tio2 /sub - 2/-金红石中电荷的位移电流和捕获机制

2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2003-10-19 DOI:10.1109/CEIDP.2003.1254833

T. Temga, C. Guerret-Piecourt, D. Juvé, D. Tréheux, C. Jardin

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引用次数: 0

摘要

扫描电子显微镜镜面效应(SEMME)和感应电流测量(ICM)已被用于表征绝缘体。将这些方法应用于一种宽禁带半导体材料(TiO/sub 2/)，发现该材料具有较大的漏表面电流和较高的介电性能各向异性。本文的目的就是要理解和研究这种行为。

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Displacement current and trapping mechanisms of electric charges in TiO/sub 2/-rutile

The Scanning Electron Microscopy Mirror Effect (SEMME) and the Induced Current Measurement (ICM) have been used to characterize insulators. The application of these methods to a semiconducting material of wide band gap (TiO/sub 2/) reveals that the material presents a great leakage surface current and high anisotropy of dielectric properties. The goal of the present communication is to understand and study such a behaviour.

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2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena

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