Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference最新文献_第7页

Technology insertion in a MATE station: lessons learned MATE站的技术插入:经验教训

Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference Pub Date : 1900-01-01 DOI: 10.1109/AUTEST.1992.270100

R. Jenkins, D. Andrews

{"title":"Technology insertion in a MATE station: lessons learned","authors":"R. Jenkins, D. Andrews","doi":"10.1109/AUTEST.1992.270100","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270100","url":null,"abstract":"The authors explore issues of inserting new technology into test equipment, especially equipment built to the US Air Force's modular automatic test equipment (MATE) standards. The specific results and lessons learned from one such upgrade of new digital technology into a MATE station are discussed. The issue of compatibility with existing test program sets (TPSs) is usually one of the driving forces for the selection of the new equipment. Analog signal compatibility and pin mapping also must be maintained as much as possible to avoid excessive changes to the test adapters. Analog compatibility issues for digital upgrades include clock ranges, voltage levels, input impedances, and pin drive capabilities. Another major interface to be considered for MATE testers is the CIIL language. Some benefits of technology insertion are considered. Some of the lessons learned that apply to upgrading any test station are in the area of the hidden interfaces and system behaviours that will not be visible from just studying specifications. Some questions are suggested that, if asked, may reduce the problems of upgrading the ATE. In the end, tradeoffs must be made between the cost of TPS incompatibilities and the benefits of newer technology.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117059219","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Combining unloaded and loaded board testing 结合卸载和加载板测试

Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference Pub Date : 1900-01-01 DOI: 10.1109/AUTEST.1992.270107

P.G. Robison, M. Dean

引用次数: 0

Automated integrated diagnostic analysis for aircraft mechanical systems 飞机机械系统自动集成诊断分析

Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference Pub Date : 1900-01-01 DOI: 10.1109/AUTEST.1992.270104

R. Lebron, R. Rossi

引用次数: 0

A VXI-based architecture for a digital test system 基于vxi的数字测试系统体系结构

Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference Pub Date : 1900-01-01 DOI: 10.1109/AUTEST.1992.270109

R. Pye

引用次数: 0

Shielded aircraft cabling importance of verifying capacitance 屏蔽飞机布线电容验证的重要性

Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference Pub Date : 1900-01-01 DOI: 10.1109/AUTEST.1992.270083

J. R. Stone

引用次数: 0

Modular avionics systems architecture (MASA) test and diagnostics 模块化航空电子系统架构(MASA)测试和诊断

Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference Pub Date : 1900-01-01 DOI: 10.1109/AUTEST.1992.270096

G.T. Logan

引用次数: 0