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Proceedings IEEE Southeastcon '95. Visualize the Future最新文献

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Electronic design automation in undergraduate digital system curriculum 本科数字系统课程中的电子设计自动化
Proceedings IEEE Southeastcon '95. Visualize the Future Pub Date : 1995-03-26 DOI: 10.1109/SECON.1995.513118
A. Ojha
{"title":"Electronic design automation in undergraduate digital system curriculum","authors":"A. Ojha","doi":"10.1109/SECON.1995.513118","DOIUrl":"https://doi.org/10.1109/SECON.1995.513118","url":null,"abstract":"Digital Electronic Design Automation (EDA) tools have seen a remarkable improvement over the last decade. In addition to providing good documentation, their ability to simulate a design provides immense convenience in optimizing a design and in examining what-if scenarios which would otherwise be very time-consuming, expensive, and even impossible using hardware. This paper begins with an overview of EDA tools and related issues. Next, it discusses the implementation of an EDA laboratory established with funding from the National Science Foundation. Details of four experiments and an evaluation of the EDA tools used in the undergraduate curriculum have been presented.","PeriodicalId":334874,"journal":{"name":"Proceedings IEEE Southeastcon '95. Visualize the Future","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-03-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121392359","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Two data organizations that support automatic computer troubleshooting with a signature analyzer 两个数据组织，支持自动计算机故障排除与签名分析器
Proceedings IEEE Southeastcon '95. Visualize the Future Pub Date : 1995-03-26 DOI: 10.1109/SECON.1995.513094
S. Chatterjee, D.L. Smith
{"title":"Two data organizations that support automatic computer troubleshooting with a signature analyzer","authors":"S. Chatterjee, D.L. Smith","doi":"10.1109/SECON.1995.513094","DOIUrl":"https://doi.org/10.1109/SECON.1995.513094","url":null,"abstract":"One organization supports files; the other supports data in memory. Two utility programs were written in the C programming language that use the organizations. One program supports entering data into a file through the keyboard; the other utility reads the file, stores the data in memory, and gives the user the option of printing some of the data to a file in a format similar to signature analysis tables.","PeriodicalId":334874,"journal":{"name":"Proceedings IEEE Southeastcon '95. Visualize the Future","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-03-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125233206","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Tunable time delay neural networks for isolated word recognition 用于孤立词识别的可调时滞神经网络
Proceedings IEEE Southeastcon '95. Visualize the Future Pub Date : 1995-03-26 DOI: 10.1109/SECON.1995.513088
Duanpei Wu, J. Gowdy
{"title":"Tunable time delay neural networks for isolated word recognition","authors":"Duanpei Wu, J. Gowdy","doi":"10.1109/SECON.1995.513088","DOIUrl":"https://doi.org/10.1109/SECON.1995.513088","url":null,"abstract":"Describes a new neural network structure and a corresponding new sequential training technique for speech recognition. The proposed system is a modification of the original time delay neural network (TDNN) structure of Waibel et al. [1989]. The new structure consists of a group of sub-nets, and each isolated word or phoneme to be recognized corresponds to one sub-net. Since each sub-net deals with only one recognition unit, it may be trained independently. Each sub-net is a TDNN which the authors train with a new sequential training algorithm. The system has attained close to 100% accuracy for a multi-speaker, isolated word recognition task and 86.44% accuracy for a three voiced-stop-consonants (\"B\", \"D\" and \"G\"), speaker-independent phoneme recognition task. Results for phoneme recognition compared favorably with the best result obtained by Bryant [1992] using Sawai's block windowed neural network architecture with improvement by 14.44% for the same task.","PeriodicalId":334874,"journal":{"name":"Proceedings IEEE Southeastcon '95. Visualize the Future","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-03-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130382838","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Microprocessor control of mechanical systems 用微处理器控制机械系统
Proceedings IEEE Southeastcon '95. Visualize the Future Pub Date : 1995-03-26 DOI: 10.1109/SECON.1995.513129
E. Ososanya, J. Saint Joseph
{"title":"Microprocessor control of mechanical systems","authors":"E. Ososanya, J. Saint Joseph","doi":"10.1109/SECON.1995.513129","DOIUrl":"https://doi.org/10.1109/SECON.1995.513129","url":null,"abstract":"Real-time embedded microprocessor applications are growing in number, and so is our dependance on them. Such applications require the microprocessor to respond to external events within prescribed deadlines. This paper describes the full implementation of a low-cost real-time digital system, where a PC or single board computer is used in a dedicated application to monitor and control mechanical equipment. The instrumentation chosen as prototypes in this presentation are simple motor stands (DC servomotor, stepper motor), and thermal systems; these are fairly generic to other control problems.","PeriodicalId":334874,"journal":{"name":"Proceedings IEEE Southeastcon '95. Visualize the Future","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-03-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133715944","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Dysfunction correction by objectives replanning in the robotics applications 机器人应用中目标重规划的功能障碍矫正
Proceedings IEEE Southeastcon '95. Visualize the Future Pub Date : 1995-03-26 DOI: 10.1109/SECON.1995.513079
H. Trad, C. Braesch
{"title":"Dysfunction correction by objectives replanning in the robotics applications","authors":"H. Trad, C. Braesch","doi":"10.1109/SECON.1995.513079","DOIUrl":"https://doi.org/10.1109/SECON.1995.513079","url":null,"abstract":"A multi-expert conducting system for robotics applications is presented. The authors identify two types of experts whose conducting approach is guided by specific objectives issued from the global application objectives. The authors then expose the organisation of the execution components i.e. command primitives and returned data, in relation to the experts' objectives. An exhaustive definition of the actions and of universe states of the replanning models is given. The authors describe a correction approach based on the execution equivalencies of the model actions.","PeriodicalId":334874,"journal":{"name":"Proceedings IEEE Southeastcon '95. Visualize the Future","volume":"67 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-03-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121017946","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
An application of physics-based statistics in electrical engineering 基于物理的统计学在电气工程中的应用
Proceedings IEEE Southeastcon '95. Visualize the Future Pub Date : 1995-03-26 DOI: 10.1109/SECON.1995.513084
W. P. Wheless, T. Lehman
{"title":"An application of physics-based statistics in electrical engineering","authors":"W. P. Wheless, T. Lehman","doi":"10.1109/SECON.1995.513084","DOIUrl":"https://doi.org/10.1109/SECON.1995.513084","url":null,"abstract":"The most widely accepted and used definition of probability is the relative-frequency definition. Strict adherence to this interpretation of probability requires the empirical development of statistical models from measured data. Using this definition of probability usually results in statistical models that are adequate for predicting the occurrence of the most common events, i.e., events near the mean. However, experience has shown that the resulting statistical models are often not adequate for predicting the occurrence of rare or extreme events, for which little or no data exist. In electrical engineering and the other physical sciences, an alternative approach exists for developing the statistical models. This approach is predicated on the existence of valid deterministic models of the phenomena or interaction of interest. The statistical models are derived from the deterministic models by making assumptions about the behavior of the parameters in the deterministic models. Physics-based statistical modeling can be applied to derive both strength and stress distributions. In the present paper, a strength example is developed-the thermal failure of semiconductor devices subjected to electrical overstress. Typical comparisons of predicted failure, based on the derived distributions, to measured data are presented.","PeriodicalId":334874,"journal":{"name":"Proceedings IEEE Southeastcon '95. Visualize the Future","volume":"50 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-03-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114884099","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Dynamic processor assignment in a task system with time-varying load 时变负载任务系统中的动态处理器分配
Proceedings IEEE Southeastcon '95. Visualize the Future Pub Date : 1995-03-26 DOI: 10.1109/SECON.1995.513106
A. Brunstrom, R. Simha
{"title":"Dynamic processor assignment in a task system with time-varying load","authors":"A. Brunstrom, R. Simha","doi":"10.1109/SECON.1995.513106","DOIUrl":"https://doi.org/10.1109/SECON.1995.513106","url":null,"abstract":"In many applications a task is repeatedly executed on several sets of data in a pipeline fashion. For example, image processing software is frequently executed on a sequence of images. Due to varying semantic content in the data, each subtask of the overall task may experience variations in execution time for different instances of the data. The authors consider the problem of efficiently executing a task on a large parallel machine. In particular, they focus on dynamically assigning processors to subtasks in response to changing workloads seen by the subtasks. They present several processor assignment algorithms and study their performance through simulation. The simulation study is based on an application in computer vision. The results suggest dynamic re-assignment can perform very close to the theoretical optimum and distinctly better than static assignments.","PeriodicalId":334874,"journal":{"name":"Proceedings IEEE Southeastcon '95. Visualize the Future","volume":"1992 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-03-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128606741","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A finite-element approach to the development of a general purpose microelectronic device simulator 用有限元方法开发通用微电子器件模拟器
Proceedings IEEE Southeastcon '95. Visualize the Future Pub Date : 1995-03-26 DOI: 10.1109/SECON.1995.513064
Changling Sung, F. Ho
{"title":"A finite-element approach to the development of a general purpose microelectronic device simulator","authors":"Changling Sung, F. Ho","doi":"10.1109/SECON.1995.513064","DOIUrl":"https://doi.org/10.1109/SECON.1995.513064","url":null,"abstract":"Using finite element methods a general purpose two-dimensional microelectronic device simulator is developed. The Newton method is used to linearize the semiconductor equations, which are solved simultaneously by a sparse matrix solver. This simulator can do the modeling for MOSFETs, BJTs, EEPROM transistors, and some other microelectronic devices.","PeriodicalId":334874,"journal":{"name":"Proceedings IEEE Southeastcon '95. Visualize the Future","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-03-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131044607","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A numerical model for BJTs from liquid-nitrogen temperature to room temperature 液氮温度至室温下bjt的数值模型
Proceedings IEEE Southeastcon '95. Visualize the Future Pub Date : 1995-03-26 DOI: 10.1109/SECON.1995.513098
Fan Jon Tseng, F. Ho
{"title":"A numerical model for BJTs from liquid-nitrogen temperature to room temperature","authors":"Fan Jon Tseng, F. Ho","doi":"10.1109/SECON.1995.513098","DOIUrl":"https://doi.org/10.1109/SECON.1995.513098","url":null,"abstract":"It has previously been reported that the Boltzmann statistics approximation as applied to MOSFETs at low-temperature yields a result very close to that of the approach following Fermi-Dirac statistics. However, by using the Boltzmann statistics approximation, results are obtained in less CPU-time than using Fermi-Dirac statistics. The present paper presents a simulation program for modeling the behavior of a bipolar junction transistor (BJT) operating under temperatures ranging from room temperature (300/spl deg/K) down to liquid nitrogen temperature (77/spl deg/K). Numerical methods for the simulation are outlined. The Boltzmann statistics approximation is applied in most of the cases. The simulation results of Boltzmann statistics are illustrated along with the case that assuming 100% ionization.","PeriodicalId":334874,"journal":{"name":"Proceedings IEEE Southeastcon '95. Visualize the Future","volume":"424 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-03-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114267320","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
2-D weighted impulse response Gramians and model reduction of 2-D separable denominator digital systems 二维可分分母数字系统的二维加权脉冲响应谱和模型约简
Proceedings IEEE Southeastcon '95. Visualize the Future Pub Date : 1995-03-26 DOI: 10.1109/SECON.1995.513115
Chengshan Xiao
{"title":"2-D weighted impulse response Gramians and model reduction of 2-D separable denominator digital systems","authors":"Chengshan Xiao","doi":"10.1109/SECON.1995.513115","DOIUrl":"https://doi.org/10.1109/SECON.1995.513115","url":null,"abstract":"The weighted impulse response Gramians of two-dimensional (2-D) separable denominator digital systems are defined based on the definition proposed by Sreeram and Agathoklis (1991, 1993) for the 1-D case. These Gramians are then applied to present a model reduction method for such 2-D systems. The reduced-order system is always stable if the original 2-D system is stable. A numerical example is illustrated and compared with well known 2-D model reduction method.","PeriodicalId":334874,"journal":{"name":"Proceedings IEEE Southeastcon '95. Visualize the Future","volume":"101 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-03-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114225604","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
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