Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference最新文献

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Simulation-based analysis for real-time systems development 基于仿真的实时系统开发分析
Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference Pub Date : 1992-09-21 DOI: 10.1007/978-3-642-88049-0_119
Frederick T. Sheldon, Seung-Min Yang, Trina L. Bornejko
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引用次数: 4
Onboard diagnostics of avionics for fault tolerance and maintenance 航空电子设备的机载诊断,用于容错和维护
Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference Pub Date : 1992-09-21 DOI: 10.1109/AUTEST.1992.270095
R. Hammett
{"title":"Onboard diagnostics of avionics for fault tolerance and maintenance","authors":"R. Hammett","doi":"10.1109/AUTEST.1992.270095","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270095","url":null,"abstract":"Summary form only given. Emerging modular avionics systems will require excellent onboard fault diagnosis, both to support flight critical functions and to provide for cost effective maintenance. The approach to fault isolation discussed makes use of multiple indications of failures, known as failure signatures or syndromes. A computer-aided design tool that can analyze the architecture and generate syndrome data for inclusion in embedded software algorithms has been developed. This tool performs automatic failure dependency analysis using as input a graphical schematic of the system to be analyzed. A further complication arises with the syndrome approach when detection tests fail to operate correctly. A method of mitigating this problem using partial pattern matching techniques on the pattern of test failure indication has also been developed. Other benefits of this approach are outlined.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134347941","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The complex signal C/ATLAS structure: a signal description construct for the future 复杂信号C/ATLAS结构:一种面向未来的信号描述结构
Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference Pub Date : 1992-09-21 DOI: 10.1109/AUTEST.1992.270125
M. Seavey
{"title":"The complex signal C/ATLAS structure: a signal description construct for the future","authors":"M. Seavey","doi":"10.1109/AUTEST.1992.270125","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270125","url":null,"abstract":"Radio frequency (RF), millimeter wave, electrooptical (EO), and video testing have become very sophisticated in the last few years and the common abbreviated test language for all systems (C/ATLAS) does not provide the user with the required programming capabilities for these technologies. The complex signal C/ATLAS structure provides the mechanism for modeling complex signals and signal characteristics, thus providing the support of complex modulated RF signals as well as a variety of sophisticated signals currently not available. The structure will eliminate the need for new signal constructs and extensions, retain all present capabilities and introduce new capabilities. The six preamble statements and the noun complex signal make up the building blocks for a software erector set, which is not limited to the presently existing ATLAS nouns and modifiers. It can access a full range of RF, EO, and video testing requirements, and lends itself to expansion as testing requirements expand. It also makes ATLAS procedural sections shorter and more readable, as well as the fact that the definitions can more easily be placed in libraries for use by others.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"61 6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133978604","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
TPS-X-an automated graphical approach to TPS design TPS- x - TPS设计的自动图形化方法
Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference Pub Date : 1992-09-21 DOI: 10.1109/AUTEST.1992.270115
E. Cashar, S. Walimaa
{"title":"TPS-X-an automated graphical approach to TPS design","authors":"E. Cashar, S. Walimaa","doi":"10.1109/AUTEST.1992.270115","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270115","url":null,"abstract":"The authors describe an object-oriented graphical user interface TPS-X, which provides the test program set (TPS) designer with a development tool that is independent of the automated test equipment (ATE) and the programming language used by the ATE. The interface uses object-oriented symbols representing test objects and circuit topology to show the test strategy as opposed to using a specific language syntax. A TPS-X graphical test diagram and the resulting TPS may be transported from a software development system to and between various test stations. This method of TPS development also aids the TPS debug and maintenance effort by providing a simple visual description of the test strategy and a method of updating the description as opposed to studying source code to determine the strategy and where to make the necessary changes.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114212466","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Technical certification of test tools/automatic test equipment (ATE) 测试工具/自动测试设备(ATE)技术认证
Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference Pub Date : 1992-09-21 DOI: 10.1109/AUTEST.1992.270114
D.M. Butler, S. Densler
{"title":"Technical certification of test tools/automatic test equipment (ATE)","authors":"D.M. Butler, S. Densler","doi":"10.1109/AUTEST.1992.270114","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270114","url":null,"abstract":"The authors describe a generic process for the certification of custom-made, user modified and off-the-shelf tools including automatic test equipment (ATE) and development tools. A standardized, comprehensive tool certification procedure was developed. This procedure includes participation with many varied groups from conception of the tool through final acceptance and its subsequent use. The major areas of the procedure are addressed. The use of this comprehensive tool certification by an independent software quality engineering group has interdicted tool errors that conceivably could have caused failure in software/systems tests or allowed faulty deliverable hardware items to pass and be integrated into final systems. The procedure also mandates correct configuration control of tool software and hardware. This procedure encourages total quality management (TQM). It has been shown to inspire better customer confidence in the test tools and the whole testing process chain.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124492999","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A neural network based approach to fault diagnosis in aerospace systems 基于神经网络的航空航天系统故障诊断方法
Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference Pub Date : 1992-09-21 DOI: 10.1109/AUTEST.1992.270103
R. Saeks, M. Lothers, R. Pap, K. Mach
{"title":"A neural network based approach to fault diagnosis in aerospace systems","authors":"R. Saeks, M. Lothers, R. Pap, K. Mach","doi":"10.1109/AUTEST.1992.270103","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270103","url":null,"abstract":"A neural network based fault diagnosis system is being developed for use in aerospace systems in which a family of neural nets replaces an online simulation process. A new neural network implementation of one of the model-based algorithms was developed. The authors summarize a series of computer experiments designed to benchmark the performance of this neural network based fault diagnosis algorithm in an environment where the good components of the systems are only known up to a tolerance band. The results indicate that neural networks can generalize around the data on which they were trained, yielding better performance for unforeseen inputs than traditional algorithms in the case of the fault diagnosis problem described.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122506718","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Automated modeling and prototyping approach for failure detection and isolation 用于故障检测和隔离的自动化建模和原型方法
Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference Pub Date : 1992-09-21 DOI: 10.1109/AUTEST.1992.270089
S. Rahmani, A. Stone
{"title":"Automated modeling and prototyping approach for failure detection and isolation","authors":"S. Rahmani, A. Stone","doi":"10.1109/AUTEST.1992.270089","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270089","url":null,"abstract":"The authors describe a systems modeling approach for design and analysis of failure prevention, detection, and isolation. The modeling approach was applied to the (Boeing 747-400 airplane) to study its effectiveness in accurately representing various on-board systems and analyzing their failure detection, isolation, and propagation. The modeling approach is based on use of state transition diagrams as well as functional and information flow diagrams. The model presented, which is executable and testable, includes the Boeing 747-400 electrical power generation and distribution system, the communications system, the central maintenance system, and the user interface system for interaction with the crew. Results of failures injected in the model for analysis of various scenarios are presented.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123272378","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
CASS factory integration CASS工厂集成
Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference Pub Date : 1992-09-21 DOI: 10.1109/AUTEST.1992.270123
M.C. Scallan
{"title":"CASS factory integration","authors":"M.C. Scallan","doi":"10.1109/AUTEST.1992.270123","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270123","url":null,"abstract":"The Consolidated Automated Support System (CASS), primarily designed for use on board US Navy aircraft carriers, has been mandated for use by the Secretary of the Navy as the standard automatic test equipment (ATE) for all Navy field and depot activities. The test solution makes test program sets (TPSs) compatible from one tester to another and flexible enough to allow rehosting of existing TPSs, and it has the ability to incorporate easily new and emerging technology, and to provide for a complete support philosophy, not just a test set for one weapon platform. To minimize the cost of fielding newly developed test program sets, the Secretary of the Navy has also directed that, to the maximum extent feasible, contractors use the same diagnostic capability that will be used under operational conditions to perform factory diagnostics for units under production. The author describes the migration of CASS into the development and design verification, buildup acceptance testing, and final sell-off on a Navy CASS.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128990535","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Concurrent engineering control without complexity 无复杂性的并行工程控制
Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference Pub Date : 1992-09-21 DOI: 10.1109/AUTEST.1992.270099
S.J. Slaght, L.A. Stratton
{"title":"Concurrent engineering control without complexity","authors":"S.J. Slaght, L.A. Stratton","doi":"10.1109/AUTEST.1992.270099","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270099","url":null,"abstract":"The need to design diagnostic systems in parallel with prime systems has become commonplace. During one such program, an approach to defining and sharing needed information that is both simple and effective was found. Accomplishment in parallel of operational system and automated test equipment (ATE) designs in a concurrent engineering environment requires continuous identification and management of all interfaces between subsystems as the design evolves. This is facilitated by grouping interfaces by category and managing changes to them using an interactive, parallel, structured process. A single document, an interoperability matrix, covers both the prime system and the diagnostic system. It can be used as a reference throughout the design process. The technique of controlling interfaces through an interoperability matrix is described. The technique fully supports the concurrent engineering process, conferring the benefits of simplicity, speed, and manageability.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130529584","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Techniques for diagnosing line replaceable modules (LRMS) on automatic test equipment 自动测试设备上线路可更换模块的诊断技术
Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference Pub Date : 1992-09-21 DOI: 10.1109/AUTEST.1992.270108
J. Barkley
{"title":"Techniques for diagnosing line replaceable modules (LRMS) on automatic test equipment","authors":"J. Barkley","doi":"10.1109/AUTEST.1992.270108","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270108","url":null,"abstract":"The author describes diagnostic techniques primarily used for line replaceable modules (LRMs) that have been tested using edge-connector, functional test techniques. A guided probe algorithm is introduced. Advanced guided probe features illustrate improvements to the guided probe algorithm. The author describes how a diagnosis is made from the failing LRMs fault signature. Modern fault dictionary features that are used to maximize the diagnostic effectiveness are described. The combination of guided probe and fault dictionary techniques is used to overcome the primary deficiencies of each. In addition, the use of a Smartprobe permits easy implementation and use of adaptive diagnostics to continuously improve diagnostic accuracy. The concept of combining the guided probe with knowledge of the boundary scan chain is introduced to reduce or eliminate the requirement for a handheld guided probe to diagnose faults.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128425386","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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