{"title":"An NMOS pipelined image processor using quaternary logic","authors":"M. Kameyama, T. Hanyu, M. Esashi, T. Higuchi","doi":"10.1109/ISSCC.1985.1156822","DOIUrl":"https://doi.org/10.1109/ISSCC.1985.1156822","url":null,"abstract":"A 2MHz pipelined image processing chip designed with a 5μm NMOS process will be discussed. Multiple ion implant quaternary logic has been found to result in a 4-fold reduction in complexity compared to a conventional binary implementation.","PeriodicalId":309244,"journal":{"name":"1985 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123823660","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"The effect of scaling upto future analog/digital systems","authors":"J. McCreary","doi":"10.1109/ISSCC.1985.1156850","DOIUrl":"https://doi.org/10.1109/ISSCC.1985.1156850","url":null,"abstract":"As demonstrated over the last decade, the performance of both logic and linear CMOS circuits improve as the technology is scaled. Because of this scaling, increasingty larger integrated analog/digital systems have become possible. Such systems include precision amplification and buffering, as well as microprocessor circuits, logic and memory. This panel will examine the practical issues and future architectural consequences involved in the continued scaling of these systems. The issues include the need for on-chip power regulation, digital versus linear filtering and data conversion and the trend towards digital calibration of linear circuits. In addition, circuit design innovation in analog has been another factor resulting in a moving boundary between analog versus digital performance. On the other hand, the consequences of testing analog rather than digital circuits must also be considered... Panelists will debate the advantages of both digital and linear circuit approaches in future analog/digital systems.","PeriodicalId":309244,"journal":{"name":"1985 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115859310","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Y. Inoue, T. Murotani, Y. Fukuzoh, K. Hayano, T. Fujii, K. Minami, K. Nakamura, M. Kikuchi
{"title":"An 85ns 1Mb DRAM in a plastic DIP","authors":"Y. Inoue, T. Murotani, Y. Fukuzoh, K. Hayano, T. Fujii, K. Minami, K. Nakamura, M. Kikuchi","doi":"10.1109/ISSCC.1985.1156852","DOIUrl":"https://doi.org/10.1109/ISSCC.1985.1156852","url":null,"abstract":"This paper will describe the application of an NMOS technology with trench capacitors and an additional polycide interconnect layer to develop a 43.2mm2circuit in a 300mil plastic DIP. A quasi four-bit wide test capability will also be discussed.","PeriodicalId":309244,"journal":{"name":"1985 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122670533","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Custom and semi-custom design approaches for the future","authors":"A. Feller, C. Gwyn","doi":"10.1109/ISSCC.1985.1156845","DOIUrl":"https://doi.org/10.1109/ISSCC.1985.1156845","url":null,"abstract":"The exploding growth of work stations, CAD software/turnkey systems, more vendors of gate arrays, standard cells and handcrafted devices, low-cost computer hardware, and use of foundries, reflect, largely, the tremendous increase of custom and semi-custom devices. These devices range from gate arrays used for a one-to-one replacement for large volume PC boards to sophisticated systems. They are generated by totally purchased services, by internal designers using rented tools, and by internal skill centers. The method of generation includes gate arrays, standard ceils, interactive designs using work stations and/or computer-linked graphic terminals, silicon compilers, and others . . . This panel will discuss the future direction of custom and semi-custom designs and seek to identify which design approach or approaches will dominate in the near and immediate future. It will also seek to identify what tools will be required to support the most probable approach.","PeriodicalId":309244,"journal":{"name":"1985 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129379604","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Fault tolerant techniques for memory components","authors":"M. Kubo, S. Chou","doi":"10.1109/ISSCC.1985.1156843","DOIUrl":"https://doi.org/10.1109/ISSCC.1985.1156843","url":null,"abstract":"Both manufacturers and users of memory components now accept the use of redundancy to improve yields. Currently, the most common practice is to replace defective elements by programming fusible links. As memory densities increase and device physics contraints become more severe, fault tolerant techniques are likely to diversify. For example, on-chip error correction has been employed to correct both hard defects and soft errors. The alternative fault tolerant techniques, their merits and limitations, and their impact on the characteristics of future memory components will be discussed.","PeriodicalId":309244,"journal":{"name":"1985 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128509433","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. Szczepanek, B. Shore, S. Hubbins, C. Hull, A. Smith, H. Watters, M. McGregor, R. Meads
{"title":"An IEEE802.5 compatible LAN controller with on-chip ROM","authors":"A. Szczepanek, B. Shore, S. Hubbins, C. Hull, A. Smith, H. Watters, M. McGregor, R. Meads","doi":"10.1109/ISSCC.1985.1156801","DOIUrl":"https://doi.org/10.1109/ISSCC.1985.1156801","url":null,"abstract":"A 2.4μ NMOS single chip LAN ring controller and buffer manager will be discussed. A 16Mb/s 102K square mil device provides please locking to incoming differential Manchester coded data and includes a 144Kb ROM.","PeriodicalId":309244,"journal":{"name":"1985 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115973429","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Page mode programming 1Mb CMOS EPROM","authors":"Thpm, Takaaki Hagiwara, Hitoshi Matsuo, Minoru Fukuda, Yoh-ichi Matsuno, T. Furuno, Ken-ichi Kuroda, Tokumasa Yasui, Hisao Katto","doi":"10.1109/ISSCC.1985.1156766","DOIUrl":"https://doi.org/10.1109/ISSCC.1985.1156766","url":null,"abstract":"THIS PAPER WILL DESCRIBE a 1Mb CMOS EPROM with fast page mode programming. The EPROM was fabricated using: (I)-high voltage MOS structure with Lightly Doped Drain (LDD), (Z)-double poly N-well CMOS, and (3)-1p minimum gate length for memory transistors. This technology afforded a reduction of cell size to 19.27p2. Thus, it was possible to obtain 1Mb integration in a chip that is 6.0 x 6.56mm2. Scaling down of the memory transistor to a 1p gate length resulted in a wide threshold voltage shift with programming of 11-13V and 0.5ms. Organized as 128K x 8b, the EPROM has both page-mode and conventional byte-mode operation. In page-mode programming, the EPROM accepts four bytes of input data sequentically and programs them at a time; Figure 1. The mode enables programming with time comparable to 256K EPROM’. In this mode, four bytes of input data are stored in 32 latches, and gates of switching transistors on high voltage paths to memory bit lines are controlled by latch outputs when the program enable signal is applied; Figure 2. In a conventional programming mode, the latches are bypassed and the input data controls the switching transistors. A CMOS current sense amplifier with a feedback loop is used; Figure 3. The bit line voltage is lowered (about 1V) to prevent soft writing during read operation. The amplifier has a wide margin for reading operation with a maximum supply voltage of more than TV. Figure 4 shows a microphotograph of the chip. Read access waveforms arc in Figure 5 . Typical access time is 140ns. Power supply current is typically 5mA in active mode and less than IpA in standby mode.","PeriodicalId":309244,"journal":{"name":"1985 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116972537","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A word-wide 1Mb ROM with error correction","authors":"H. Davis","doi":"10.1109/ISSCC.1985.1156821","DOIUrl":"https://doi.org/10.1109/ISSCC.1985.1156821","url":null,"abstract":"A 1Mb ROM, organized as 64K×16b or 128K×8b, that uses address/data multiplexing fit into a 28-pin package, will be reported. Combining dynamic circuit techniques with a 1.5μ double-level metal CMOS process, a typical access time of 50ns has been achieved. On-chip error correction is also available by using a modified Hamming code.","PeriodicalId":309244,"journal":{"name":"1985 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115730148","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A/D architectures of the future","authors":"R. Brodersen, J. Rabaey","doi":"10.1109/ISSCC.1985.1156846","DOIUrl":"https://doi.org/10.1109/ISSCC.1985.1156846","url":null,"abstract":"At the present time, the monolothic A/D and D/A markets are dominated by converters which rely on weighted arrays and resistor strings and operate at supply voltage in excess of 5V. In the future, as technology scales and supply voltages drop, the question arises of whether the present techniques will continue to dominate or will techniques that can better exploit the increased density of digital circuits take over. Examples of the digitally intensive approach are the interpolative A/Ds used PCM Codecs and techniques based on sigma-delta modulation. Proponents of these various contenders are on the panel and tradeoffs will be discussed.","PeriodicalId":309244,"journal":{"name":"1985 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127434365","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
S. Saito, S. Tanaka, S. Atsumi, K. Yoshikawa, M. Sato, K. Makita, S. Mori, H. Nozawa, T. Iizuka
{"title":"A programmable 80ns 1Mb CMOS EPROM","authors":"S. Saito, S. Tanaka, S. Atsumi, K. Yoshikawa, M. Sato, K. Makita, S. Mori, H. Nozawa, T. Iizuka","doi":"10.1109/ISSCC.1985.1156767","DOIUrl":"https://doi.org/10.1109/ISSCC.1985.1156767","url":null,"abstract":"CONTINUING DEMANDS for high-speed, low-power and highdensity EPROMs are being created by the evolution of high performance computer systems. This paper will describe an asynchronous lMb CMOS EPROM with both word and byte operation modes’. An Address Transition Detector (.4TD), MidWord-Line Buffer (MWLB) and sensing are utilized to realize an 80ns access time. Programming of 2Ops/word has been realized by introducing selective DSA (Diffused Self-Align) structure into the memory cell transistor. The CMOS circuit and automatic power down function result in 50mW operating power and subPW standby power.","PeriodicalId":309244,"journal":{"name":"1985 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126654859","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}