2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena最新文献

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Electroluminescence in divergent field 发散场中的电致发光
2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2003-10-19 DOI: 10.1109/CEIDP.2003.1254843
Y. Cao, S. Boggs
{"title":"Electroluminescence in divergent field","authors":"Y. Cao, S. Boggs","doi":"10.1109/CEIDP.2003.1254843","DOIUrl":"https://doi.org/10.1109/CEIDP.2003.1254843","url":null,"abstract":"Charge carriers with high mobility can only be studied in dielectrics within microscopic dimensions, since the power dissipation would cause thermal runaway for a macroscopic geometry. As a complement to the direct \"charge injection\" measurement with a guarded needle electrode system, electroluminescence from a semicon needle was monitored to study the space charge formation and dynamics in dielectrics, especially at the interface. Under bipolar excitation, the threshold for luminescence is the same within experimental error as the charge injection threshold determined using a guarded needle because of the alternative bipolar injection in each half cycle. Under half rectified ac condition, almost no light is emitted before twice the threshold voltage for ac condition is reached. The experimental results can be explained through the polarity reversal during the unipolar pulse shot, which is in accordance with the Finite Element Method simulation. This study is also useful for electroluminescence model differentiation.","PeriodicalId":306575,"journal":{"name":"2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2003-10-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124528989","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Electromagnetic radiated field measurements for partial discharge diagnostic 局部放电诊断用电磁辐射场测量
2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2003-10-19 DOI: 10.1109/CEIDP.2003.1254935
G. Ala, R. Candela, P. Romano, R. Schifani, F. Viola
{"title":"Electromagnetic radiated field measurements for partial discharge diagnostic","authors":"G. Ala, R. Candela, P. Romano, R. Schifani, F. Viola","doi":"10.1109/CEIDP.2003.1254935","DOIUrl":"https://doi.org/10.1109/CEIDP.2003.1254935","url":null,"abstract":"Recently, improvements have been made in the diagnostic of electrical insulation systems by means of electric Partial Discharge (PD) standard measurements through a stochastic approach in the treatment of the acquired data: in this way, the identification of the defects as well as the separation of multiple defects simultaneously active, have been successfully performed. However, the standard PD measurement process can be affected by the well-known parasitic effects due to conducted noise whose spectrum can have characteristics similar to those of the measured signal. Moreover, the classic PD measurement system have to be suitable assembled on the Device Under Test (DUT) so determining a complex erection on site operations, which can force the temporary outage of the same DUT and the related equipment. In the aim of overcoming the previous limitations of the classic PD measurement system, in this paper a novel approach for the characterization of the defects in a dielectric material is proposed. It is based on the remote measurement of the ElectroMagnetic (EM) transient field radiated from PD. In order to validate the approach, the standard CIGRE I test cell is used. Different test measurements with different spatial sensors location enable to obtain the PD diagnostic. A comparison with standard electric current-voltage PD measurements has been carried out with a good agreement in terms of diagnostic results.","PeriodicalId":306575,"journal":{"name":"2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2003-10-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124600070","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Current density distribution on gas-liquid two-phase fluid flow in an air-wave type EHD pump 气波型EHD泵内气液两相流体流动的电流密度分布
2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2003-10-19 DOI: 10.1109/CEIDP.2003.1254948
M. Kumeta, H. Matsunaga, R. Ohyama, A. Watson, J. Chang
{"title":"Current density distribution on gas-liquid two-phase fluid flow in an air-wave type EHD pump","authors":"M. Kumeta, H. Matsunaga, R. Ohyama, A. Watson, J. Chang","doi":"10.1109/CEIDP.2003.1254948","DOIUrl":"https://doi.org/10.1109/CEIDP.2003.1254948","url":null,"abstract":"For gas-liquid two-phase flow systems of an air-wave type EHD pump, an influence of gas-liquid interface on current conduction was investigated in this experiment. The current density distribution along EHD induced liquid flow was obtained by using a plate electrode divided into 20 channels. The maximum current density appeared at a gas-liquid interface bounded to the plate electrode. It was effectively related as an interfacial liquid flow motion based on the current conduction.","PeriodicalId":306575,"journal":{"name":"2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2003-10-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122766154","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Displacement current and trapping mechanisms of electric charges in TiO/sub 2/-rutile tio2 /sub - 2/-金红石中电荷的位移电流和捕获机制
2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2003-10-19 DOI: 10.1109/CEIDP.2003.1254833
T. Temga, C. Guerret-Piecourt, D. Juvé, D. Tréheux, C. Jardin
{"title":"Displacement current and trapping mechanisms of electric charges in TiO/sub 2/-rutile","authors":"T. Temga, C. Guerret-Piecourt, D. Juvé, D. Tréheux, C. Jardin","doi":"10.1109/CEIDP.2003.1254833","DOIUrl":"https://doi.org/10.1109/CEIDP.2003.1254833","url":null,"abstract":"The Scanning Electron Microscopy Mirror Effect (SEMME) and the Induced Current Measurement (ICM) have been used to characterize insulators. The application of these methods to a semiconducting material of wide band gap (TiO/sub 2/) reveals that the material presents a great leakage surface current and high anisotropy of dielectric properties. The goal of the present communication is to understand and study such a behaviour.","PeriodicalId":306575,"journal":{"name":"2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2003-10-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122850192","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The electrical conduction in polyimide nanocomposites 聚酰亚胺纳米复合材料的导电性
2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2003-10-19 DOI: 10.1109/CEIDP.2003.1254808
Y. Cao, P. Irwin
{"title":"The electrical conduction in polyimide nanocomposites","authors":"Y. Cao, P. Irwin","doi":"10.1109/CEIDP.2003.1254808","DOIUrl":"https://doi.org/10.1109/CEIDP.2003.1254808","url":null,"abstract":"The electrical properties of polyimide based nanocomposites were fully investigated by isothermal steady-state current, dielectric spectroscopy, and thermally stimulated current measurements. The effect of nano fillers on the dielectric properties was evaluated via the interfacial polarization as well as the electrical conduction mechanism study. The electrical conduction of polyimide nanocomposites is found to be thermally assisted ionic in nature. The shift of the main thermally stimulated current peak to higher temperatures indicates deeper trapping by incorporating nano fillers. As a result, the nanocomposites will at least maintain the electrical breakdown strength because of the reduced electrical conductivity at elevated temperatures.","PeriodicalId":306575,"journal":{"name":"2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2003-10-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124272671","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 53
An experimental study about the treeing phenomena in XLPE subjected to distorted voltages 变形电压作用下XLPE中树形现象的实验研究
2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2003-10-19 DOI: 10.1109/CEIDP.2003.1254926
F. Guastavino, L. Centurioni, G. Coletti, A. Dardano, E. Torello
{"title":"An experimental study about the treeing phenomena in XLPE subjected to distorted voltages","authors":"F. Guastavino, L. Centurioni, G. Coletti, A. Dardano, E. Torello","doi":"10.1109/CEIDP.2003.1254926","DOIUrl":"https://doi.org/10.1109/CEIDP.2003.1254926","url":null,"abstract":"In this work the influence of harmonic content of the voltage waveform on electrical treeing growth in XLPE (cross-linked polyethylene) is investigated. In particular the lifetimes of XLPE specimens, having a point plane electrode configuration, subjected to different distorted voltages containing 3/sup rd/, 5/sup th/ and 7/sup th/ harmonics, are measured. A lifetime prediction model based upon the correlation between recorded durations and the maximum amplitude of the applied voltages is proposed. The model resulted well suited for the investigated cases. Digital images acquisition allowed to monitor treeing growth so to check wether bush or branch type of treeing had been growing during the tests.","PeriodicalId":306575,"journal":{"name":"2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2003-10-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115129902","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 17
Image analysis of gas-phase EHD flow field for needle-plane electrode system 针-平面电极系统气相EHD流场图像分析
2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2003-10-19 DOI: 10.1109/CEIDP.2003.1254949
M. Fukumoto, R. Ohyama
{"title":"Image analysis of gas-phase EHD flow field for needle-plane electrode system","authors":"M. Fukumoto, R. Ohyama","doi":"10.1109/CEIDP.2003.1254949","DOIUrl":"https://doi.org/10.1109/CEIDP.2003.1254949","url":null,"abstract":"Velocity distribution of a gas-phase electrohydrodynamical (EHD) flow on a needle-plane electrode system was experimentally analyzed by a particle image velocimetry (PIV). The flow visualization for suitable image analysis was carried out by diffusing insulating oil vapor and using an image intensifier. The Coulomb's force as a typical driving force of ionic wind inception was numerically estimated by current continuity equation and Poisson's equation with a boundary condition of corona discharge current distribution. For analyzing the observed ionic wind, the intensity of ionic wind velocity near the corona discharge electrode was characterized with the estimated Coulomb's force density.","PeriodicalId":306575,"journal":{"name":"2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2003-10-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116983971","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
Electrical insulation characteristics of CO/sub 2/ and CO/sub 2/ gas mixtures under non-uniform electric field 非均匀电场作用下CO/sub - 2/和CO/sub - 2/气体混合物的电绝缘特性
2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2003-10-19 DOI: 10.1109/CEIDP.2003.1254911
H. Okubo, N. Koshino, N. Hayakawa
{"title":"Electrical insulation characteristics of CO/sub 2/ and CO/sub 2/ gas mixtures under non-uniform electric field","authors":"H. Okubo, N. Koshino, N. Hayakawa","doi":"10.1109/CEIDP.2003.1254911","DOIUrl":"https://doi.org/10.1109/CEIDP.2003.1254911","url":null,"abstract":"Since SF/sub 6/ gas has been specified as one of the greenhouse gases, we attempt to develop new insulation gases or gas mixtures alternative to SF/sub 6/ gas for gas insulated switchgears (GIS). In this paper, we investigated partial discharge (PD) and breakdown (BD) characteristics of CO/sub 2/ gas and CO/sub 2/ gas mixtures as one of the promising candidates without using SF/sub 6/ gas. Experimental results revealed PD inception and BD strengths for different gas pressure and CO/sub 2/ content under lightning impulse voltage and ac high voltage application.","PeriodicalId":306575,"journal":{"name":"2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2003-10-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116182623","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Breakdown pattern identification in high temperature dielectric films using scanning electron microscopy (SEM) 用扫描电镜(SEM)识别高温介质薄膜的击穿模式
2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2003-10-19 DOI: 10.1109/CEIDP.2003.1254844
S. Ul-Haq, G. Raju
{"title":"Breakdown pattern identification in high temperature dielectric films using scanning electron microscopy (SEM)","authors":"S. Ul-Haq, G. Raju","doi":"10.1109/CEIDP.2003.1254844","DOIUrl":"https://doi.org/10.1109/CEIDP.2003.1254844","url":null,"abstract":"In this research paper DC breakdown patterns identification were carried out after applying high voltages across samples of 25 /spl mu/m Kapton/spl reg/ (polyimide) and Mylar/spl reg/ polyester (poly(ethylene terephthalate), PET) films. For pattern identifications, Scanning Electron Microscopy (SEM) technique was employed for acquiring 150/spl times/ and 300/spl times/ magnified images. In both images the shape of breakdown area was almost identical to the shape of electrodes. The SEM results clearly revealed that the melting process during high voltage DC breakdown process is higher in case of Mylar/spl reg/ polyester than that of Kapton/spl reg/ (polyimide). In case of Mylar/spl reg/ at room temperature, observed hole diameter was approximately 265.5 /spl mu/m with the total effected area of 55.3/spl times/10/sup -9/ m/sup 2/ at DC breakdown strength of 326.7 MV/m as compared to Kapton/spl reg/, which was 155.7 /spl mu/m with total effected area of 19/spl times/10/sup -9/ m/sup 2/ at breakdown strength of 364.9 MV/m. In these films for the measurement of electrical breakdown strength a new type of environmental chamber was used. Two-parameter Weibull distribution has been used to analyze the results.","PeriodicalId":306575,"journal":{"name":"2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2003-10-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128069722","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Flow electrification by cavity quantum electrodynamics? 空腔量子电动力学的流电化?
2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2003-10-19 DOI: 10.1109/CEIDP.2003.1254943
T. Prevenslik
{"title":"Flow electrification by cavity quantum electrodynamics?","authors":"T. Prevenslik","doi":"10.1109/CEIDP.2003.1254943","DOIUrl":"https://doi.org/10.1109/CEIDP.2003.1254943","url":null,"abstract":"Bubbles are proposed as the source of flow electrification and breakdown in transformers, the bubbles nucleated in flow regions that develop hydrostatic tension. But the bubbles are not assumed to be empty. Owing to surface tension, a micron sized fluid particle is posited to form in the bubble leaving an annular gap with the bubble wall that increases as the bubble expands. At the instant of nucleation, the gap has an electromagnetic (EM) resonance beyond the vacuum ultraviolet (VUV) while the thermal kT energy of fluid molecules in the particle is emitted in the infrared (IR). Because of the higher VUV gap resonance, the IR radiation from the particle is suppressed by cavity quantum electrodynamics (QED). To conserve EM energy within cavity QED constraints, the loss in EM energy by the particle is compensated by a gain in the VUV resonant gap, i.e., the IR radiation undergoes a frequency up-conversion to the VUV. Alternatively, VUV radiation exists in the gap if radiative heat flows from the wall to the particle, as would be the case if the suppression of IR radiation causes the particle to cool to absolute zero. But the Stefan Boltzmann law is not applicable because IR radiation at ambient temperature is prohibited in the VUV resonant gap. A heat flow mechanism is presented to transfer thermal kT energy by VUV travelling waves. The VUV radiation excites impurities on gap surfaces to produce electrons by the photoelectric effect, the positive charged impurities forming the streaming current in the flow.","PeriodicalId":306575,"journal":{"name":"2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2003-10-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132118216","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
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