{"title":"Japanese I/O technology-where it is and how it got there","authors":"R. Myers","doi":"10.1109/CMPEUR.1989.93323","DOIUrl":"https://doi.org/10.1109/CMPEUR.1989.93323","url":null,"abstract":"Japanese companies are currently among the world leaders in developing and marketing computer input/output (I/O) devices, particularly facsimile transceivers, CRT and flat-panel displays, and matrix and laser printers. This situation has developed from a base of inexpensive, high-quality, mass-produced consumer products of all types, from word-processors and TV sets to cameras and wristwatches. There are many aspects of the Japanese society and economy which have made this possible. The author assesses the status of current Japanese I/O devices and attempts to draw some conclusions from the ways by which Japanese entrepreneurs have utilized a strong base in mass-produced consumer goods in combination with the underlying nature of the country to develop computer peripherals which in many cases are technological leaders.<<ETX>>","PeriodicalId":304457,"journal":{"name":"Proceedings. VLSI and Computer Peripherals. COMPEURO 89","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-05-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116804792","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"The 'Electronic Shoe' for jogging, sports and convalescence","authors":"H. Gerhauser, G. Pirner","doi":"10.1109/CMPEUR.1989.93428","DOIUrl":"https://doi.org/10.1109/CMPEUR.1989.93428","url":null,"abstract":"A stride-length measurement system is described which calculates the distance traveled by a running person. The basic principle is an ultrasonic distance-measurement technique. Data from the electronic circuitry built into the shoes are transmitted wirelessly to a computer box which is the size of a pocket calculator. The system can be applied in the field of competitive or popular sport and also for observation of heart patients in the rehabilitation phase. During running the computer box displays online the distance traveled with an accuracy of about 5%. It can respond by acoustic signals if the runner does not follow a predetermined running speed profile.<<ETX>>","PeriodicalId":304457,"journal":{"name":"Proceedings. VLSI and Computer Peripherals. COMPEURO 89","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-05-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120990103","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Thermal performance evaluation of VLSI packaging","authors":"Z.J. Staszak, J. Prince, B. R. Simon","doi":"10.1109/CMPEUR.1989.93503","DOIUrl":"https://doi.org/10.1109/CMPEUR.1989.93503","url":null,"abstract":"The authors address the problems of thermal performance evaluation of level-1 (chip and carrier) and level-2 (boards/modules and interconnects) integrated-circuit packages. Requirements for thermal modeling and experimental characterization are outlined. Models, simulation tools, and characterization tools and their assessment are discussed.<<ETX>>","PeriodicalId":304457,"journal":{"name":"Proceedings. VLSI and Computer Peripherals. COMPEURO 89","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-05-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127540028","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"The ink drop sensor-a means of making ink-jet printers more reliable","authors":"E. Goepel","doi":"10.1109/CMPEUR.1989.93372","DOIUrl":"https://doi.org/10.1109/CMPEUR.1989.93372","url":null,"abstract":"An ink-drop sensor has been developed for use in ink-jet printers so that the function of the multinozzle printhead can be checked before printing starts or cyclically during printing. If the sensor detects that one or more nozzles have failed, the printhead can be restored to correct operation in a service station. This process, which is completely automatic and requires no intervention on the part of the user, increases the reliability of the ink-jet printer. The sensor principle utilizes the electrical conductivity of the ink. When ink droplets from any nozzle in the printhead are ejected onto comblike electrodes, conductive links are established between the prongs of these electrode combs, and changes in resistance can be measured at the sensor terminals. These changes in resistance are then converted in a signal-conditioning circuit into digital voltage signals. The author also discusses modified versions of the sensor suitable for special applications such as measuring the flight time of ink droplets and determining print position errors.<<ETX>>","PeriodicalId":304457,"journal":{"name":"Proceedings. VLSI and Computer Peripherals. COMPEURO 89","volume":"73 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-05-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122683924","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Szczecin region heterogeneous computer networks: design and development problems","authors":"A. Bending-Wielowiejski, J. Soldek, J. Lewoc","doi":"10.1109/CMPEUR.1989.93452","DOIUrl":"https://doi.org/10.1109/CMPEUR.1989.93452","url":null,"abstract":"The Szczecin Technical University is involved in the design and development of the heterogeneous computer network ZASK, which is to serve a collection of academic and industry users. ZASK is to be a subset of a bigger interregion academic computer network, KASK. The authors present the design solutions implied by the general considerations: importing of networks is not feasible; primarily IBM-compatible microcomputers are available on the Polish market; there is a severe lack of professional medium-size or large computers in Poland; and the lack of post-office links is even more severe. The interuniversity computer network MSK (in operation from 1983) provides experience in networking in local conditions, which should be used in development of ZASK.<<ETX>>","PeriodicalId":304457,"journal":{"name":"Proceedings. VLSI and Computer Peripherals. COMPEURO 89","volume":"76 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-05-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121897014","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Beyond icons: surface and structure of user interfaces","authors":"J. Nievergelt","doi":"10.1109/CMPEUR.1989.93328","DOIUrl":"https://doi.org/10.1109/CMPEUR.1989.93328","url":null,"abstract":"The concept of a user interface includes the complex of command languages, operations, design principles, and standards associated with the increasingly important and wide-spread use of interactive systems. Technological innovations, mostly in hardware but some in software, have been the driving forces. These include: time-sharing, workstations with bitmap graphics, graphic input devices, efficient multiprocessing, and multimegabyte memories for personal computers. Techniques of interaction followed, with operating systems that support user interaction, menus and icons, window systems, graphic interaction techniques such as snap-dragging, and integrated systems where all interactive applications share certain universal operations. Design principles are emerging, but standards remain a task for the future.<<ETX>>","PeriodicalId":304457,"journal":{"name":"Proceedings. VLSI and Computer Peripherals. COMPEURO 89","volume":"26 6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-05-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116593069","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Achieving Byzantine agreement in a generalized network model","authors":"S.C. Wang, Y. Chin, K. Yan, C. Chen","doi":"10.1109/CMPEUR.1989.93460","DOIUrl":"https://doi.org/10.1109/CMPEUR.1989.93460","url":null,"abstract":"Traditionally, the Byzantine agreement (BA) problem has been studied either in a fully connected network or in a broadcast network. A generalized network model for BA is proposed. The conventional fully connected network or broadcast network is a special case of the new network architecture. A BA problem with the processor in a malicious fault is studied in the model. The proposed protocol incorporates the previous protocols developed for a fully connected network or a broadcast network, solves a BA problem by using the minimum number of rounds, and can tolerate the maximum number of faulty processors.<<ETX>>","PeriodicalId":304457,"journal":{"name":"Proceedings. VLSI and Computer Peripherals. COMPEURO 89","volume":"71 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-05-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129229283","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Progress in electron-beam testing","authors":"E. Wolfgang, S. Gorlich, E. Plies","doi":"10.1109/CMPEUR.1989.93495","DOIUrl":"https://doi.org/10.1109/CMPEUR.1989.93495","url":null,"abstract":"To describe the progress of e-beam testing in recent years, four subaspects are examined: electron-optical improvements, waveform processing, capacitive voltage measurements, and the integration of e-beam testing with computer-aided design and testing. For the case of megabit DRAMs it can be shown that the interconnection width of the uppermost level metallization does not continue to decrease, since a two-layer metallization is used in the 17-b DRAM. In the future, therefore, greater efforts must be invested in designing for e-beam testability, whereas the electron-optical properties of existing dedicated e-beam testers appear to be well suited to meet the demands of the coming years.<<ETX>>","PeriodicalId":304457,"journal":{"name":"Proceedings. VLSI and Computer Peripherals. COMPEURO 89","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-05-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114880299","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Advanced technology for computers and peripherals","authors":"M. Vinsani","doi":"10.1109/CMPEUR.1989.93492","DOIUrl":"https://doi.org/10.1109/CMPEUR.1989.93492","url":null,"abstract":"The author reviews the present status as well as some evolution trends of the electronic component technology for computer and peripherals. Particular emphasis is given to those technologies that are more applicable to medium-range computers. The reason for this choice is the particular challenge presented by the more tight cost/performance requirements in respect to both large mainframe and small systems. The revolutionary changes in design methodology brought about by the evolution of new technologies and demanded by the ever shorter time-to-market requirements are considered.<<ETX>>","PeriodicalId":304457,"journal":{"name":"Proceedings. VLSI and Computer Peripherals. COMPEURO 89","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-05-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131031353","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
J. Nurmi, M. Williams, P. Jarvilehto, K. Estola, A. Ruha, T. Karema, H. Tenhunen
{"title":"An integrated sensor interface circuit for ECG measurements","authors":"J. Nurmi, M. Williams, P. Jarvilehto, K. Estola, A. Ruha, T. Karema, H. Tenhunen","doi":"10.1109/CMPEUR.1989.93427","DOIUrl":"https://doi.org/10.1109/CMPEUR.1989.93427","url":null,"abstract":"An integrated circuit for ECG measurements and preprocessing is presented. The circuit consists of four independent macro modules: (1) an analog instrumentation amplifier for ECG tracking, (2) a high-performance sigma-delta A/D converter, (3) a computationally efficient linear-phase digital filter for ECG preprocessing, and (4) an interface for digital and analog ECG output. A bit-serial approach has been chosen for digital modules to keep the circuit area and power consumption sufficiently small. The high-quality modules and versatile output facilities make the circuit very useful in all kinds of ECG monitoring.<<ETX>>","PeriodicalId":304457,"journal":{"name":"Proceedings. VLSI and Computer Peripherals. COMPEURO 89","volume":"101 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-05-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133168611","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}