistance During Life Testing of Reed Switches 簧片开关寿命试验中涂层工艺对接触电阻的影响

2021 IEEE 66th Holm Conference on Electrical Contacts (HLM) Pub Date : 2021-10-24 DOI: 10.1109/HLM51431.2021.9670887

P. Lees, Eric Hafenstein, Joshua Koeppel, Tony Spies

引用次数: 0

Investigation of making process and associated contact bounce behaviors for alternating current contactor 交流接触器的制作工艺及其触点弹跳特性研究

2021 IEEE 66th Holm Conference on Electrical Contacts (HLM) Pub Date : 2021-10-24 DOI: 10.1109/HLM51431.2021.9671183

Chunen Yang, Zhe Zheng, W. Ren

引用次数: 0

[Copyright notice] (版权)

2021 IEEE 66th Holm Conference on Electrical Contacts (HLM) Pub Date : 2021-10-24 DOI: 10.1109/hlm51431.2021.9671089

引用次数: 0

Bus Bar Bolted Connections: Reliability and Testing 母线螺栓连接:可靠性和测试

2021 IEEE 66th Holm Conference on Electrical Contacts (HLM) Pub Date : 2021-10-24 DOI: 10.1109/HLM51431.2021.9671182

P. Slade

{"title":"Bus Bar Bolted Connections: Reliability and Testing","authors":"P. Slade","doi":"10.1109/HLM51431.2021.9671182","DOIUrl":"https://doi.org/10.1109/HLM51431.2021.9671182","url":null,"abstract":"Reliable bolted bus bar connections are necessary for the decades of life expected from them. This is especially true for bus bar systems in electric power stations where over 40 years life is the norm. A failure of a bolted connection can result in a substantial disruption of the power station's output and a major inconvenience to its customers. This paper discusses how best to make bolted connections between Al to Al, Al to Cu and Cu to Cu bus. The typical aging curve for a bolted joint is discussed. The advantages and disadvantages of infrared thermography and external joint temperature measurements as joint inspection tools are presented. The concept of bolted bus contact resistance is shown to be a reliable bolted joint inspection tool. It is shown that an increase of two times the original bolted joint's contact resistance is a reliable measure that a bolted connection is in the initial stages of failure. Experimental data for a poorly made bolted bus connection and well bolted busbar joints are presented to illustrate the importance of knowledge of this contact resistance increase in order to take timely corrective action. Finally, a straightforward method of regular inspection and maintenance of the bolted connection is presented.","PeriodicalId":338653,"journal":{"name":"2021 IEEE 66th Holm Conference on Electrical Contacts (HLM)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114886543","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Presentation of a novel and laboratory proved method to determine efficiently the minimum deionization time in hybrid circuit breaker 提出了一种新的、经实验室验证的确定混合式断路器最小去离子时间的方法

2021 IEEE 66th Holm Conference on Electrical Contacts (HLM) Pub Date : 2021-10-24 DOI: 10.1109/HLM51431.2021.9671107

Frederik Anspach, P. Vieth, D. Bösche, L. Claassen, Ernst-Dieter Wilkening, M. Kurrat

{"title":"Presentation of a novel and laboratory proved method to determine efficiently the minimum deionization time in hybrid circuit breaker","authors":"Frederik Anspach, P. Vieth, D. Bösche, L. Claassen, Ernst-Dieter Wilkening, M. Kurrat","doi":"10.1109/HLM51431.2021.9671107","DOIUrl":"https://doi.org/10.1109/HLM51431.2021.9671107","url":null,"abstract":"The application of hybrid circuit breakers (HCB) is possible in all voltage levels of DC-grids. For high voltage direct current transmission applications, HCBs are often equipped with commutation power electronics (PE). In low voltage grids, the use of commutation PEs is mostly avoided. Thus, a longer arcing process for commutation results from the mechanical circuit breaker to the PEs. As a result, a higher energy entry of the gas within the mechanical circuit breaker occurs. However, the components and the expenditure for the control unit is significantly reduced which is highly beneficial. This contribution presents a new method to optimize the deionization time of HCBs without commutation PEs for LVDC and MVDC-grids. They are applied to different test grids to show the opportunities of this technology. To ensure a relative fast switching time, a method to determine the minimum deionization time (DI) is developed and presented in order to avoid arc reignitions. This contribution shows the functionality of this method and discusses the efficiency varying different parameters.","PeriodicalId":338653,"journal":{"name":"2021 IEEE 66th Holm Conference on Electrical Contacts (HLM)","volume":" 843","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"113947028","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

Investigation of electrical chatter in bifurcated contact receptacles 分岔接触器电颤振的研究

2021 IEEE 66th Holm Conference on Electrical Contacts (HLM) Pub Date : 2021-07-01 DOI: 10.1109/HLM51431.2021.9671173

Benjamin G. Zastrow, R. Flicek, Kelsey M. Johnson, Karl A. Walczak, B. Pacini, Brianna Johnson, Christopher Schumann, Fadi Rafeedi

{"title":"Investigation of electrical chatter in bifurcated contact receptacles","authors":"Benjamin G. Zastrow, R. Flicek, Kelsey M. Johnson, Karl A. Walczak, B. Pacini, Brianna Johnson, Christopher Schumann, Fadi Rafeedi","doi":"10.1109/HLM51431.2021.9671173","DOIUrl":"https://doi.org/10.1109/HLM51431.2021.9671173","url":null,"abstract":"Electrical switches are often subjected to shock and vibration environments, which can result in sudden increases in the switch's electrical resistance, referred to as “chatter”. This paper describes experimental and numerical efforts to investigate the mechanism that causes chatter in a contact pair formed between a cylindrical pin and a bifurcated receptacle. First, the contact pair was instrumented with shakers, accelerometers, laser doppler vibrometers, a high speed camera, and a “chatter tester” that detects fluctuations in the contact's electrical resistance. Chatter tests were performed over a range of excitation amplitudes and frequencies, and high speed video from the tests suggested that “bouncing” (i.e. loss of contact) was the primary physical mechanism causing chatter. Structural dynamics models were then developed of the pin, receptacle, and contact pair, and corresponding modal experiments were performed for comparison and model validation. Finally, a high-fidelity solid mechanics model of the contact pair was developed to study the bouncing physics observed in the high speed videos. Chatter event statistics (e.g. mean chatter event duration) were used to compare the chatter behavior recorded during testing to the behavior simulated in the high-fidelity model, and this comparison suggested that the same bouncing mechanism is the cause of chatter in both scenarios.","PeriodicalId":338653,"journal":{"name":"2021 IEEE 66th Holm Conference on Electrical Contacts (HLM)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124991283","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Special Functions and HHL Quantum Algorithm for Solving Moving Boundary Value Problems Occurring in Electric Contact Phenomena 求解电接触现象中移动边值问题的特殊函数和HHL量子算法

2021 IEEE 66th Holm Conference on Electrical Contacts (HLM) Pub Date : 2020-10-04 DOI: 10.1109/HLM51431.2021.9671227

Merey M. Sarsengeldina, Z. Nashed

引用次数: 2