基于vxi的数字测试系统体系结构

Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference Pub Date : 1900-01-01 DOI:10.1109/AUTEST.1992.270109

R. Pye

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引用次数: 0

摘要

作为电路板测试系统的基础，VXI提供了显著的优势，但由于VXI中可用的资源有限，构建基于VXI的数字测试子系统是困难的。分布式资源架构、现代集成技术和硬坞扫描解决方案使基于vxi的高性能数字测试子系统得以构建。描述了数字子系统。为基于vxi的自动化测试设备系统开发硬对接扫描和固定解决方案，解决了将数字子系统连接到被测单元的问题，保持了高质量的地面系统，并且还提供了一种向数字子系统路由额外电源的方法。

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A VXI-based architecture for a digital test system

VXI offers significant advantages as a basis for a board test system, but building VXI-based digital test subsystems is difficult because of the limited resources available in VXI. A distributed-resource architecture, modern integration techniques, and a hard-dock scanning solution enable a high-performance VXI-based digital test subsystem to be built. The digital subsystem is described. The development of a hard-docking scanning and fixturing solution for VXI-based automated test equipment systems solves the problems of connecting the digital subsystem to the unit under test, maintains a high-quality ground system, and also provides a means of routing extra power to the digital subsystem.<>

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Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference

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