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Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference最新文献

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Automating testability analysis of analog circuits and systems 模拟电路和系统的自动化测试性分析
Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference Pub Date : 1992-09-21 DOI: 10.1109/AUTEST.1992.270110
F. Kuhns
{"title":"Automating testability analysis of analog circuits and systems","authors":"F. Kuhns","doi":"10.1109/AUTEST.1992.270110","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270110","url":null,"abstract":"Increasing avionic design complexities and diagnostic requirements have focused attention on the need for performing a testability analysis early in the design cycle. The author describes the general principles underlying the testability analysis of analog circuits and systems performed by the automated testability expert system tool (AutoTEST) which is an artificial intelligence (AI) based CAE tool. The goal is to perform a testability analysis early in the design cycle to ensure conformance with diagnostic requirements. To meet this goal, AutoTEST was designed to perform an analysis with varying levels of component and circuit detail. AutoTEST supports both a top-down and a bottom-up approach. The analog and system level portions of AutoTEST provide test and design engineers with both quantitative measures and qualitative descriptions of the testability of a given design. Quantitative measures are testability figures of merit such as fraction of faults detected, fault isolation resolution, and average ambiguity group size. Qualitative descriptions of testability problems include identifying feedback loops and unique circuit configurations which are difficult to test. The qualitative analysis consists of a set of design rules that are applied to the circuit. At the completion of an AutoTEST session, selected analysis results are written to a set of report files.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131722198","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
CASS electro-optic console laser testing CASS电光台激光测试
Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference Pub Date : 1992-09-21 DOI: 10.1109/AUTEST.1992.270075
J. McDade
{"title":"CASS electro-optic console laser testing","authors":"J. McDade","doi":"10.1109/AUTEST.1992.270075","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270075","url":null,"abstract":"The majority of laser target designators in the current military inventory are 1.064- mu m, Q-switched, Nd:YAG laser transmitters. In addition to its capabilities for forward looking infrared (FLIR) and camera testing, the consolidated automated support system (CASS) electrooptic (EO) configuration eliminates the need for dedicated laser transmitter testers. Using state-of-the-art instrumentation, CASS has the ability to determine laser energy and far-field spatial characteristics that include alignment, peak power, pulse energy, energy distribution, beam divergence, satellite beam measurements, and pulse period. All these tests are performed under ATLAS test programming language control.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130098458","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
ABET-an architecture for integrated diagnostics? 集成诊断体系结构?
Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference Pub Date : 1992-09-21 DOI: 10.1109/AUTEST.1992.270105
P. McCown
{"title":"ABET-an architecture for integrated diagnostics?","authors":"P. McCown","doi":"10.1109/AUTEST.1992.270105","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270105","url":null,"abstract":"The author gives an overview of the test execution services that can be provided by an Ada-based environment for test (ABET) to meet the needs of integrated diagnostics. The (ABET architecture) is being designed in layers. The layers of the architecture represent a hierarchy of test execution services that address the needs of test and maintenance at successive levels of abstraction. Special emphasis is placed on the highest layer of the ABET test execution services, the test strategy execution services. This layer will provide new capability that is critical to the implementation of integrated diagnostics. The discussion of this topic falls into four categories: (1) a concept definition of test strategy and test strategy execution, (2) a definition of the ABET test package, (3) a description of services that enable test strategy execution, and (4) the services needed at this level to support integrated diagnostics. The author also addresses the new types of test-related data that will be needed to support ABET test execution.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127511302","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Knowledge and information interface standard for test and diagnosis applications of knowledge-based systems 基于知识系统的测试和诊断应用的知识和信息接口标准
Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference Pub Date : 1992-09-21 DOI: 10.1109/AUTEST.1992.270091
R. G. Wright
{"title":"Knowledge and information interface standard for test and diagnosis applications of knowledge-based systems","authors":"R. G. Wright","doi":"10.1109/AUTEST.1992.270091","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270091","url":null,"abstract":"The author describes work being performed in the IEEE Standards Coordinating Committee 20 (SCC-20) P1232 committee related to the development of standards for interchange between knowledge and information sources and knowledge-based systems used in test and diagnosis applications. The goals, philosophy, and direction of the P1232 knowledge and information interface component standard, which encompasses the use of multiple ontologies and utilizes existing and currently developing standards to a large degree, is described along with the rational for the introduction, evolution, and potential benefits of this standard. Its relationship with the other P1232, SCC-20, and IEEE/ANSI standards is identified. Coordination with other knowledge-based system standards efforts in an attempt to prevent duplication and the development of diverging standards is discussed. The current status in the development of this standard, and future planned efforts for its continued development are described.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"114 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125011074","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Can industry standards satisfy DoD and service ATE standardization goals?-can a standardization policy be derived to satisfy everyone 行业标准能满足国防部和服务ATE标准化目标吗?-能不能推导出一个标准化政策来满足每个人
Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference Pub Date : 1992-09-21 DOI: 10.1109/AUTEST.1992.270078
M. Nolan
{"title":"Can industry standards satisfy DoD and service ATE standardization goals?-can a standardization policy be derived to satisfy everyone","authors":"M. Nolan","doi":"10.1109/AUTEST.1992.270078","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270078","url":null,"abstract":"The National Security Industrial Association (NSIA) Automatic Testing Committee (ATC) has completed its response to a Joint Service Automatic Test Panel (JSATP) task to provide recommendations to the US Government. The JSATP asked the ATC to provide a detailed analysis of the current Department of Defense business practices which impede efficient and effective supportability of weapon systems. The ATC first formulated a series of issue statements, and then evolved these into a series of ten conclusions and thirty-four recommendations classified into four major areas: the acquisition process, joint service and industry cooperative efforts, standards and standardization, and technology. These are detailed in a conclusion and recommendations report, included here, which is being circulated through the highest levels of the services for review.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123379507","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
RE built-in test and enabling technologies for integrated diagnostics RE内置测试和启用技术，用于集成诊断
Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference Pub Date : 1992-09-21 DOI: 10.1109/AUTEST.1992.270112
A. Chu, H. Cronson, J. Devine, S. Soares, M.N. Soloman, H. Lezec, C. Musil
{"title":"RE built-in test and enabling technologies for integrated diagnostics","authors":"A. Chu, H. Cronson, J. Devine, S. Soares, M.N. Soloman, H. Lezec, C. Musil","doi":"10.1109/AUTEST.1992.270112","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270112","url":null,"abstract":"The authors describe a vision of unambiguous fault isolation on RF equipment and enabling critical technologies. The overall goal is reduction of logistic support and maintenance cost of RF subsystems. Savings will be achieved through reduced false alarms, troubleshooting, false removal rates, spares inventory, and support equipment. The authors describe technology developments in miniature sources and signal analyzers with examples of built-in test (BIT) implementations utilizing specifically designed monolithic microwave integrated circuits (MMICs). These emerging technologies applied to integrated diagnostics can result in substantial cost avoidance in maintenance, spares inventory, and support equipment.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123616279","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
CASS TPS documentation-a high technology tool CASS TPS文档-高科技工具
Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference Pub Date : 1992-09-21 DOI: 10.1109/AUTEST.1992.270122
R. Epstein, C. Hogans, L.C. Delone
{"title":"CASS TPS documentation-a high technology tool","authors":"R. Epstein, C. Hogans, L.C. Delone","doi":"10.1109/AUTEST.1992.270122","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270122","url":null,"abstract":"Test program set (TPS) development documentation in the past has invariably been paper oriented, sequential in form, and cumbersome in use. Consolidated Automated Support System (CASS) documentation covers a range of technical performance that is considerably more extensive than on previous testers and is necessarily also voluminous. The US Navy undertook the task of modifying the CASS TPS guides, automating them for use on PCs, and logically connecting ideas through hypermedia. Current techniques used in the Navy CASS guides are described. The CASS TPS Hypertext Guide (THG) is an online reference, multimedia information presentation system developed exclusively for CASS TPS developers. The presentation system provides TPS developers with information about CASS system performance characteristics, instrumentation interface specifications, and system operational features and modes for the CASS hybrid, radio frequency (RF), communication, navigation and investigation (CNI), and electrooptics (EO) test stations and ancillary equipment.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123830571","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Creating a concurrent engineering environment to enhance supportability of the F/A-18E/F aircraft 创建并行工程环境以增强F/ a - 18e /F飞机的可保障性
Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference Pub Date : 1992-09-21 DOI: 10.1109/AUTEST.1992.270098
D. Bartz, M. Fields
{"title":"Creating a concurrent engineering environment to enhance supportability of the F/A-18E/F aircraft","authors":"D. Bartz, M. Fields","doi":"10.1109/AUTEST.1992.270098","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270098","url":null,"abstract":"McDonnell Aircraft Company has implemented improved procedures and developed new CAE tools to enhance the supportability of the new and modified equipment under development for the F/A-18E/F program. These procedures and tools were designed to reduce or eliminate support equipment requirements, ensure compatibility with automatic test equipment, and enhance equipment testability and thereby reduce life cycle cost associated with support and maintenance of the airborne equipment. This will be accomplished by emphasizing testability and other diagnostic elements through the implementation of an extended interorganizational concurrent engineering environment. The development and application of an automated testability analysis tool (AutoTEST) are discussed. AutoTEST can perform an analysis with varying levels of component and circuit detail. AutoTEST supports both a top-down and a bottom-up analysis approach. The tool will also be used to integrate the various functions and organizations involved in the product development process.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116198140","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
CASS common ID set cuts TPS costs, eliminates ID redundancy CASS通用ID集降低TPS成本，消除ID冗余
Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference Pub Date : 1992-09-21 DOI: 10.1109/AUTEST.1992.270121
A. Eiranova, S. Mann
{"title":"CASS common ID set cuts TPS costs, eliminates ID redundancy","authors":"A. Eiranova, S. Mann","doi":"10.1109/AUTEST.1992.270121","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270121","url":null,"abstract":"When automatic test equipment (ATE) supports many different weapon systems, interface device (ID) proliferation substantially drives up test program set (TPS) design and production costs and creates significant ID storage problems at the user sites. The Consolidated Automated Support System (CASS) common ID set, with its shared universal panel ID (UPID) and dedicated minor adapters (MAs), allows nearly all TPSs planned for CASS to use the same single UPID for their CASS general purpose interface needs. The authors describe the CASS common ID concept and the optimized UPID design. The CASS common ID set includes a UPID self-test TPS, with a self-test MA and a set of self-test shorting plugs and test cables. Documentation consists of a DOD-D-1000 Level 3 drawing package, an interface control document, and a user's guide with guidelines on MA wiring design and optimum CASS resource allocation for minimum cost, simpler, fewer CASS ID designs.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129205955","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A new approach to FLIR MRTD testing FLIR MRTD测试的新方法
Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference Pub Date : 1992-09-21 DOI: 10.1109/AUTEST.1992.270077
W. Rock, L. Roque
{"title":"A new approach to FLIR MRTD testing","authors":"W. Rock, L. Roque","doi":"10.1109/AUTEST.1992.270077","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270077","url":null,"abstract":"A key performance parameter of thermal imaging systems is the minimum resolvable temperature difference (MRTD). The authors describe a new approach to on-platform end-to-end thermal imaging system testing which can be accomplished in an unstable field environment, and application of the technique to a superior cost effective field MRTD test system. The new approach consists of quickly establishing the system radiometric zero and very accurately referencing all blackbody temperatures to the radiometric zero. This approach provides excellent radiometric control, resolution, stability, and speed that are needed for meaningful field testing of thermal imaging systems. A test system which incorporates the technology, the portable electrooptics tester (PET), is a small, man-portable field forward-looking IR (FLIR) MRTD test system. The PET was designed to accurately measure multiple spatial frequency minimum resolvable temperatures (MRTs) within minutes of power application. A novel technique is also used to determine if the thermal imaging system under test is mission capable, even if it is not performing to its design specification.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"63 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126437018","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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