2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena最新文献

筛选
英文 中文
The effect of temperature and the mutual influence between two cavities of on the appearance of partial discharges in gaseous cavities contained in the insulator of high voltage 研究了高压绝缘子内气体腔中温度及两腔间的相互影响对局部放电现象的影响
2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2004-07-05 DOI: 10.1109/CEIDP.2003.1254918
T. Seghir, D. Mahi, A. Nouar, K. Lefkaier
{"title":"The effect of temperature and the mutual influence between two cavities of on the appearance of partial discharges in gaseous cavities contained in the insulator of high voltage","authors":"T. Seghir, D. Mahi, A. Nouar, K. Lefkaier","doi":"10.1109/CEIDP.2003.1254918","DOIUrl":"https://doi.org/10.1109/CEIDP.2003.1254918","url":null,"abstract":"Our work treat the effect of the temperature on the appearance of partial discharges in high voltage cables. We modelize the heterogeneous insulator of the cable using finite difference method. The numerical treatment is carried out in bidimensional due to the observed symmetry in the cavities. We simulate regions of weak concentration to an insulator containing one cavity, this is justified by the absence of interactions between cavities. The regions of great concentrations are simulated to an insulator, which contain two cavities in mutual interactions. Once the two cavities are in contact, we speak then of a complex defect called \"bi-vacuole\". The physical proprieties two simulate are the electrical field and the temperature. We present the results of computation obtained by an established program, this result show that the partial discharge is occurred in cavities of small diameters in regions either near the core or the wrapping. The mutual interaction between cavities contributes much the apparition of the partial discharges.","PeriodicalId":306575,"journal":{"name":"2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2004-07-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128338470","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Surface change of polyamide nanocomposite caused by partial discharges 局部放电引起的聚酰胺纳米复合材料表面变化
2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2003-11-21 DOI: 10.1109/CEIDP.2003.1254798
Masahiro Kozako, N. Fuse, K. Shibata, N. Hirai, Yoshimichi Ohki, Tatsuki Okamoto, Toshikatsu Tanaka
{"title":"Surface change of polyamide nanocomposite caused by partial discharges","authors":"Masahiro Kozako, N. Fuse, K. Shibata, N. Hirai, Yoshimichi Ohki, Tatsuki Okamoto, Toshikatsu Tanaka","doi":"10.1109/CEIDP.2003.1254798","DOIUrl":"https://doi.org/10.1109/CEIDP.2003.1254798","url":null,"abstract":"We have investigated partial discharge (PD) degradation for conventional polyamide-6. without nanoscale fillers (nanofillers) and polyamide-6 nanocomposites with 2 weight (wt) %, 4 wt% and 5 wt% addition. Such materials were subjected to partial discharge under the IEC (b) electrode configuration for evaluation. Comparisons were made as to the surface roughness observed by scanning electron microscopy and atomic force microscopy. It was found that the change in the surface roughness was far smaller in specimens with nanofillers than those without nanofillers, and that the 2 wt% addition was sufficient for improvement. This result indicates that polyamide-6 nanocomposite is more resistive to PDs than polyamide-6 without nanofillers.","PeriodicalId":306575,"journal":{"name":"2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2003-11-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122501740","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 54
Surface finish effects on partial discharge with embedded electrodes 埋入电极局部放电时表面光洁度的影响
2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2003-11-21 DOI: 10.1109/CEIDP.2003.1254915
A. Wilder, R. Hebner, Yicheng Wang
{"title":"Surface finish effects on partial discharge with embedded electrodes","authors":"A. Wilder, R. Hebner, Yicheng Wang","doi":"10.1109/CEIDP.2003.1254915","DOIUrl":"https://doi.org/10.1109/CEIDP.2003.1254915","url":null,"abstract":"Partial discharge measurements have been used to characterize the response of dielectric insulation materials exposed to ac voltages. Electrode surface finish can affect such partial discharge characteristics. This paper provides comparisons to the effect of various surface finishes on electrodes embedded in a high temperature epoxy including roughness, electrode material work function, and thin coatings.","PeriodicalId":306575,"journal":{"name":"2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2003-11-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124152715","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Breakdown strength at the interface between epoxy resin and silicone rubber 环氧树脂与硅橡胶界面处的击穿强度
2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2003-11-21 DOI: 10.1109/CEIDP.2003.1254850
K. Shibata, Y. Ohki, T. Takahashi, T. Okamoto
{"title":"Breakdown strength at the interface between epoxy resin and silicone rubber","authors":"K. Shibata, Y. Ohki, T. Takahashi, T. Okamoto","doi":"10.1109/CEIDP.2003.1254850","DOIUrl":"https://doi.org/10.1109/CEIDP.2003.1254850","url":null,"abstract":"We have proposed a concept of an environment-conscious all-solid-insulated substation system as a next generation substation. In order to make the system compact and its layout flexible, it is required to develop a compact connection system with solid insulating materials. Hard and soft insulating materials are to be used for this connection system. Therefore, there is a concern about air penetration into their interface at the time of connection, which reduces the insulation performance. In order to simulate this situation, a model connection part was made using an epoxy resin board as the hard material and a silicone rubber board as the soft material with a spacer inserted into their interface. The present paper reports experimental results on the breakdown strength under ac and impulse voltages. It is confirmed that the insulation performance decreases with an increase in the thickness of the air layer between the two boards.","PeriodicalId":306575,"journal":{"name":"2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2003-11-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114107647","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Roles of cumyl alcohol and crosslinked structure in homo-charge trapping in crosslinked polyethylene 三醇和交联结构在交联聚乙烯中同电荷捕获中的作用
2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2003-11-21 DOI: 10.1109/CEIDP.2003.1254831
N. Hirai, Y. Maeno, T. Tanaka, Y. Ohki, M. Okashita, T. Maeno
{"title":"Roles of cumyl alcohol and crosslinked structure in homo-charge trapping in crosslinked polyethylene","authors":"N. Hirai, Y. Maeno, T. Tanaka, Y. Ohki, M. Okashita, T. Maeno","doi":"10.1109/CEIDP.2003.1254831","DOIUrl":"https://doi.org/10.1109/CEIDP.2003.1254831","url":null,"abstract":"Space charge is formed in cables insulated with crosslinked polyethylene. It has not been clear whether the crosslinking byproducts or the crosslinked polymer morphology is responsible for the space charge formation. In order to clarify this point, additive-free low-density polyethylene, crosslinked polyethylene, and degassed crosslinked polyethylene were soaked in cumyl alcohol arid the space charge distribution was measured under dc voltage application. Specimens tested are divided into two categories. The first category is a soaked single-layered sheet and the second category, is a two-layered specimen consisting of a soaked sheet and a non-soaked sheet. As a result, the following conclusions were obtained. (1) The crosslinked structure has no effect on homo-charge layers. (2) Cumyl alcohol is responsible for traps in both cases of low-density and crosslinked polyethylene. Due to these traps, a homo-charge layer appears in front of each electrode in the single-layered sheet or on the surface of the soaked sheet facing the opposite electrode in the two-layered sample. (3) More space charge is trapped in crosslinked polyethylene than low-density polyethylene, probably because of the presence of carbonyl groups.","PeriodicalId":306575,"journal":{"name":"2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2003-11-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131357442","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
Phenomenology of conduction and breakdown in transformer oil 变压器油导电与击穿现象
2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2003-11-21 DOI: 10.1109/CEIDP.2003.1254853
M. Butcher, M. Cevallos, M. Haustein, A. Neuber, J. Dickens, H. Krompholz
{"title":"Phenomenology of conduction and breakdown in transformer oil","authors":"M. Butcher, M. Cevallos, M. Haustein, A. Neuber, J. Dickens, H. Krompholz","doi":"10.1109/CEIDP.2003.1254853","DOIUrl":"https://doi.org/10.1109/CEIDP.2003.1254853","url":null,"abstract":"In a coaxial test apparatus enabling the measurement of voltage and current at the test gap, dc conduction and breakdown in transformer oil caused by the application of dc voltages are investigated. Current measurements cover the range from 10/sup -1/ A to 1 kA, with temporal resolutions of milliseconds at the lowest current amplitudes to sub-nanoseconds for currents larger than 10/sup -4/ A. The dc current/voltage characteristic for sub-breakdown voltage amplitudes point to the injection of charge carriers, allow us to characterize the transport mechanisms, and the influence of space charges. For voltages approaching breakdown thresholds, quasi dc-currents rising from nanoamperes to microamperes are superimposed by current pulses with amplitudes of milliamperes and above, and durations of nanoseconds. The onset of these current pulses occurs up to 10 /spl mu/s before breakdown. One of these current pulses reaches a critical amplitude causing voltage breakdown and current rise to the impedance-limited value within 2 ns. Additional optical diagnostics using photomultipliers and high-speed photography with gated microchannel plates yield information on hydrodynamic processes and charge carrier amplification mechanisms associated with the current pulses and final breakdown, such as bubble formation, as well as on the development of the spark plasma finally bridging the gap.","PeriodicalId":306575,"journal":{"name":"2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2003-11-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132636925","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Use of surface resistance for assessing vulnerability of HV outdoor insulators to contamination flashover 用表面电阻评估高压室外绝缘子对污闪的易损性
2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2003-10-19 DOI: 10.1109/CEIDP.2003.1254879
R. Gorur, K. Subramanian
{"title":"Use of surface resistance for assessing vulnerability of HV outdoor insulators to contamination flashover","authors":"R. Gorur, K. Subramanian","doi":"10.1109/CEIDP.2003.1254879","DOIUrl":"https://doi.org/10.1109/CEIDP.2003.1254879","url":null,"abstract":"This paper describes the use of surface resistance under wet conditions to evaluate the vulnerability of HV outdoor insulators to flashover in contaminated locations. The insulators evaluated include porcelain, silicone rubber and EPDM rubber composite insulators. The experiments were performed in the laboratory on clean and artificially contaminated insulators utilizing different modes of wetting, namely, salt-spray, clean-fog and fog produced by ultrasonic devices. It has been shown that there is a critical value of surface resistance below which flashover invariably occurs. This value can be used to assess the likelihood of imminent flashover in the field. Several insulators removed from the field from contaminated locations were evaluated to validate the findings.","PeriodicalId":306575,"journal":{"name":"2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2003-10-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124933258","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Surface discharge phenomena of silicon in atmospheric air 大气中硅的表面放电现象
2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2003-10-19 DOI: 10.1109/CEIDP.2003.1254861
Guanjun Zhang, Wenxing Zhao, Yan Sun, Zhang Yan
{"title":"Surface discharge phenomena of silicon in atmospheric air","authors":"Guanjun Zhang, Wenxing Zhao, Yan Sun, Zhang Yan","doi":"10.1109/CEIDP.2003.1254861","DOIUrl":"https://doi.org/10.1109/CEIDP.2003.1254861","url":null,"abstract":"Semiconductor devices are being gradually applied in the fields of high-voltage and high-power technology, and thus the high-field characteristics of semiconducting materials have been paid much attention. However, its development meets the limitation of surface discharge/flashover. Based on the measurement of voltage and current waveforms and the optical observation, the surface phenomena across silicon samples were preliminarily investigated under pulsed excitation in atmosphere. Moreover, its discharge behaviors are compared with that of insulating epoxy resin. It is suggested that there was current filament phenomena occurred inside the silicon resulted from the inhomogeneity of injected current density and Joule heating effect, which strongly affect the surface discharge phenomena of semiconductor and liable for its behaviors different from insulating materials.","PeriodicalId":306575,"journal":{"name":"2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2003-10-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124992613","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
A novel approach for classifying the intensity of audible discharge noise caused by contaminated insulator strings 污秽绝缘子串可听放电噪声强度分类的新方法
2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2003-10-19 DOI: 10.1109/CEIDP.2003.1254876
T. Matsumoto, K. Yamamoto
{"title":"A novel approach for classifying the intensity of audible discharge noise caused by contaminated insulator strings","authors":"T. Matsumoto, K. Yamamoto","doi":"10.1109/CEIDP.2003.1254876","DOIUrl":"https://doi.org/10.1109/CEIDP.2003.1254876","url":null,"abstract":"This paper presents a novel approach for classifying the annoyance levels of audible discharge noise caused by contaminated insulator strings. In the course of the study, the nature of audible discharge noise was studied at first with SSG (sound spectrograph) analysis for the sound generated in a plain anechoic room, which revealed the temporal change and the frequency range of strong spectrum. Exploiting the characteristics of the noise, the audible discharge noise was successfully detected with the developed instrument for the study to the next step. The measured sound data were examined for various annoyance levels. It was found that the shape of the distribution of the amplitude histogram differs according to the annoyance level, which was explained by the difference of discharge phenomena with the observations on the sites. Therefore, the statistical properties of Skewness and Kurtosis have been adopted to classify the annoyance levels. The values of these properties and the suitable time span of the calculation for the classifying have been discussed.","PeriodicalId":306575,"journal":{"name":"2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2003-10-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125103939","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The study of tree-inception and growth in PMMA in visible and IR spectra 聚甲基丙烯酸甲酯在可见光和红外光谱中的起始树和生长研究
2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2003-10-19 DOI: 10.1109/CEIDP.2003.1254938
O. S. Gefle, E. Gockenbach
{"title":"The study of tree-inception and growth in PMMA in visible and IR spectra","authors":"O. S. Gefle, E. Gockenbach","doi":"10.1109/CEIDP.2003.1254938","DOIUrl":"https://doi.org/10.1109/CEIDP.2003.1254938","url":null,"abstract":"The results of study of the tree-inception and growth in PMMA in visible and IR spectra and PD-parameters are presented in this paper. It is established that tree-inception and growth is accompanied by both a local temperature drop on the sample surface and essential increase in the PD-activity. The growth of trees has a stepwise nature with time. The tree-inception and growth is accompanied by a local increase in a temperature drop at the surface of dielectric by a factor of 1.5...2. Correlation between the PD-activity and a temperature drop at the surface of dielectric is found.","PeriodicalId":306575,"journal":{"name":"2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2003-10-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126968031","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信