K. Wenzlaff, Deborah Luhnau, P. Schegner, M. Anheuser
{"title":"电弧故障检测的快速数值算法","authors":"K. Wenzlaff, Deborah Luhnau, P. Schegner, M. Anheuser","doi":"10.1109/HLM51431.2021.9671116","DOIUrl":null,"url":null,"abstract":"In (European) low-voltage networks, short circuits usually result in high current arc faults. These need to be cleared in a very short time since arcs cause large damages to adjacent equipment and present persons, mainly due to their high temperatures. Today, optical systems are used to ensure fast detection of arcing faults. In this paper, novel methods will be proposed for arc fault detection based on the measurement of current and voltage. Compared to optical systems, the proposed method shows a high performance.","PeriodicalId":338653,"journal":{"name":"2021 IEEE 66th Holm Conference on Electrical Contacts (HLM)","volume":"91 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Fast Numerical Algorithms for Arc Fault Detection\",\"authors\":\"K. Wenzlaff, Deborah Luhnau, P. Schegner, M. Anheuser\",\"doi\":\"10.1109/HLM51431.2021.9671116\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In (European) low-voltage networks, short circuits usually result in high current arc faults. These need to be cleared in a very short time since arcs cause large damages to adjacent equipment and present persons, mainly due to their high temperatures. Today, optical systems are used to ensure fast detection of arcing faults. In this paper, novel methods will be proposed for arc fault detection based on the measurement of current and voltage. Compared to optical systems, the proposed method shows a high performance.\",\"PeriodicalId\":338653,\"journal\":{\"name\":\"2021 IEEE 66th Holm Conference on Electrical Contacts (HLM)\",\"volume\":\"91 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-10-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 IEEE 66th Holm Conference on Electrical Contacts (HLM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/HLM51431.2021.9671116\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE 66th Holm Conference on Electrical Contacts (HLM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HLM51431.2021.9671116","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
In (European) low-voltage networks, short circuits usually result in high current arc faults. These need to be cleared in a very short time since arcs cause large damages to adjacent equipment and present persons, mainly due to their high temperatures. Today, optical systems are used to ensure fast detection of arcing faults. In this paper, novel methods will be proposed for arc fault detection based on the measurement of current and voltage. Compared to optical systems, the proposed method shows a high performance.
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