簧片开关寿命试验中涂层工艺对接触电阻的影响

P. Lees, Eric Hafenstein, Joshua Koeppel, Tony Spies
{"title":"簧片开关寿命试验中涂层工艺对接触电阻的影响","authors":"P. Lees, Eric Hafenstein, Joshua Koeppel, Tony Spies","doi":"10.1109/HLM51431.2021.9670887","DOIUrl":null,"url":null,"abstract":"Reed switches fail in one of two ways: the switch will fail to open when expected (stick) or it will fail to close when expected (miss). During life testing at rated power it was found that switches with plated contacts exhibited variable and gradually increasing contact resistance up to the first stick followed by very stable contact resistance after the first stick. For reed switches with sputtered contacts, variable and gradually decreasing contact resistance was observed up to the first stick followed by an abrupt increase in contact resistance which then stabilized. End of life failure analysis is used to explain these different behaviors.","PeriodicalId":338653,"journal":{"name":"2021 IEEE 66th Holm Conference on Electrical Contacts (HLM)","volume":"177 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"The Influence of Coating Technology on Contact Resistance During Life Testing of Reed Switches\",\"authors\":\"P. Lees, Eric Hafenstein, Joshua Koeppel, Tony Spies\",\"doi\":\"10.1109/HLM51431.2021.9670887\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Reed switches fail in one of two ways: the switch will fail to open when expected (stick) or it will fail to close when expected (miss). During life testing at rated power it was found that switches with plated contacts exhibited variable and gradually increasing contact resistance up to the first stick followed by very stable contact resistance after the first stick. For reed switches with sputtered contacts, variable and gradually decreasing contact resistance was observed up to the first stick followed by an abrupt increase in contact resistance which then stabilized. End of life failure analysis is used to explain these different behaviors.\",\"PeriodicalId\":338653,\"journal\":{\"name\":\"2021 IEEE 66th Holm Conference on Electrical Contacts (HLM)\",\"volume\":\"177 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-10-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 IEEE 66th Holm Conference on Electrical Contacts (HLM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/HLM51431.2021.9670887\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE 66th Holm Conference on Electrical Contacts (HLM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HLM51431.2021.9670887","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

簧片开关故障有两种方式:当预期的开关无法打开时(卡住),或者当预期的开关无法关闭时(错过)。在额定功率下的寿命测试中,我们发现带有镀触点的开关在第一个触点之前的接触电阻是可变的,并且逐渐增加,然后在第一个触点之后,接触电阻非常稳定。对于具有溅射触点的簧片开关,观察到直到第一杆接触电阻变化并逐渐减小,随后接触电阻突然增加,然后稳定下来。使用寿命终止失效分析来解释这些不同的行为。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The Influence of Coating Technology on Contact Resistance During Life Testing of Reed Switches
Reed switches fail in one of two ways: the switch will fail to open when expected (stick) or it will fail to close when expected (miss). During life testing at rated power it was found that switches with plated contacts exhibited variable and gradually increasing contact resistance up to the first stick followed by very stable contact resistance after the first stick. For reed switches with sputtered contacts, variable and gradually decreasing contact resistance was observed up to the first stick followed by an abrupt increase in contact resistance which then stabilized. End of life failure analysis is used to explain these different behaviors.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信