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Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference最新文献

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IEEE P1232 AI-ESTATE: the standard for test related AI applications takes shape IEEE P1232 AI- estate: AI相关测试应用标准初具规模
Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference Pub Date : 1992-09-21 DOI: 10.1109/AUTEST.1992.270093
L. Orlidge
{"title":"IEEE P1232 AI-ESTATE: the standard for test related AI applications takes shape","authors":"L. Orlidge","doi":"10.1109/AUTEST.1992.270093","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270093","url":null,"abstract":"In February 1990, the IEEE approved Project Authorization Request (PAR) 1232, authorizing the IEEE SCC-20 (ATLAS) Committee to begin development of a new test standard, AI-ESTATE. AI-ESTATE stands for the artificial intelligence-expert system tie to automatic test equipment. The author defines AI-ESTATE and discusses its background, long-term goals, and architecture, its current status, and the committee's plan of action for continuing development of the standard. AI-ESTATE will define the interfaces between any test related reasoning system, its users, target test equipment, and external knowledge bases and databases. AI-ESTATE will also define several test related knowledge bases and databases, including fault trees and information flow models.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116954459","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The automation of a fabrication planner in a rapid design system 快速设计系统中制造计划器的自动化
Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference Pub Date : 1992-09-21 DOI: 10.1109/AUTEST.1992.270132
R. Deep, R. W. Spratt, S. LeClair
{"title":"The automation of a fabrication planner in a rapid design system","authors":"R. Deep, R. W. Spratt, S. LeClair","doi":"10.1109/AUTEST.1992.270132","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270132","url":null,"abstract":"The authors describe the software research and development effort to automate the fabrication planning process from a feature-based design input to a numerical-controlled code generation output in order to manufacture simply machined or prismatic parts. A major goal of the research was to create an automatic process planning system for simply machined parts. Inherent in this goal is to confer the why and the what of the design process to the how of manufacturing process in an attempt to unify design with manufacturing. A second major goal is to execute the process plan to manufacture the desired part. The rapid design system offers an environment for design, fabrication, and inspection and generates a process plan that can be stored, retrieved, and modified at will. In addition, an episodal associative memory module retains the learning component for the design and manufacturing of these simply machined parts.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122443405","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Army aviation readies for the twenty-first century 陆军航空兵为二十一世纪做好准备
Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference Pub Date : 1992-09-21 DOI: 10.1109/AUTEST.1992.270086
P. Brassel, R. Burkhart
{"title":"Army aviation readies for the twenty-first century","authors":"P. Brassel, R. Burkhart","doi":"10.1109/AUTEST.1992.270086","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270086","url":null,"abstract":"The automatic test equipment (ATE) test program set (TPS) Support Center acts as the US Army Aviation Systems Command (AVSCOM) focal point for all aviation automatic testing. The authors discuss both the present operations and future roles of the ATE/TPS support center. The staff provides both technical and program management support. The staff's expertise covers the disciplines of systems engineering, configuration management, integrated logistics support, and quality assurance. Over the total TPS life-cycle, the center supports applications from initial development through postdeployment upgrades. Also, the center is involved in the application of integrated diagnostics and the modernization of aviation systems to extend their service life and reduce the logistics support burden.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129791609","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Ada source code analysis for automatic test case generation Ada源代码分析，用于自动生成测试用例
Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference Pub Date : 1992-09-21 DOI: 10.1109/AUTEST.1992.270094
V. Santhanam
{"title":"Ada source code analysis for automatic test case generation","authors":"V. Santhanam","doi":"10.1109/AUTEST.1992.270094","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270094","url":null,"abstract":"Summary form only given, as follows. A multipurpose semantic analyzer front-end for Ada has been developed to meet a variety of Ada source code analysis needs. One of those needs is the automatic generation of glass-box test cases. Glass-box test case generation requires control and data flow information in conjunction with semantic information on subprogram interfaces and local declarations. Control flow analysis will be needed to address statement and path coverage issues. Data flow analysis can be used to force execution through potentially anomalous paths. Semantic analysis provides prerequisite information for generating acceptable test cases in these cases, as well as for boundary condition testing. The author presents a design of a back-end for the multipurpose front-end which will compute control and data flow information required for automatic test case generation.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133691645","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Expert system for laser vulnerability analysis of aerospace structures 航空航天结构激光易损性分析专家系统
Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference Pub Date : 1992-09-21 DOI: 10.1109/AUTEST.1992.270129
R. Grandhi, S. Chandu, H. Rajagopalan, D. Fautheree
{"title":"Expert system for laser vulnerability analysis of aerospace structures","authors":"R. Grandhi, S. Chandu, H. Rajagopalan, D. Fautheree","doi":"10.1109/AUTEST.1992.270129","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270129","url":null,"abstract":"The authors discuss the framework of a knowledge-based expert system for studying the survivability of the aerospace structures exposed to high energy lasers using VAASEL (vulnerability analysis of aerospace structures exposed to lasers) software. VAASEL is a synthesis tool built around NASTRAN and ASTROS programs. The knowledge base involves threat characterization, temperature distribution, failure prediction, linear and nonlinear statics, air loads and aeroelastic disciplines. A description of the VAASEL expert system modules, the graphics interface and the input data generator is included.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"108 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133328930","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A PC-based platform for MATE 基于pc的MATE平台
Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference Pub Date : 1992-09-21 DOI: 10.1109/AUTEST.1992.270102
L. G. Allred, M. Cain, L. Kirkland
{"title":"A PC-based platform for MATE","authors":"L. G. Allred, M. Cain, L. Kirkland","doi":"10.1109/AUTEST.1992.270102","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270102","url":null,"abstract":"In terms of cost and overall performance, the personal computer has considerably more to offer than the traditional 1750A modular automatic testing equipment (MATE) standard computer. The proof of concept was performed by replacing the 1750A MATE computer with a PC and running the tester's current repertoire of test program sets (TPSs) for a variety of test platforms including the ALCC (airborne launch control center), the B-1 DATSA, and other MATE platforms. The resulting PC-MATE system was fully MATE compliant. Additionally, a shop replaceable unit (SRU) TPS was rehosted from a non-MATE E-35 tester in less than 100 hours. Significant improvements were observed in production, development, and performance of the resulting TPS.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"24 5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130832123","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
CASSTRAC: a paperless support and information exchange CASSTRAC:无纸化支持和信息交换
Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference Pub Date : 1992-09-21 DOI: 10.1109/AUTEST.1992.270124
W. Darling, G. Bowley
{"title":"CASSTRAC: a paperless support and information exchange","authors":"W. Darling, G. Bowley","doi":"10.1109/AUTEST.1992.270124","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270124","url":null,"abstract":"A database related program called CASSTRAC has been developed to help resolve reported problems concerning the Consolidated Automated Support System (CASS), the US Navy's newest piece of automatic test equipment (ATE). The authors describe CASSTRAC and its evolution from an obsolete problem resolution process. It was designed and developed to replace obsolete and inefficient processes used for reporting and tracking ATE related problems. CASSTRAC, which functions as a paperless support system as well as an information exchange/display system, will ultimately reduce the costs associated with the development of test program sets on CASS.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"115 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123459052","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Integrated diagnostic for new French fighter 法国新型战斗机的综合诊断系统
Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference Pub Date : 1992-09-21 DOI: 10.1109/AUTEST.1992.270079
M. Courtois, J. Pouilly
{"title":"Integrated diagnostic for new French fighter","authors":"M. Courtois, J. Pouilly","doi":"10.1109/AUTEST.1992.270079","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270079","url":null,"abstract":"An important logistic support function of airborne weapon systems is automatic failure detection and localization. On the new French fighter aircraft this function is being developed as a whole, taking into account the needs for all maintenance levels. O-level maintenance uses integrated monitoring and testing, which is described. The intermediate level maintenance is performed by a unique test system used for production equipment acceptance and maintenance in the user's operational intermediate workshops. Appropriate data are exchanged between maintenance levels by means of digital media. The main feature has been to apply, to all maintenance levels and as far as possible, the integrated maintenance concept which has been used for automatic diagnostics in Mirage 2000 aircraft taking into account the good results experienced since 1982.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121647461","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Engineering-to-manufacturing-to-field test strategies status report 1992 1992年工程-制造-现场测试策略现状报告
Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference Pub Date : 1992-09-21 DOI: 10.1109/AUTEST.1992.270097
R.L. Williams
{"title":"Engineering-to-manufacturing-to-field test strategies status report 1992","authors":"R.L. Williams","doi":"10.1109/AUTEST.1992.270097","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270097","url":null,"abstract":"This study is an interim status report on implementation of a company wide continuous quality improvement (CQI) total quality management (TQM) initiative dealing with cost, technology, and organizational problems associated with development and transfer of electronics/avionics test strategies from prime equipment design to manufacturing test and subsequently to depot level maintenance. This interim status report highlights the concerns, problems, and tentative solutions to implementing a company wide common automated test equipment (ATE) architecture for commercial airlines and for military programs.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121959901","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Knowledge-based decision support for ATE acquisition 基于知识的ATE获取决策支持
Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference Pub Date : 1992-09-21 DOI: 10.1109/AUTEST.1992.270087
L. T. Herren, M. Rasti
{"title":"Knowledge-based decision support for ATE acquisition","authors":"L. T. Herren, M. Rasti","doi":"10.1109/AUTEST.1992.270087","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270087","url":null,"abstract":"To meet the need for a computer-based tool to aid acquisition program managers, a knowledge-based acquisition program management aid was developed. This system, the Acquisition Program Manager's Aide (APMA), maintains existing expertise in automatic test system acquisitions. The APMA system is composed of four main components: a generic acquisition program diagram, a graphics-oriented, menu-driven planning tool, a consultation tool that recommends modifications to the generic acquisition diagram, and interfaces to two different scheduling packages. The generic program diagram contains activities typical of an acquisition program for automated test equipment (ATE). The user can load the generic acquisition program diagram, modify the diagram to reflect the status of the program, schedule the diagram, and save or print the modified diagram. Each of the components of APMA is described.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124397451","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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