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2019 MIXDES - 26th International Conference "Mixed Design of Integrated Circuits and Systems"最新文献

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A Delta-Sigma Modulator with UPWM Quantizer for Digital Audio Class-D Amplifier 用于数字音频d类放大器的带UPWM量化器的Delta-Sigma调制器
2019 MIXDES - 26th International Conference "Mixed Design of Integrated Circuits and Systems" Pub Date : 2019-06-01 DOI: 10.23919/MIXDES.2019.8787135
Chien-Hung Kuo, Y. Liou
{"title":"A Delta-Sigma Modulator with UPWM Quantizer for Digital Audio Class-D Amplifier","authors":"Chien-Hung Kuo, Y. Liou","doi":"10.23919/MIXDES.2019.8787135","DOIUrl":"https://doi.org/10.23919/MIXDES.2019.8787135","url":null,"abstract":"In this paper, a delta-sigma modulator (DSM) with uniform pulse-width modulation (UPWM) quantizer for digital audio class-D power amplifier is presented. A pole-moving approach for Inverse Chebyshev filters is proposed to stabilize the UPWM modulator as well as improve its performance. The characteristics of the saw-tooth carrier for UPWM quantizer is explored to reduce the output switching rate and the power loss in class-D amplifier in the pulse-density modulation (PDM) case. In the presented single-loop sixth-order UPWM modulator with the ameliorated saw-tooth carrier, an SNDR of 120 dB within 20-kHz bandwidth can be achieved under full-scale signal input. With the proposed schemes, the highest transfer efficiency of 1 for digital class-D amplifier can also be obtained.","PeriodicalId":309822,"journal":{"name":"2019 MIXDES - 26th International Conference \"Mixed Design of Integrated Circuits and Systems\"","volume":"96 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122579810","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Recognition of Atrial Fibrilation Episodes in Heart Rate Variability Signals Using a Machine Learning Approach 使用机器学习方法识别心率变异性信号中的房颤发作
2019 MIXDES - 26th International Conference "Mixed Design of Integrated Circuits and Systems" Pub Date : 2019-06-01 DOI: 10.23919/MIXDES.2019.8787048
K. Horoba, R. Czabański, J. Wrobel, A. Matonia, R. Martínek, T. Kupka, R. Kahankova, J. Leski, S. Graczyk
{"title":"Recognition of Atrial Fibrilation Episodes in Heart Rate Variability Signals Using a Machine Learning Approach","authors":"K. Horoba, R. Czabański, J. Wrobel, A. Matonia, R. Martínek, T. Kupka, R. Kahankova, J. Leski, S. Graczyk","doi":"10.23919/MIXDES.2019.8787048","DOIUrl":"https://doi.org/10.23919/MIXDES.2019.8787048","url":null,"abstract":"Atrial fibrillation (AF) is the most common heart arrhythmia. Asymptomatic (silent) AF may be recognized during long term monitoring of the heart rate (HR) variability. The HR variability features are widely used for detection of AF. Automated classification of heart beats into AF and non-AF presented in this paper was carried out with a help of the Lagrangian Support Vector Machine. The classifier input vector included five beat-to-beat interval measures, seven adult’s HR variability parameters, and four features taken from the analysis of the fetal heart rate as being characterized by high sensitivity to changes in subsequent intervals. The performance of the improved AF detection method was examined using the MIT-BIH Atrial Fibrillation Database, which includes 25 ten-hour ECG recordings. Results obtained during the classifier testing phase showed the sensitivity 95.91%, specificity 92.59%, positive predictive value 90.56%, negative predictive value 96.83%, and classification accuracy 94.00%.","PeriodicalId":309822,"journal":{"name":"2019 MIXDES - 26th International Conference \"Mixed Design of Integrated Circuits and Systems\"","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122010923","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Configurable MBIST Processor for Embedded Memories Testing 嵌入式存储器测试的可配置MBIST处理器
2019 MIXDES - 26th International Conference "Mixed Design of Integrated Circuits and Systems" Pub Date : 2019-06-01 DOI: 10.23919/MIXDES.2019.8787161
Andrzej A. Wojciechowski, Krzysztof Marcinek, W. Pleskacz
{"title":"Configurable MBIST Processor for Embedded Memories Testing","authors":"Andrzej A. Wojciechowski, Krzysztof Marcinek, W. Pleskacz","doi":"10.23919/MIXDES.2019.8787161","DOIUrl":"https://doi.org/10.23919/MIXDES.2019.8787161","url":null,"abstract":"Nowadays, demand for computing power grows faster than ever. This results in more integrated circuits are being dedicated to memories. The efficient testing of such SRAM memories is a difficult task. An integrated Memory Built-In Self-Test (MBIST) module provides an effective testing capability with reasonable area cost. This paper describes the design of a configurable MBIST processor for embedded single-port and dual-port memories testing. Embedded memory fault models were summarized. The developed test environment with memory model and fault injection capability was used to verify the effectiveness of the implemented algorithms.","PeriodicalId":309822,"journal":{"name":"2019 MIXDES - 26th International Conference \"Mixed Design of Integrated Circuits and Systems\"","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132066591","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Current vs Substrate Bias Characteristics of MOSFETs as a Tool for Parameter Extraction 作为参数提取工具的mosfet电流对衬底偏置特性
2019 MIXDES - 26th International Conference "Mixed Design of Integrated Circuits and Systems" Pub Date : 2019-06-01 DOI: 10.23919/MIXDES.2019.8787068
D. Tomaszewski, J. Malesinska, G. Gluszko, K. Kucharski
{"title":"Current vs Substrate Bias Characteristics of MOSFETs as a Tool for Parameter Extraction","authors":"D. Tomaszewski, J. Malesinska, G. Gluszko, K. Kucharski","doi":"10.23919/MIXDES.2019.8787068","DOIUrl":"https://doi.org/10.23919/MIXDES.2019.8787068","url":null,"abstract":"An application of the drain current vs substrate bias characteristics of MOSFETs for the device parameter extraction is presented. Modeling of the substrate bias effect on the MOSFET drain current is briefly discussed. A method of the MOSFET characterization is formulated. It requires a measurement of two I(V) characteristics, including the ID(VBS) smooth curve measured in a \"sweep\" mode. The method allows to extract the threshold voltage parameters and to estimate the in-depth doping profile in the substrate. The proposed approach is demonstrated using I(V) data of the MOSFETs manufactured in ITE in a bulk CMOS process.","PeriodicalId":309822,"journal":{"name":"2019 MIXDES - 26th International Conference \"Mixed Design of Integrated Circuits and Systems\"","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123750993","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Upgrade of the Arc Interconnection Verification System for the Large Hadron Collider 大型强子对撞机电弧互连验证系统的升级
2019 MIXDES - 26th International Conference "Mixed Design of Integrated Circuits and Systems" Pub Date : 2019-06-01 DOI: 10.23919/MIXDES.2019.8787158
M. Bednarski, P. Jurkiewicz, J. Ludwin, Damian Wojas, M. Bednarek, G. D'Angelo
{"title":"Upgrade of the Arc Interconnection Verification System for the Large Hadron Collider","authors":"M. Bednarski, P. Jurkiewicz, J. Ludwin, Damian Wojas, M. Bednarek, G. D'Angelo","doi":"10.23919/MIXDES.2019.8787158","DOIUrl":"https://doi.org/10.23919/MIXDES.2019.8787158","url":null,"abstract":"This article presents the design and construction of a new version of an automated, highly efficient system for validation of connections between superconducting magnets in the Large Hadron Collider at CERN, Genève, Switzerland.The design of the new version is based on the existing comprehensive system for electrical measurements and is its integral part. The new system is dedicated to perform multi channel resistance measurements and is to be used during machine assembly and magnets replacement.","PeriodicalId":309822,"journal":{"name":"2019 MIXDES - 26th International Conference \"Mixed Design of Integrated Circuits and Systems\"","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125876911","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Yield and Reliability Challenges at 7nm and Below 7nm及以下工艺的良率和可靠性挑战
2019 MIXDES - 26th International Conference "Mixed Design of Integrated Circuits and Systems" Pub Date : 2019-03-01 DOI: 10.23919/MIXDES.2019.8787167
A. Strojwas, K. Doong, D. Ciplickas
{"title":"Yield and Reliability Challenges at 7nm and Below","authors":"A. Strojwas, K. Doong, D. Ciplickas","doi":"10.23919/MIXDES.2019.8787167","DOIUrl":"https://doi.org/10.23919/MIXDES.2019.8787167","url":null,"abstract":"Layout Design Rules have been scaled very aggressively to enable the 7nm technology node without EUV. As a result, achieving acceptable performance and yield in High Volume Manufacturing (HVM) has become an extremely challenging task. Systematic yield and parametric variabilities have become quite significant. Moreover, due to overlay tolerance requirements and diminishing process windows, reliability risks due to soft shorts/leakages and soft opens for both FEOL and BEOL have also increased to a critical level. Introduction of EUV at the second wave of 7nm and 5nm will not help significantly due to increased detectivity and significant increases in Local Edge Roughness. New characterization techniques are necessary to identify the yield and reliability risks. After reviewing the evolution of design rules and classifying the yield and reliability risks, we will present examples from Design-For-Inspection™ (DFI™) and the novel VarScan methodology to \"detect the undetectable\" defects and characterize variability for both FEOL and BEOL 7nm and below technologies.","PeriodicalId":309822,"journal":{"name":"2019 MIXDES - 26th International Conference \"Mixed Design of Integrated Circuits and Systems\"","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116092538","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Large Scale Research Facilities 大型研究设施
2019 MIXDES - 26th International Conference "Mixed Design of Integrated Circuits and Systems" Pub Date : 2018-06-01 DOI: 10.23919/mixdes.2018.8436688
{"title":"Large Scale Research Facilities","authors":"","doi":"10.23919/mixdes.2018.8436688","DOIUrl":"https://doi.org/10.23919/mixdes.2018.8436688","url":null,"abstract":"","PeriodicalId":309822,"journal":{"name":"2019 MIXDES - 26th International Conference \"Mixed Design of Integrated Circuits and Systems\"","volume":"116 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127520241","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Intelligent Distributed Systems 智能分布式系统
2019 MIXDES - 26th International Conference "Mixed Design of Integrated Circuits and Systems" Pub Date : 2015-10-23 DOI: 10.23919/mixdes.2019.8787198
A. Morse
{"title":"Intelligent Distributed Systems","authors":"A. Morse","doi":"10.23919/mixdes.2019.8787198","DOIUrl":"https://doi.org/10.23919/mixdes.2019.8787198","url":null,"abstract":"Abstract : We have shown that it is possible to improve the convergence rates for periodic gossiping algorithms by using convex combination rules rather than standard averaging rules. On a ring graph, we have discovered how to sequence the gossips within a period to achieve the best possible convergence rate and we have related this optimal value to the classic edge coloring problem in graph theory. We have developed an algorithm which solves the distributed averaging problem on tree graphs in finite time. We developed an asynchronous, distributed algorithm for solving a linear algebraic equation of the form Ax = b assuming that each processing agent knows a subset of the rows of of the partitioned matrix [A b], current estimates of the solution generated by each of its current neighbors, and nothing more. Necessary and sufficient conditions are derived forall estimates to converge to the same solution. We have shown that the most general class of algorithms for maintaining a rigid formation in two dimension space will go into an unintended circular orbit a constant angular frequency if there is a mismatch in shared data. In three dimensions, such mismatches can cause a formation to exhibit an unintended helical motion. We have developed techniques to eliminate these behaviors.","PeriodicalId":309822,"journal":{"name":"2019 MIXDES - 26th International Conference \"Mixed Design of Integrated Circuits and Systems\"","volume":"76 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-10-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122729584","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Embedded Systems 嵌入式系统
2019 MIXDES - 26th International Conference "Mixed Design of Integrated Circuits and Systems" Pub Date : 1999-11-10 DOI: 10.23919/mixdes.2019.8787045
J. Ganssle
{"title":"Embedded Systems","authors":"J. Ganssle","doi":"10.23919/mixdes.2019.8787045","DOIUrl":"https://doi.org/10.23919/mixdes.2019.8787045","url":null,"abstract":"embedded systems architecture programming and design, 9 ajay deshmukh microcontroller theory applications tata, 9780070667648 embedded systems architecture programming, introduction to embedded systems mcgraw hill pdf download, introduction to embedded systems mr shibu k v, embedded systems rajkamal tata mcgraw hill pdf nocread com, web site of dr prof raj kamal, solution manual the 8051 microcontroller based embedded, embedded systems rajkamal tata mcgraw hill pdf free, embedded systems architecture programming and design 2nd, introduction to embedded systems shibu k v tata mcgraw, keyword ranking analysis for shibu k v introduction to, computer organization and embedded mcgraw hill education, embedded and real time systems arm architecture, embedded systems 2e raj kamal google books, mcgraw hill research papers academia edu, mcgraw hill education canada highereducation, free download here pdfsdocuments2 com, introduction to embedded systems by shibu kv download, embedded systems architecture rexases ebooks, embedded systems iith ac in, introduction to embedded systems shibu k v tata mcgraw, shibu k v senior firmware engineer microsoft linkedin, embedded systems accessscience from mcgraw hill education, embedded systems architecture programming and design, introduction to embedded systems mcgraw hill pdf download, introduction to embedded systems, embedded system architecture amp programming raj kamal, embedded systems architecture programming amp design by, this page intentionally left blank staroceans org, publs mcgraw hill education introduction embedded systems, intro to embedded systems 1e shibu google books, intro to embedded systems 1e shibu google books, management information systems mcgraw hill education, publs mcgraw hill education lesson 12, mcgraw hill inc 15 tasks and their scheduling coursehero com, hamacher computer organization mcgraw hill education, embedded systems architecture programming and design, embedded tor berthelius academia edu","PeriodicalId":309822,"journal":{"name":"2019 MIXDES - 26th International Conference \"Mixed Design of Integrated Circuits and Systems\"","volume":"11 13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-11-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125761289","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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