门级商业微电子验证与标准细胞识别

NAECON 2014 - IEEE National Aerospace and Electronics Conference Pub Date : 2014-06-24 DOI:10.1109/NAECON.2014.7045839

L. A. Hsia, M. Lanzerotti, M. Seery, L. Orlando

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引用次数: 1

摘要

DARPA TRUST计划的建立是为了满足验证集成电路(ic)的需求。本文探讨了在商业软件的先前应用中解决IC设计冲突的方法，以验证尺寸从1到283,359个单元的设计。初步结果显示商业软件工具能够生成用于评估的测试用例。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Gate-level commercial microelectronics verification with standard cell recognition

The DARPA TRUST program was established to address the need to verify integrated circuits (ICs). This paper explores methodologies to resolve conflicts among IC designs in prior applications of commercial software to verify designs ranging in size from 1 to 283,359 cells. Preliminary results show the capability of commercial software tools to generate test cases for evaluation.

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NAECON 2014 - IEEE National Aerospace and Electronics Conference

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