NAECON 2014 - IEEE National Aerospace and Electronics Conference最新文献

Detection probability of automotive radars using maximum length sequences to suppress interference from nearby radars 利用最大长度序列抑制附近雷达干扰的汽车雷达检测概率

NAECON 2014 - IEEE National Aerospace and Electronics Conference Pub Date : 2014-06-24 DOI: 10.1109/NAECON.2014.7045843

H. Kato, Takehiko Kobayashi

引用次数: 5

Effects of non-ionizing radiation on a 130 nm CMOS SRAM for low earth orbit applications 非电离辐射对近地轨道130nm CMOS SRAM的影响

NAECON 2014 - IEEE National Aerospace and Electronics Conference Pub Date : 2014-06-24 DOI: 10.1109/NAECON.2014.7045835

Christopher I. Allen, J. Petrosky, P. L. Orlando

引用次数: 2

Demonstration of whispering-gallery-mode resonant enhancement of optical forces 光学力的低语走廊模式共振增强演示

NAECON 2014 - IEEE National Aerospace and Electronics Conference Pub Date : 2014-06-24 DOI: 10.1109/NAECON.2014.7045777

Yangcheng Li, A. Maslov, N. Limberopoulos, V. Astratov

引用次数: 2

Optimizing surface plasmonic structures for high infrared photodetector enhancement 优化高红外光电探测器表面等离子体结构

NAECON 2014 - IEEE National Aerospace and Electronics Conference Pub Date : 2014-06-24 DOI: 10.1109/NAECON.2014.7045781

Guiru Gu, Lin Li, Xuejun Lu

引用次数: 0

No-reference objective blur metric based on the notion of wavelet gradient, magnitude edge width 基于小波梯度概念的无参考物镜模糊度量，大小边缘宽度

NAECON 2014 - IEEE National Aerospace and Electronics Conference Pub Date : 2014-06-24 DOI: 10.1109/NAECON.2014.7045788

Soundararajan Ezekiel, K. Harrity, M. Alford, Erik Blasch, D. Ferris, A. Bubalo

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引用次数: 5

Qualifying pixels for attributed scattering center extraction 限定像素用于属性散射中心提取

NAECON 2014 - IEEE National Aerospace and Electronics Conference Pub Date : 2014-06-24 DOI: 10.1109/NAECON.2014.7045818

J. Farmer, M. Saville

引用次数: 1

THz on-wafer calibration using offset-shorts and known through as standards 太赫兹在晶圆上的校准使用偏移短路，并通过称为标准

NAECON 2014 - IEEE National Aerospace and Electronics Conference Pub Date : 2014-06-24 DOI: 10.1109/NAECON.2014.7045823

C. Caglayan, G. Trichopoulos, K. Sertel

引用次数: 0

Gate-level commercial microelectronics verification with standard cell recognition 门级商业微电子验证与标准细胞识别

NAECON 2014 - IEEE National Aerospace and Electronics Conference Pub Date : 2014-06-24 DOI: 10.1109/NAECON.2014.7045839

L. A. Hsia, M. Lanzerotti, M. Seery, L. Orlando

引用次数: 1

Photonic jets for strained-layer superlattice infrared photodetector enhancement 应变层超晶格红外探测器增强中的光子射流

NAECON 2014 - IEEE National Aerospace and Electronics Conference Pub Date : 2014-06-24 DOI: 10.1109/NAECON.2014.7045770

K. Allen, J. Duran, G. Ariyawansa, J. Vella, N. Limberopoulos, A. Urbas, V. Astratov

引用次数: 15

Utilization of keyboard dynamics for unique identification of human users 利用键盘动态的唯一识别人类用户

NAECON 2014 - IEEE National Aerospace and Electronics Conference Pub Date : 2014-06-24 DOI: 10.1109/NAECON.2014.7045794

Tyler Highlander, Dale Bassett, Derek Boone

引用次数: 4