Proceedings of the 2000 IEEE/EIA International Frequency Control Symposium and Exhibition (Cat. No.00CH37052)最新文献_第9页

Various ways to temperature-regulate an ultrastable quartz oscillator 温度调节超稳定石英振荡器的各种方法

Proceedings of the 2000 IEEE/EIA International Frequency Control Symposium and Exhibition (Cat. No.00CH37052) Pub Date : 2000-06-07 DOI: 10.1109/FREQ.2000.887397

S. Galliou, M. Mourey, F. Marionnet

{"title":"Various ways to temperature-regulate an ultrastable quartz oscillator","authors":"S. Galliou, M. Mourey, F. Marionnet","doi":"10.1109/FREQ.2000.887397","DOIUrl":"https://doi.org/10.1109/FREQ.2000.887397","url":null,"abstract":"An ultrastable quartz crystal oscillator (USO) must obviously be ovenized. Frequency fluctuations partly come from static changes of the ambient temperature as well as dynamic ones. Both effects are detailed and their consequences on the oven design are discussed. The static frequency deviation is mainly related to the efficiency of the thermal regulator: for example, to achieve a relative frequency fluctuation a few 10/sup -10/ over an ambient temperature range of [-30/spl deg/C, +70/spl deg/C], the static thermal gain must reach at least 1000. However, a standard proportional and integral thermal controller which can eliminate the static error is unable to do this for the fast thermal disturbances. Here the thermal filtering must work in accordance with the cut-off frequency of the frequency-temperature transfer function of the quartz resonator. Various methods for controlling the oscillator temperature are presented: the usual method consists of using more than one temperature-controlled oven. This is often a volume-consuming process. An alternative approach, which is much simpler, is to add a \"light\" compensation effect to the feedback control system. A third way to improve the temperature regulation is based on distribution of the monitoring power. Obviously, a mix of those solutions is possible. Advantages and drawbacks of each of them are discussed. Practical results are shown and illustrated with 10 MHz USO devices.","PeriodicalId":294110,"journal":{"name":"Proceedings of the 2000 IEEE/EIA International Frequency Control Symposium and Exhibition (Cat. No.00CH37052)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123670355","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Elastic anharmonicity and elastic constants temperature dependences of different quality quartz crystals 不同质量石英晶体的弹性非调和性和弹性常数与温度的关系

Proceedings of the 2000 IEEE/EIA International Frequency Control Symposium and Exhibition (Cat. No.00CH37052) Pub Date : 2000-06-07 DOI: 10.1109/FREQ.2000.887391

B. Sorokin, D. Glushkov, P. P. Turchin, S.V. Michailyuta, K. S. Aleksandrov, A.B. Doubovsky

引用次数: 2

Characterization of the elastic properties of metrological quartz crystal resonators using acoustic force microscopy 用声力显微镜表征计量石英晶体谐振器的弹性特性

Proceedings of the 2000 IEEE/EIA International Frequency Control Symposium and Exhibition (Cat. No.00CH37052) Pub Date : 2000-06-07 DOI: 10.1109/FREQ.2000.887348

F. Sthal, R. Bourquin

引用次数: 0

Phase noise of X-band regenerative frequency dividers x波段再生分频器的相位噪声

Proceedings of the 2000 IEEE/EIA International Frequency Control Symposium and Exhibition (Cat. No.00CH37052) Pub Date : 2000-06-07 DOI: 10.1109/FREQ.2000.887412

M. Mossammaparast, C. McNeilage, P. Stockwell, J. Searls

引用次数: 13

A low profile quartz crystal resonator for OXCO in cellular telephone system 一种用于蜂窝电话系统的低轮廓石英晶体谐振器

Proceedings of the 2000 IEEE/EIA International Frequency Control Symposium and Exhibition (Cat. No.00CH37052) Pub Date : 2000-06-07 DOI: 10.1109/FREQ.2000.887380

T. Soga, Y. Aoyama, K. Hara

引用次数: 0

Growth of piezoelectric single crystals by the pulling-down method 下拉法生长压电单晶

Proceedings of the 2000 IEEE/EIA International Frequency Control Symposium and Exhibition (Cat. No.00CH37052) Pub Date : 2000-06-07 DOI: 10.1109/FREQ.2000.887345

H. Tanaka, H. Sakamoto, S. Hashimoto, K. Nagai, K. Kodaira

引用次数: 0

Manufacturing issues for a high performance crystal oscillator 高性能晶体振荡器的制造问题

Proceedings of the 2000 IEEE/EIA International Frequency Control Symposium and Exhibition (Cat. No.00CH37052) Pub Date : 2000-06-07 DOI: 10.1109/FREQ.2000.887360

R. Karlquist, H. Stephanian

{"title":"Manufacturing issues for a high performance crystal oscillator","authors":"R. Karlquist, H. Stephanian","doi":"10.1109/FREQ.2000.887360","DOIUrl":"https://doi.org/10.1109/FREQ.2000.887360","url":null,"abstract":"Manufacturing issues affecting a high performance balanced-bridge controlled crystal oscillator are described. This paper covers design-for-manufacturability decisions relating to that design, as well as equipment and processes that were created specifically for the purpose of manufacturing this oscillator Special precision plating techniques are used to hold calibration tolerance to below 1 part in 10/sup 6/. The crystal parameters are then carefully measured over temperature in an oil bath. The measured crystal data is put through an algorithm to determine necessary manufacturing parameters. A laser-operated bar code engraving system marks the individual crystals. Statistics on large numbers of crystals are recorded in a database and used to adjust the manufacturing process as necessary to maintain extremely tight angle-of-cut tolerances to hold turnover temperatures within a relatively narrow range. The next step is to install the crystal in a \"bridge\" PC board. Finished bridge boards, with crystals, are then plugged into oscillator boards that are installed in oven assemblies. The exact turnover temperature is determined and errors such as thermistor tolerance are calibrated out. This information is added to the database that is used later to store the oven set point data in nonvolatile RAM on the controller board that holds the puck assembly. Tolerancing issues of the extremely high thermal gain oven are described. Great attention must be paid to the fabrication of the flexible circuit heaters for the oven mass. Another critical parameter is the ratio of heat applied to the top and bottom of the oven mass vs. the rim. We elected to choose a single value used for all ovens, which limited the thermal gain achieved in production to the neighborhood of about 100,000. A technique is described that we could have used, if necessary, to individually set the thermal gains of the ovens to approach 1,000,000.","PeriodicalId":294110,"journal":{"name":"Proceedings of the 2000 IEEE/EIA International Frequency Control Symposium and Exhibition (Cat. No.00CH37052)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115134604","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Determination of the frequency of oscillations in the autodyne sensor under regular and casual temperature mode variations 确定自差传感器在正常和偶然温度模式变化下的振荡频率

Proceedings of the 2000 IEEE/EIA International Frequency Control Symposium and Exhibition (Cat. No.00CH37052) Pub Date : 2000-06-07 DOI: 10.1109/FREQ.2000.887336

V.V. Boloznev, E. Safonova

{"title":"Determination of the frequency of oscillations in the autodyne sensor under regular and casual temperature mode variations","authors":"V.V. Boloznev, E. Safonova","doi":"10.1109/FREQ.2000.887336","DOIUrl":"https://doi.org/10.1109/FREQ.2000.887336","url":null,"abstract":"The sensor is mounted in an orifice of the reactor wall. The antenna is inward to the reactor; its conductivity depends on the permittivity of a high-temperature working body and transforms to an autodyne frequency. Heating of the sensor is realized by the working body through the antenna surface. The largest part of the sensor's body is outside the reactor and cools through the sidewalls. Variations of resonator length, permittivities, and also capacity of the diode mainly influence the frequency of generation. The error that is most difficult to compensate for is caused by the regular temperature variations at the starting time. Theoretical estimations of this magnitude are presented. The investigation of a casual error is continued. The working body of the sensor (with a resonator), which is represented by a linear narrow-band quadrupole, carries out a temperature transformation into a frequency shift. Its properties are based on the well-known thermophysics regularities. Heat exchange between the working body and antenna occurs by radiation. The rough heat causes temperature waves in the working body of the sensor, which propagate with strong attenuation and with velocities that depend on frequency. The mathematical investigations include: (i) approximation of a temperature curve of growth in the reactor T(t) and its Fourier-expansion; (ii) determination of an impulse characteristic of \"quadripole\", h(t) in any cross-section of the sensor; (iii) convolution of functions T(t) and h(t-/spl tau/); (iv) integration by the sensor's (resonator) length along a coordinate x/spl isin/O,L; (v) translation into the frequency change. The investigated examples have shown that the compensation of the error under the primary and secondary processing is hampered. A solution for this problem is the development of a computer model, which takes into account all obtained correlations.","PeriodicalId":294110,"journal":{"name":"Proceedings of the 2000 IEEE/EIA International Frequency Control Symposium and Exhibition (Cat. No.00CH37052)","volume":"59 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120959158","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Flicker noise reduction using GaAs microwave feedforward amplifiers 利用GaAs微波前馈放大器降低闪烁噪声

Proceedings of the 2000 IEEE/EIA International Frequency Control Symposium and Exhibition (Cat. No.00CH37052) Pub Date : 2000-06-07 DOI: 10.1109/FREQ.2000.887411

C. Broomfield, J. Everard

引用次数: 18

The "atomic candle:" progress towards a smart rubidium atomic clock [and application to microwave dielectric measurements] “原子蜡烛”:智能铷原子钟的进展[及其在微波介电测量中的应用]

Proceedings of the 2000 IEEE/EIA International Frequency Control Symposium and Exhibition (Cat. No.00CH37052) Pub Date : 2000-06-07 DOI: 10.1109/FREQ.2000.887440

J. Camparo

引用次数: 3